UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Calibrated nanoscale dopant profiling using a scanning microwave microscope

Journal of applied physics, 2012-01, Vol.111 (1), p.014301-014301-9

2012

Volltextzugriff (PDF)

Spectroscopic charge pumping investigation of the amphoteric nature of Si/SiO2 interface states

Applied physics letters, 2011-06, Vol.98 (23)

2011

Volltextzugriff (PDF)

Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

IEEE transactions on nanotechnology, 2007-03, Vol.6 (2), p.256-262

2007

Volltextzugriff (PDF)

Influence of Metal–MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti Contacts

ACS applied materials & interfaces, 2015-01, Vol.7 (2), p.1180-1187

2015

Volltextzugriff (PDF)

Surface Grafting of Polypyrrole onto Silicon Wafers

Chemistry letters, 2007-10, Vol.36 (10), p.1210-1211

2007

Volltextzugriff (PDF)

Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope

Journal of physics. D, Applied physics, 2016-02, Vol.49 (4), p.45502-45512

2016

Volltextzugriff (PDF)

Atomic force microscope laser illumination effects on a sample and its application for transient spectroscopy

Applied physics letters, 2003-09, Vol.83 (12), p.2486-2488

2003

Volltextzugriff (PDF)

Deterministic Tagging Technology for Device Authentication

2021 International Conference on IC Design and Technology (ICICDT), 2021, p.1-3

2021

Volltextzugriff (PDF)

Experimental investigation of interface states and photovoltaic effects on the scanning capacitance microscopy measurement for p - n junction dopant profiling

Applied physics letters, 2005-05, Vol.86 (18), p.182101-182101-3

2005

Volltextzugriff (PDF)

Rapid and Accurate C - V Measurements

IEEE transactions on electron devices, 2016-10, Vol.63 (10), p.3851-3856

2016

Volltextzugriff (PDF)

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

IEEE transactions on electron devices, 2004-09, Vol.51 (9), p.1496-1503

2004

Volltextzugriff (PDF)

Electrical scanning probe microscopes to address industrial nano-metrology needs of integrated circuits and nanoelectronic devices

29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 2014, p.214-215

Kopanski, Joseph J.

2014

Volltextzugriff (PDF)

Ultrahigh-temperature microwave annealing of Al+- and P+-implanted 4H-SiC

Journal of applied physics, 2007-04, Vol.101 (7)

2007

Volltextzugriff (PDF)

SnTe field effect transistors and the anomalous electrical response of structural phase transition

Applied physics letters, 2014-07, Vol.105 (1)

2014

Volltextzugriff (PDF)

Silicon nanowire on oxide/nitride/oxide for memory application

Nanotechnology, 2007-06, Vol.18 (23), p.235204-235204 (4)

2007

Volltextzugriff (PDF)

Intermittent-contact scanning capacitance microscope for lithographic overlay measurement

Applied physics letters, 1998-05, Vol.72 (19), p.2469-2471

1998

Volltextzugriff (PDF)

Regression procedure for determining the dopant profile in semiconductors from scanning capacitance microscopy data

Journal of applied physics, 2002-11, Vol.92 (10), p.5798-5809

2002

Volltextzugriff (PDF)

A new interface defect spectroscopy method

2011 International Reliability Physics Symposium, 2011, p.3A.4.1-3A.4.5

2011

Volltextzugriff (PDF)

Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2006-01, Vol.24 (1), p.404-407

2006

Volltextzugriff (PDF)

Scanning Probe Microscopy for Dielectric and Metal Characterization

ECS transactions, 2008, Vol.13 (2), p.169-175

2008

Volltextzugriff (PDF)

Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy

Microelectronics and reliability, 2005-05, Vol.45 (5), p.887-890

2005

Volltextzugriff (PDF)

Comparison of experimental and theoretical scanning capacitance microscope signals and their impact on the accuracy of determined two-dimensional carrier profiles

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-09, Vol.20 (5), p.2101-2107

2002

Volltextzugriff (PDF)

Scanning capacitance microscopy applied to two-dimensional dopant profiling of semiconductors

Materials science & engineering. B, Solid-state materials for advanced technology, 1997-02, Vol.44 (1), p.46-51

1997

Volltextzugriff (PDF)

Boron-implanted 6H-SiC diodes

Applied physics letters, 1993-08, Vol.63 (9), p.1206-1208

1993

Volltextzugriff (PDF)

Thermal oxidation of 3C silicon carbide single-crystal layers on silicon

Applied physics letters, 1984-10, Vol.45 (7), p.757-759

1984

Volltextzugriff (PDF)

1 – 25 von 121

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(54)
Mit Volltextzugriff
(77)

Publikationsform

Sprache

Englisch
(112)
Japanisch
(16)
Deutsch
(3)
Polnisch
(3)

Erscheinungsjahr

n.n

Thema

Science & Technology
(73)
Physical Sciences
(52)
Technology
(48)
Physics
(44)
Physics, Applied
(37)
Engineering
(30)
Engineering, Electrical & Electronic
(30)
Nanoscience & Nanotechnology
(22)
Science & Technology - Other Topics
(22)
Computer Science
(19)
Exact Sciences And Technology
(14)
Computer Science, Theory & Methods
(12)
Humans
(12)
Materials Science
(12)
Female
(11)
Male
(11)
Middle Aged
(11)
Adult
(10)
Aged
(10)
Applied Sciences
(10)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Calibrated nanoscale dopant profiling using a scanning microwave microscope

Spectroscopic charge pumping investigation of the amphoteric nature of Si/SiO2 interface states

Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Influence of Metal–MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti Contacts

Surface Grafting of Polypyrrole onto Silicon Wafers

Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope

Atomic force microscope laser illumination effects on a sample and its application for transient spectroscopy

Deterministic Tagging Technology for Device Authentication

Experimental investigation of interface states and photovoltaic effects on the scanning capacitance microscopy measurement for p - n junction dopant profiling

Rapid and Accurate C - V Measurements

Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement

Electrical scanning probe microscopes to address industrial nano-metrology needs of integrated circuits and nanoelectronic devices

Ultrahigh-temperature microwave annealing of Al+- and P+-implanted 4H-SiC

SnTe field effect transistors and the anomalous electrical response of structural phase transition

Silicon nanowire on oxide/nitride/oxide for memory application

Intermittent-contact scanning capacitance microscope for lithographic overlay measurement

Regression procedure for determining the dopant profile in semiconductors from scanning capacitance microscopy data

A new interface defect spectroscopy method

Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures

Scanning Probe Microscopy for Dielectric and Metal Characterization

Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy

Comparison of experimental and theoretical scanning capacitance microscope signals and their impact on the accuracy of determined two-dimensional carrier profiles

Scanning capacitance microscopy applied to two-dimensional dopant profiling of semiconductors

Boron-implanted 6H-SiC diodes

Thermal oxidation of 3C silicon carbide single-crystal layers on silicon

Suchergebnisse filtern