UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 99

Sortiert nach

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

Nature communications, 2014-12, Vol.5 (1), p.5653-5653, Article 5653

2014

Link zum Volltext

Verfügbarkeit prüfen

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy

Ultramicroscopy, 2017-07, Vol.178, p.62-80

2017

Link zum Volltext

Verfügbarkeit prüfen

Ultrathin Au-Alloy Nanowires at the Liquid–Liquid Interface

Nano letters, 2018-03, Vol.18 (3), p.1903-1907

2018

Link zum Volltext

Verfügbarkeit prüfen

Sample tilt effects on atom column position determination in ABF–STEM imaging

Ultramicroscopy, 2016-01, Vol.160, p.110-117

2016

Link zum Volltext

Verfügbarkeit prüfen

Material Discrimination in Nanoparticle Hetero‐Aggregates by Analysis of Scanning Transmission Electron Microscopy Images

Particle & particle systems characterization, 2023-09, Vol.40 (9)

2023

Link zum Volltext

Verfügbarkeit prüfen

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Ultramicroscopy, 2019-01, Vol.196, p.74-82

2019

Link zum Volltext

Verfügbarkeit prüfen

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

Ultramicroscopy, 2015-11, Vol.158, p.38-48

2015

Link zum Volltext

Verfügbarkeit prüfen

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence

Ultramicroscopy, 2018-07, Vol.190, p.45-57

2018

Link zum Volltext

Verfügbarkeit prüfen

Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation

Ultramicroscopy, 2018-01, Vol.184 (Pt B), p.29-36

2018

Link zum Volltext

Verfügbarkeit prüfen

Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme

Ultramicroscopy, 2024-02, Vol.256, p.113867-113867, Article 113867

2024

Link zum Volltext

Verfügbarkeit prüfen

Conventional transmission electron microscopy imaging beyond the diffraction and information limits

Physical review letters, 2014-08, Vol.113 (9), p.096101-096101, Article 096101

2014

Link zum Volltext

Verfügbarkeit prüfen

Characterization of mixing in nanoparticle hetero‐aggregates by convolutional neural networks

Nano select, 2024-04, Vol.5 (4), p.n/a

2024

Link zum Volltext

Verfügbarkeit prüfen

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential

Ultramicroscopy, 2022-06, Vol.236, p.113503-113503, Article 113503

2022

Link zum Volltext

Verfügbarkeit prüfen

GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

Journal of microscopy (Oxford), 2024-08, Vol.295 (2), p.140-146

2024

Link zum Volltext

Verfügbarkeit prüfen

Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration

Ultramicroscopy, 2023-03, Vol.245, p.113661-113661, Article 113661

2023

Link zum Volltext

Verfügbarkeit prüfen

Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose

Ultramicroscopy, 2019-08, Vol.203, p.95-104

2019

Link zum Volltext

Verfügbarkeit prüfen

Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods

Ultramicroscopy, 2021-02, Vol.221, p.113196-113196, Article 113196

2021

Link zum Volltext

Verfügbarkeit prüfen

Effects of instrument imperfections on quantitative scanning transmission electron microscopy

Ultramicroscopy, 2016-02, Vol.161, p.146-160

2016

Link zum Volltext

Verfügbarkeit prüfen

Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN

Ultramicroscopy, 2018-06, Vol.189, p.124-135

2018

Link zum Volltext

Verfügbarkeit prüfen

Accuracy and precision of position determination in ISTEM imaging of BaTiO3

Ultramicroscopy, 2021-08, Vol.227, p.113325-113325, Article 113325

2021

Link zum Volltext

Verfügbarkeit prüfen

Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

Ultramicroscopy, 2022-08, Vol.238, p.113535-113535, Article 113535

2022

Link zum Volltext

Verfügbarkeit prüfen

Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images

Microscopy and microanalysis, 2014-10, Vol.20 (5), p.1463-1470

2014

Link zum Volltext

Verfügbarkeit prüfen

Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si

Ultramicroscopy, 2021-02, Vol.221, p.113175-113175, Article 113175

2021

Link zum Volltext

Verfügbarkeit prüfen

4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection

Ultramicroscopy, 2021-09, Vol.228, p.113321-113321, Article 113321

2021

Link zum Volltext

Verfügbarkeit prüfen

Materials characterisation by angle-resolved scanning transmission electron microscopy

Scientific reports, 2016-11, Vol.6 (1), p.37146, Article 37146

2016

Link zum Volltext

Verfügbarkeit prüfen

1 – 25 von 99

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(86)
Mit Volltextzugriff
(93)

Publikationsform

1 weiteren anzeigen...

Weniger anzeigen...

Sprache

Englisch
(97)
Japanisch
(17)
Deutsch
(2)

Erscheinungsjahr

n.n

Thema

Science & Technology
(82)
Technology
(38)
Life Sciences & Biomedicine
(34)
Humans
(29)
Microscopy
(26)
Male
(19)
Female
(17)
Infectious Diseases
(14)
Adult
(13)
Aged
(13)
Physical Sciences
(13)
Scanning Transmission Electron Microscopy
(12)
Biological And Medical Sciences
(11)
Middle Aged
(11)
Medical Sciences
(10)
Microbiology
(9)
Science & Technology - Other Topics
(9)
Transmission Electron Microscopy
(9)
Tem
(8)
Aged, 80 And Over
(7)

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(1)
... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy

Ultrathin Au-Alloy Nanowires at the Liquid–Liquid Interface

Sample tilt effects on atom column position determination in ABF–STEM imaging

Material Discrimination in Nanoparticle Hetero‐Aggregates by Analysis of Scanning Transmission Electron Microscopy Images

Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence

Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation

Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme

Conventional transmission electron microscopy imaging beyond the diffraction and information limits

Characterization of mixing in nanoparticle hetero‐aggregates by convolutional neural networks

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential

GaN atomic electric fields from a segmented STEM detector: Experiment and simulation

Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration

Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose

Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods

Effects of instrument imperfections on quantitative scanning transmission electron microscopy

Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN

Accuracy and precision of position determination in ISTEM imaging of BaTiO3

Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN

Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images

Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si

4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection

Materials characterisation by angle-resolved scanning transmission electron microscopy

Suchergebnisse filtern