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Semiconductors (Woodbury, N.Y.), 2021-08, Vol.55 (8), p.660-666
2021
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Semiconductors (Woodbury, N.Y.), 2020-09, Vol.54 (9), p.1059-1063
2020
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Surface investigation, x-ray, synchrotron and neutron techniques, 2024-04, Vol.18 (2), p.428-432
2024
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Journal of physics. Conference series, 2018-12, Vol.1124 (2), p.22037
2018
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Semiconductors (Woodbury, N.Y.), 2019-03, Vol.53 (3), p.332-338
2019
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Journal of physics. Conference series, 2018-03, Vol.993 (1), p.12014
2018
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Applied physics letters, 2014-12, Vol.105 (23)
2014
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Surface investigation, x-ray, synchrotron and neutron techniques, 2019, Vol.13 (1), p.105-110
2019
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Applied surface science, 2019-06, Vol.479, p.930-941
2019
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Journal of non-crystalline solids, 2018-11, Vol.499, p.237-244
2018
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Russian physics journal, 2022-03, Vol.64 (11), p.2155-2161
2022
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Mineralogical magazine, 2023-04, Vol.87 (2), p.233-240
2023
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Journal of non-crystalline solids, 2020-12, Vol.549, p.120339, Article 120339
2020
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Journal of non-crystalline solids, 2020-12, Vol.549, Article 120339
2020
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Nanotechnology, 2013-03, Vol.24 (12), p.125706-125706
2013
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Zapiski RMO (Proceedings of the Russian Mineralogical Society), 2023-07, Vol.CLII (4), p.123-134
2023
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Welding international, 2017-05, Vol.31 (5), p.369-373
2017
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Thin solid films, 2011-03, Vol.519 (10), p.3437-3442
2011
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Chemical biology & drug design, 2014-11, Vol.84 (5), p.585-592
2014
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Measurement techniques, 2015-10, Vol.58 (7), p.760-765
2015
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Welding international, 2016-04, Vol.30 (4), p.325-328
2016
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IOP conference series. Materials Science and Engineering, 2018-07, Vol.387 (1)
2018
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IOP conference series. Materials Science and Engineering, 2018-07, Vol.387, p.12047
2018
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Thin solid films, 2011, Vol.519 (10), p.3437-3442
2011
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Instruments and experimental techniques (New York), 2015-03, Vol.58 (2), p.247-251
2015
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