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The System of Uniformity of Measurement Assurance Facing Digital Transformation of the Economy

IOP conference series. Materials Science and Engineering, 2019-01, Vol.476 (1), p.12018

2019

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Compact Generator of an Optical Frequency Comb Based on Distributed-Feedback Laser Diode and High-Q Optical Microcavity

Journal of experimental and theoretical physics, 2023-06, Vol.136 (6), p.699-703

2023

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Practical aspects of applying artificial intelligence in metrology

Measurement techniques, 2023-12, Vol.66 (9), p.717-727

2023

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Waveguide Integrated Superconducting Single-Photon Detector For Photonic And Ion Quantum Processors And Neuromorphic Computing

Radiophysics and quantum electronics, 2024-04, Vol.66 (11), p.839-892

2024

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Change in the Chemical Composition of an Analyzed Object During Low-Voltage Electron Probe X-Ray Spectral Microanalysis

Measurement techniques, 2017-02, Vol.59 (11), p.1234-1237

2017

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Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method

Measurement techniques, 2016-11, Vol.59 (8), p.822-825

2016

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Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization

Measurement techniques, 2017, Vol.59 (10), p.1061-1064

2017

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Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope

Measurement techniques, 2016-11, Vol.59 (8), p.817-821

2016

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Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications

Measurement techniques, 2017-03, Vol.59 (12), p.1245-1249

2017

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Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

Measurement techniques, 2015-12, Vol.58 (9), p.953-957

2015

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Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images

Measurement techniques, 2016-06, Vol.59 (3), p.230-234

2016

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The Formation of an Oxide Film on the Surface of a Silicon Relief Structure During Plasma Cleaning

Measurement techniques, 2015-11, Vol.58 (8), p.934-936

2015

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Development of state information systems in the field of metrology: main tasks

Izmeritel`naya Tekhnika, 2024-05 (3), p.5-13

2024

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Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection

Measurement techniques, 2016-05, Vol.59 (2), p.198-201

2016

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A Method of Estimating the Stability of the Scale Factor of a Transmission Electron Microscope

Measurement techniques, 2013-08, Vol.56 (5), p.482-485

2013

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Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope

Measurement techniques, 2015-06, Vol.58 (3), p.256-260

2015

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An X-ray Fluorescence Determination of Platinum and Rhodium in Autocatalysts on a Ceramic Base

Measurement techniques, 2013-12, Vol.56 (9), p.1088-1091

2013

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Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

Measurement techniques, 2013-12, Vol.56 (9), p.992-998

2013

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Use of ordered films of fullerene molecules for calibration of scanning tunneling microscopes for measuring the geometric parameters of objects

Measurement techniques, 2013-05, Vol.56 (2), p.125-131

2013

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Standard sample for calibration of transmission electron microscopes nanometrology

Measurement techniques, 2013, Vol.55 (10), p.1137-1140

2013

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The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

Measurement techniques, 2013-10, Vol.56 (7), p.817-822

2013

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Measurement of the thickness of natural oxide on a silicon relief step structure

Measurement techniques, 2013-09, Vol.56 (6), p.616-619

2013

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Components of secondary x-ray spectrum in polychromatic excitation and energy-dispersive detection

Measurement techniques, 2013-09, Vol.56 (6), p.625-629

2013

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Metrological assurance of measurements of the dimensional parameters of nanoparticles and thin films by small-angle X-ray diffractometry methods

Nanotechnologies in Russia, 2013-05, Vol.8 (5-6), p.309-316

2013

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Reconstructed silicon surfaces for calibration of scanning tunnel microscopes

Measurement techniques, 2012-10, Vol.55 (7), p.773-779

2012

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The System of Uniformity of Measurement Assurance Facing Digital Transformation of the Economy

Compact Generator of an Optical Frequency Comb Based on Distributed-Feedback Laser Diode and High-Q Optical Microcavity

Practical aspects of applying artificial intelligence in metrology

Waveguide Integrated Superconducting Single-Photon Detector For Photonic And Ion Quantum Processors And Neuromorphic Computing

Change in the Chemical Composition of an Analyzed Object During Low-Voltage Electron Probe X-Ray Spectral Microanalysis

Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method

Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization

Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope

Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images

The Formation of an Oxide Film on the Surface of a Silicon Relief Structure During Plasma Cleaning

Development of state information systems in the field of metrology: main tasks

Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection

A Method of Estimating the Stability of the Scale Factor of a Transmission Electron Microscope

Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope

An X-ray Fluorescence Determination of Platinum and Rhodium in Autocatalysts on a Ceramic Base

Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

Use of ordered films of fullerene molecules for calibration of scanning tunneling microscopes for measuring the geometric parameters of objects

Standard sample for calibration of transmission electron microscopes nanometrology

The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

Measurement of the thickness of natural oxide on a silicon relief step structure

Components of secondary x-ray spectrum in polychromatic excitation and energy-dispersive detection

Metrological assurance of measurements of the dimensional parameters of nanoparticles and thin films by small-angle X-ray diffractometry methods

Reconstructed silicon surfaces for calibration of scanning tunnel microscopes

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