UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Electrical Characterization of Zinc‐Rich Amorphous In‐Ga‐Zn‐O Thin Film Transistors

Physica status solidi. A, Applications and materials science, 2018-11, Vol.215 (21), p.n/a

2018

Volltextzugriff (PDF)

Transient photoconductivity responses in amorphous In-Ga-Zn-O films

Journal of applied physics, 2012-09, Vol.112 (5)

2012

Volltextzugriff (PDF)

A method for shortening effective channel length in oxide TFT by partial formation of conductive region

Japanese Journal of Applied Physics, 2019-09, Vol.58 (9), p.90602

2019

Volltextzugriff (PDF)

Photoelectron emission yield experiments on evolution of sub-gap states in amorphous In-Ga-Zn-O thin films with post deposition hydrogen treatment

Applied physics letters, 2015-09, Vol.107 (11)

2015

Volltextzugriff (PDF)

Preparation of hydroxide ion conductive KOH-ZrO2 electrolyte for all-solid state iron/air secondary battery

Solid state ionics, 2014-09, Vol.262, p.188-191

2014

Volltextzugriff (PDF)

Effects of thermal annealing on variations of electron traps in the channel region of amorphous In-Ga-Zn-O thin film transistor

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2014-05, Vol.32 (3)

2014

Volltextzugriff (PDF)

Electron traps in amorphous In-Ga-Zn-O thin films studied by isothermal capacitance transient spectroscopy

Applied physics letters, 2012-03, Vol.100 (10), p.102106-102106-4

2012

Volltextzugriff (PDF)

P‐1: Fabrication of a Short‐Channel Oxide TFT Utilizing the Resistance‐Reduction Phenomenon in In‐Ga‐Sn‐O

SID International Symposium Digest of technical papers, 2017-05, Vol.48 (1), p.1227-1230

2017

Volltextzugriff (PDF)

Physical Properties of Amorphous In--Ga--Zn--O Films Deposited at Different Sputtering Pressures

Japanese Journal of Applied Physics, 2013-03, Vol.52 (3), p.03BA01-03BA01-5

2013

Volltextzugriff (PDF)

Al-Based Metal Mesh Electrodes for Advanced Touch Screen Panels Using Aluminum Nitride System Optical Absorption Layer

IEICE transactions on electronics, 2015-11, Vol.E98.C (11), p.1000-1007

2015

Volltextzugriff (PDF)

In-line Process Monitoring for Amorphous Oxide Semiconductor TFT Fabrication using Microwave-detected Photoconductivity Decay Technique

IEICE transactions on electronics, 2014-01, Vol.E97.C (11), p.1055-1062

2014

Volltextzugriff (PDF)

Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films

IEICE transactions on electronics, 2012, Vol.E95.C (11), p.1724-1729

2012

Volltextzugriff (PDF)

Facilitation of the four-mask process by the double-layered Ti/Si barrier metal for oxide semiconductor TFTs

Journal of Information Display, 2012, 13(2), , pp.61-66

2012

Volltextzugriff (PDF)

Study of Electronic Structure and Film Composition at the Back Channel Surface of Amorphous In-Ga-Zn-O Thin Films

ECS journal of solid state science and technology, 2013-01, Vol.2 (4), p.P156-P159

2013

Volltextzugriff (PDF)

Current Path Analysis of the Direct Contact Between ITO and Al–Ni Alloy Films

Journal of the Electrochemical Society, 2009, Vol.156 (5), p.H384

2009

Volltextzugriff (PDF)

Effects of Additive Elements on TFT Characteristics in Amorphous IGZO Films under Light Illumination Stress

IEICE transactions on electronics, 2011, Vol.E94-C (11), p.1739-1744

2011

Volltextzugriff (PDF)

Electrical Conduction across the Direct Contact between Indium--Tin Oxide and Al--Ni Alloy Layers

Japanese Journal of Applied Physics, 2010-11, Vol.49 (11), p.115701-115701-7

2010

Volltextzugriff (PDF)

Study of adhesion and chemical bonds in the reaction layer formed at Cu-Mn interconnection/SiO2 interface

Journal of applied physics, 2013-05, Vol.113 (17)

2013

Volltextzugriff (PDF)

Correlation of photoconductivity response of amorphous In–Ga–Zn–O films with transistor performance using microwave photoconductivity decay method

Applied physics letters, 2011-03, Vol.98 (10)

2011

Volltextzugriff (PDF)

Improvement of Stress Stability in Back Channel Etch-Type Amorphous In-Ga-Zn-O Thin Film Transistors with Post Process Annealing

ECS journal of solid state science and technology, 2017, Vol.6 (5), p.P247-P252

2017

Volltextzugriff (PDF)

Low driving voltage indium-tin oxide/Al-Ni-Cu-La anode electrodes for top-emission organic light-emitting diodes

