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IEEE transactions on computers, 2005-04, Vol.54 (4), p.461-475
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IEEE transactions on reliability, 2005-03, Vol.54 (1), p.69-78
2005

IEEE transactions on very large scale integration (VLSI) systems, 2013-04, Vol.21 (4), p.786-790
2013

2010 IEEE International Conference on Computer Design, 2010, p.376-383
2010

IEEE transactions on dependable and secure computing, 2012-01, Vol.9 (1), p.86-100
2012

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2002, p.223-228
2002

Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 04-08 Mar. 2002, 2002, p.592-597
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Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001, 2001, p.92-96
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International Test Conference, 2003. Proceedings. ITC 2003, 2003, Vol.1, p.431-440
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Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003, 2003, p.10714-10714
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Link zum Volltext

IEEE design & test of computers, 2008-01, Vol.25 (1), p.64-75
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2011 IEEE International Test Conference, 2011, p.1-10
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Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078), 1999, p.117-121
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2010 IEEE 16th International On-Line Testing Symposium, 2010, p.159-164
2010

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 2001, p.15-20
2001

2010 IEEE 16th International On-Line Testing Symposium, 2010, p.62-67
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2008 IEEE International Test Conference, 2008, p.1-10
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Proceedings of the Design Automation & Test in Europe Conference, 2006, Vol.1, p.1-6
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Journal of electronic testing, 2003-04, Vol.19 (2), p.103
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9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003, 2003, p.149-154
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2014 IEEE 20th International On-Line Testing Symposium (IOLTS), 2014, p.154-159
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Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design, 2001, p.343-349
2001

IEEE design & test of computers, 2000-10, Vol.17 (4), p.15-28
2000

2012 17th IEEE European Test Symposium (ETS), 2012, p.1-1
2012