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Electrode interdependence and hole capacitance in capacitance–voltage characteristics of hydrogenated amorphous silicon thin-film transistor

Journal of applied physics, 1998-06, Vol.83 (12), p.8051-8056

1998

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Twincode: An Instrumented Platform for Pair Programming Research

Proceedings of the 54th ACM Technical Symposium on Computer Science Education V. 2, 2022, p.1264-1264

2022

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A System for Determining Braking Distance by Predicting Weight Using Image Processing to Predict Illegal Red Light Running Events

2019 19th International Conference on Control, Automation and Systems (ICCAS), 2019, p.1646-1651

2019

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Ellipsometry Measurement Accuracy of Gate Oxides under Polysilicon

MRS proceedings, 2003, Vol.782, Article A5.10

2003

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Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models

Journal of non-crystalline solids, 1998-05, Vol.227-230, p.348-352

1998

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Fundamental nature of deep defects in hydrogenated amorphous silicon revealed by electron spin resonance and modulated photocurrent measurements

Kwon, Daewon

1997

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Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements : implications for defect models

Journal of non-crystalline solids, 1998, Vol.227-30, p.348-352

1998

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New results using capacitance transient studies to investigate deep defect relaxation in hydrogenated amorphous silicon

Journal of non-crystalline solids, 1996, Vol.198, p.530-534

1996

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Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

Journal of non-crystalline solids, 1998-01, Vol.227, p.1040-1044

1998

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Visible electroluminescence from porous silicon/hydrogenated amorphous silicon pn -heterojunction devices

Applied physics letters, 1996-01, Vol.68 (5), p.684-686

1996

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Identification of the Dominant Electron Deep Trap in a-Si:H: A Critical Test of the Defect Pool vs. Defect Relaxation Pictures

MRS proceedings, 1997, Vol.467, Article 197

1997

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Effect of Light Soaking on Hot Wire Deposited a-Si:H Films

MRS proceedings, 1995, Vol.377, Article 301

1995

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Deep Level Defect Studies in Mocvd-Grown In x Ga 1−s As 1−y N y Films Lattice-Matched to GaAs

MRS proceedings, 1998, Vol.535, Article 59

1998

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Deep Level Defect Studies in Mocvd-Grown InxGa1−sAs1−yNy Films Lattice-Matched to GaAs

MRS proceedings, 1998, Vol.535

1998

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Deep Defect Relaxation in Hydrogenated Amorphous Silicon: New Experimental Evidence and Implications

MRS proceedings, 1998, Vol.507, Article 781

1998

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New Evidence for Deep Defect Relaxation in Hydrogenated Amorphous Silicon from Junction Capacitance Methods

MRS proceedings, 1996, Vol.420, Article 679

1996

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Electronic Transitions in Mixed Phase Crystalline/Amorphous Silicon in the Low Crystalline Fraction Regime

MRS proceedings, 1999, Vol.557, Article 495

1999

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An AFM Study of The Effect of Growth Method and Conditions on The Microstructure of A-Si:H

MRS proceedings, 1997, Vol.467, p.561-566, Article 561

1997

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Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

Journal of non-crystalline solids, 1998, Vol.227-30, p.1040-1044

1998

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Metastable Defect Studies in Hydrogen Modulated Multilayer Amorphous Silicon

MRS proceedings, 1994, Vol.336, Article 305

1994

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Charge and Current Transient Measurements on N-Type Hydrogenated Amorphous Silicon in the Relaxation Regime

MRS proceedings, 1994, Vol.336, Article 455

1994

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Electronic transitions associated with small crystalline silicon inclusions within an amorphous silicon host

Physical review. B, Condensed matter, 1999-08, Vol.60 (7), p.4442-4445

1999

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Process metrology for ultrathin gate dielectrics

Semiconductor International, 2001-08, Vol.24 (9), p.79

2001

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Energy efficient short-term memory characteristics in Ag/SnOx/TiN RRAM for neuromorphic system

Ceramics international, 2022-10, Vol.48 (20), p.30482-30489

2022

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Flexible supercapacitor fabrication by room temperature rapid laser processing of roll-to-roll printed metal nanoparticle ink for wearable electronics application

Journal of power sources, 2014, Vol.246, p.562-568

2014

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Electrode interdependence and hole capacitance in capacitance–voltage characteristics of hydrogenated amorphous silicon thin-film transistor

Twincode: An Instrumented Platform for Pair Programming Research

A System for Determining Braking Distance by Predicting Weight Using Image Processing to Predict Illegal Red Light Running Events

Ellipsometry Measurement Accuracy of Gate Oxides under Polysilicon

Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models

Fundamental nature of deep defects in hydrogenated amorphous silicon revealed by electron spin resonance and modulated photocurrent measurements

Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements : implications for defect models

New results using capacitance transient studies to investigate deep defect relaxation in hydrogenated amorphous silicon

Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

Visible electroluminescence from porous silicon/hydrogenated amorphous silicon pn -heterojunction devices

Identification of the Dominant Electron Deep Trap in a-Si:H: A Critical Test of the Defect Pool vs. Defect Relaxation Pictures

Effect of Light Soaking on Hot Wire Deposited a-Si:H Films

Deep Level Defect Studies in Mocvd-Grown In x Ga 1−s As 1−y N y Films Lattice-Matched to GaAs

Deep Level Defect Studies in Mocvd-Grown InxGa1−sAs1−yNy Films Lattice-Matched to GaAs

Deep Defect Relaxation in Hydrogenated Amorphous Silicon: New Experimental Evidence and Implications

New Evidence for Deep Defect Relaxation in Hydrogenated Amorphous Silicon from Junction Capacitance Methods

Electronic Transitions in Mixed Phase Crystalline/Amorphous Silicon in the Low Crystalline Fraction Regime

An AFM Study of The Effect of Growth Method and Conditions on The Microstructure of A-Si:H

Optical spectra of crystalline silicon particles embedded in an amorphous silicon matrix

Metastable Defect Studies in Hydrogen Modulated Multilayer Amorphous Silicon

Charge and Current Transient Measurements on N-Type Hydrogenated Amorphous Silicon in the Relaxation Regime

Electronic transitions associated with small crystalline silicon inclusions within an amorphous silicon host

Process metrology for ultrathin gate dielectrics

Energy efficient short-term memory characteristics in Ag/SnOx/TiN RRAM for neuromorphic system

Flexible supercapacitor fabrication by room temperature rapid laser processing of roll-to-roll printed metal nanoparticle ink for wearable electronics application

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