Japanese Journal of Applied Physics, 2017-03, Vol.56 (3), p.35802-035802

2017

Volltextzugriff (PDF)

Correlation of trap states with negative bias thermal illumination stress stabilities in amorphous In-Ga-Zn-O thin-film transistors studied by photoinduced transient spectroscopy

Japanese Journal of Applied Physics, 2017-03, Vol.56 (3S), p.3-03BB02

2017

Volltextzugriff (PDF)

Effect of H and OH desorption and diffusion on electronic structure in amorphous In-Ga-Zn-O metal-oxide-semiconductor diodes with various gate insulators

Journal of applied physics, 2012-12, Vol.112 (11)

2012

Volltextzugriff (PDF)

Evaluation of stress stabilities in amorphous In-Ga-Zn-O thin-film transistors: Effect of passivation with Si-based resin

Japanese Journal of Applied Physics, 2018-02, Vol.57 (2S2), p.2

2018

Volltextzugriff (PDF)

(Invited) Hydrogen-Related Trap States Induced during Fabrication Process and Annealing Effects in Amorphous in-Ga-Zn-O Thin Film Transistors

ECS transactions, 2018, Vol.86 (11), p.117-123

2018

Volltextzugriff (PDF)

1 – 25 von 71

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(40)
Mit Volltextzugriff
(45)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(32)
Physical Sciences
(23)
Physics
(19)
Physics, Applied
(17)
Technology
(16)
Thin Film Transistors
(16)
Semiconductor Devices
(13)
Materials Science
(10)
Thin Films
(8)
Annealing
(7)
Engineering
(7)
Engineering, Electrical & Electronic
(7)
Hydrogen
(6)
Materials Science, Multidisciplinary
(6)
Humans
(5)
Transistors
(5)
Electrochemistry
(4)
Middle Aged
(4)
Oxide Semiconductor
(4)
Sputtering
(4)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Electrical Characterization of Zinc‐Rich Amorphous In‐Ga‐Zn‐O Thin Film Transistors

Transient photoconductivity responses in amorphous In-Ga-Zn-O films

A method for shortening effective channel length in oxide TFT by partial formation of conductive region

Photoelectron emission yield experiments on evolution of sub-gap states in amorphous In-Ga-Zn-O thin films with post deposition hydrogen treatment

Preparation of hydroxide ion conductive KOH-ZrO2 electrolyte for all-solid state iron/air secondary battery

Effects of thermal annealing on variations of electron traps in the channel region of amorphous In-Ga-Zn-O thin film transistor

Electron traps in amorphous In-Ga-Zn-O thin films studied by isothermal capacitance transient spectroscopy

P‐1: Fabrication of a Short‐Channel Oxide TFT Utilizing the Resistance‐Reduction Phenomenon in In‐Ga‐Sn‐O

Physical Properties of Amorphous In--Ga--Zn--O Films Deposited at Different Sputtering Pressures

Al-Based Metal Mesh Electrodes for Advanced Touch Screen Panels Using Aluminum Nitride System Optical Absorption Layer

In-line Process Monitoring for Amorphous Oxide Semiconductor TFT Fabrication using Microwave-detected Photoconductivity Decay Technique

Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films

Facilitation of the four-mask process by the double-layered Ti/Si barrier metal for oxide semiconductor TFTs

Study of Electronic Structure and Film Composition at the Back Channel Surface of Amorphous In-Ga-Zn-O Thin Films

Current Path Analysis of the Direct Contact Between ITO and Al–Ni Alloy Films

Effects of Additive Elements on TFT Characteristics in Amorphous IGZO Films under Light Illumination Stress

Electrical Conduction across the Direct Contact between Indium--Tin Oxide and Al--Ni Alloy Layers

Study of adhesion and chemical bonds in the reaction layer formed at Cu-Mn interconnection/SiO2 interface

Correlation of photoconductivity response of amorphous In–Ga–Zn–O films with transistor performance using microwave photoconductivity decay method

Improvement of Stress Stability in Back Channel Etch-Type Amorphous In-Ga-Zn-O Thin Film Transistors with Post Process Annealing

Low driving voltage indium-tin oxide/Al-Ni-Cu-La anode electrodes for top-emission organic light-emitting diodes

Correlation of trap states with negative bias thermal illumination stress stabilities in amorphous In-Ga-Zn-O thin-film transistors studied by photoinduced transient spectroscopy

Effect of H and OH desorption and diffusion on electronic structure in amorphous In-Ga-Zn-O metal-oxide-semiconductor diodes with various gate insulators

Evaluation of stress stabilities in amorphous In-Ga-Zn-O thin-film transistors: Effect of passivation with Si-based resin

(Invited) Hydrogen-Related Trap States Induced during Fabrication Process and Annealing Effects in Amorphous in-Ga-Zn-O Thin Film Transistors

Suchergebnisse filtern