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Support effect on the reactivity and stability of Au25(SR)18 and Au144(SR)60 nanoclusters in liquid phase cyclohexane oxidation

Catalysis today, 2019-10, Vol.336, p.174-185

2019

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Dynamics of Pd Dopant Atoms inside Au Nanoclusters during Catalytic CO Oxidation

Journal of physical chemistry. C, 2020-10, Vol.124 (43), p.23626-23636

2020

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Investigation of polycapillary half lenses for quantitative confocal micro‐X‐ray fluorescence analysis

Journal of synchrotron radiation, 2022-11, Vol.29 (6), p.1376-1384

2022

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Comparative elemental analysis of fine particulate matter (PM2.5) from industrial and residential areas in Greater Cairo-Egypt by means of a multi-secondary target energy dispersive X-ray fluorescence spectrometer

Spectrochimica acta. Part B: Atomic spectroscopy, 2018-07, Vol.145, p.29-35

2018

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X‑ray Fluorescence Techniques for Element Abundance Analysis in Wine

ACS omega, 2021-09, Vol.6 (35), p.22643-22654

2021

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Implementing light elements detection and quantification in aluminosilicate materials using a Low-Z total-reflection X-ray fluorescence spectrometer

Applied clay science, 2024-04, Vol.251, p.107326, Article 107326

2024

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Elemental composition and source apportionment of atmospheric aerosols collected from urban and residential areas of Jordan using multi-secondary targets energy dispersive X-ray fluorescence

Spectrochimica acta. Part B: Atomic spectroscopy, 2020-08, Vol.170, p.105900, Article 105900

2020

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Atomic layer deposition to prevent metal transfer from implants: An X-ray fluorescence study

Applied surface science, 2015-12, Vol.359, p.215-220

2015

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Atomic spectrometry update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2002-09, Vol.17 (10), p.1439-1455

2002

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Study of selenium sorption processes in volcanic ash using Total Reflection X-ray Fluorescence (TXRF)

Chemical geology, 2013-08, Vol.352, p.19-26

2013

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Atomic Spectrometry Update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2001-01, Vol.16 (10), p.1217-1237

2001

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EDXRF analysis of suspended particulate matter (SPM) from residential and industrial areas in Cairo, Egypt

X-ray spectrometry, 2018-05, Vol.47 (3), p.223-230

2018

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Method Development and Quantitative Elemental Analysis of Mentha Longifolia L. Leaves from Saudi Arabia by Total Reflection X-Ray Fluorescence

Analytical letters, 2018-06, Vol.51 (9), p.1433-1444

2018

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Microanalytical method development for Fe, Cu and Zn determination in colorectal cancer cells

Talanta (Oxford), 2011-09, Vol.85 (4), p.1959-1965

2011

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Performance and comparison of gold-based neutron flux monitors

Gold bulletin, 2012-03, Vol.45 (1), p.17-22

2012

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Atomic spectrometry update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2007-01, Vol.22 (10), p.1304-1332

2007

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Atomic spectrometry update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2008-01, Vol.23 (10), p.1409-1437

2008

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Atomic spectrometry update. X-Ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2005-01, Vol.20 (10), p.1124

2005

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Atomic spectrometry update—X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2006-01, Vol.21 (10), p.1076-1107

2006

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Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2007-08, Vol.261 (1-2), p.541-543

2007

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Si Wafer Analysis of Light Elements by TXRF

ECS transactions, 2009, Vol.25 (3), p.301-309

2009

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Atomic spectrometry update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2004-01, Vol.19 (10), p.1397

2004

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Comparability of TXRF Systems at Different Laboratories

ECS transactions, 2009, Vol.25 (3), p.325-335

2009

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Atomic spectrometry update. X-ray fluorescence spectrometry

Journal of analytical atomic spectrometry, 2003-01, Vol.18 (10), p.1297

2003

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Assessing Various Analytical Techniques with Different Lateral Resolution by Investigating Spin-coated Inorganic Contamination on Si Wafer Surfaces

ECS transactions, 2009, Vol.25 (3), p.311-323

2009

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Support effect on the reactivity and stability of Au25(SR)18 and Au144(SR)60 nanoclusters in liquid phase cyclohexane oxidation

Dynamics of Pd Dopant Atoms inside Au Nanoclusters during Catalytic CO Oxidation

Investigation of polycapillary half lenses for quantitative confocal micro‐X‐ray fluorescence analysis

Comparative elemental analysis of fine particulate matter (PM2.5) from industrial and residential areas in Greater Cairo-Egypt by means of a multi-secondary target energy dispersive X-ray fluorescence spectrometer

X‑ray Fluorescence Techniques for Element Abundance Analysis in Wine

Implementing light elements detection and quantification in aluminosilicate materials using a Low-Z total-reflection X-ray fluorescence spectrometer

Elemental composition and source apportionment of atmospheric aerosols collected from urban and residential areas of Jordan using multi-secondary targets energy dispersive X-ray fluorescence

Atomic layer deposition to prevent metal transfer from implants: An X-ray fluorescence study

Atomic spectrometry update. X-ray fluorescence spectrometry

Study of selenium sorption processes in volcanic ash using Total Reflection X-ray Fluorescence (TXRF)

Atomic Spectrometry Update. X-ray fluorescence spectrometry

EDXRF analysis of suspended particulate matter (SPM) from residential and industrial areas in Cairo, Egypt

Method Development and Quantitative Elemental Analysis of Mentha Longifolia L. Leaves from Saudi Arabia by Total Reflection X-Ray Fluorescence

Microanalytical method development for Fe, Cu and Zn determination in colorectal cancer cells

Performance and comparison of gold-based neutron flux monitors

Atomic spectrometry update. X-ray fluorescence spectrometry

Atomic spectrometry update. X-ray fluorescence spectrometry

Atomic spectrometry update. X-Ray fluorescence spectrometry

Atomic spectrometry update—X-ray fluorescence spectrometry

Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

Si Wafer Analysis of Light Elements by TXRF

Atomic spectrometry update. X-ray fluorescence spectrometry

Comparability of TXRF Systems at Different Laboratories

Atomic spectrometry update. X-ray fluorescence spectrometry

Assessing Various Analytical Techniques with Different Lateral Resolution by Investigating Spin-coated Inorganic Contamination on Si Wafer Surfaces

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