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Kinetics and coupled dynamics of dewetting and chemical reaction in Si/SiO2/Si system

Journal of materials science, 2020-12, Vol.55 (34), p.16074-16082

2020

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Crack Front Interaction with Self-Emitted Acoustic Waves

Physical review letters, 2018-11, Vol.121 (19), p.195501-195501, Article 195501

2018

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Adaptation of the pseudo-metal–oxide–semiconductor field effect transistor technique to ultrathin silicon–on-insulator wafers characterization: Improved set-up, measurement procedure, parameter extraction, and modeling

Journal of applied physics, 2013-10, Vol.114 (16)

2013

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Interface water diffusion in silicon direct bonding

Applied physics letters, 2016-09, Vol.109 (11)

2016

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Fracture dynamics in implanted silicon

Applied physics letters, 2015-08, Vol.107 (9)

2015

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Aluminiumhydroxychlorid‐Flockungsmittel aus dem Kupferrecycling aus Abfällen der Leiterplattenproduktion

Chemie ingenieur technik, 2020-04, Vol.92 (4), p.368-378

2020

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Photorhabdus lux-operon heat shock-like regulation

Heliyon, 2023-03, Vol.9 (3), p.e14527-e14527, Article e14527

2023

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Silicon-on-Insulator (SOI) Technology - Manufacture and Applications

O Kononchuk, B-Y Nguyen

1, 2014

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Development of analytical model for strained silicon relaxation on (100) fully relaxed Si0.8Ge0.2 pseudo-substrates

Thin solid films, 2010-02, Vol.518 (9), p.2458-2461

2010

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Application of the O-lattice theory for the reconstruction of the high-angle near 90° tilt Si(110)/(001) boundary created by wafer bonding

Acta materialia, 2012-02, Vol.60 (3), p.1161-1173

2012

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Modification of dislocation PL centres due to misfit of bonded Si wafers

Physica status solidi. C, 2013-01, Vol.10 (1), p.16-19

2013

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Energetic spectra of dislocation networks produced by hydrophilic bonding of silicon wafers

Physica status solidi. C, 2013-01, Vol.10 (1), p.20-23

2013

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ГЛОБОЛОКАЛЬНИЙ ВИМІР В КОНЦЕПЦІЇ СТАЛОГО РОЗВИТКУ

Visnyk of the Lviv University. Series Sociology, 2017 (11), p.30-44

Kononchuk, O.

2017

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Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart CutTM technology

Finite elements in analysis and design, 2023-01, Vol.213, Article 103839

2023

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Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart Cut TM technology

Finite elements in analysis and design, 2023-01, Vol.213, p.103839, Article 103839

2023

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International mergers and acquisitions as a factor of tncs competitiveness reinforcement

Galic'kij ekonomičnij visnik, 2020, Vol.65 (4), p.224-236

2020

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Electrical levels of dislocation networks in p- and n-type Si

Journal of physics. Conference series, 2011-02, Vol.281 (1), p.012010-10

2011

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Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart Cut™ technology

Finite elements in analysis and design, 2022-01, Vol.213

2022

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(Invited) DLTS Studies of Defects in n-GaN

ECS transactions, 2016-08, Vol.75 (4), p.39-49

Tokuda, Yutaka

2016

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Investigation of non-decorated glide dislocations by infra-red light scattering tomography

Journal of physics. Conference series, 2011-02, Vol.281 (1), p.012005-7

2011

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Transistors on hybrid UTBB/Bulk substrates fabricated by local internal BOX dissolution

Solid-state electronics, 2013-12, Vol.90, p.39-43

2013

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Kinetics and coupled dynamics of dewetting and chemical reaction in Si/[Formula omitted]/Si system

Journal of materials science, 2020-12, Vol.55 (34), p.16074

2020

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Kinetics and coupled dynamics of dewetting and chemical reaction in Si/$$\hbox {SiO}_2$$/Si system

Journal of materials science, 2020-12, Vol.55 (34), p.16074-16082

2020

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Impurity gettering to secondary defects created by MeV ion implantation in silicon

Journal of applied physics, 1998-09, Vol.84 (5), p.2459-2465

1998

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Respiration of Amatitlania nigrofasciata at the action of toxicants used at different concentrations in model experiments

Bìologìčnì studìï, 2017-03, Vol.11 (1), p.147-160

2017

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Kinetics and coupled dynamics of dewetting and chemical reaction in Si/SiO2/Si system

Crack Front Interaction with Self-Emitted Acoustic Waves

Adaptation of the pseudo-metal–oxide–semiconductor field effect transistor technique to ultrathin silicon–on-insulator wafers characterization: Improved set-up, measurement procedure, parameter extraction, and modeling

Interface water diffusion in silicon direct bonding

Fracture dynamics in implanted silicon

Aluminiumhydroxychlorid‐Flockungsmittel aus dem Kupferrecycling aus Abfällen der Leiterplattenproduktion

Photorhabdus lux-operon heat shock-like regulation

Silicon-on-Insulator (SOI) Technology - Manufacture and Applications

Development of analytical model for strained silicon relaxation on (100) fully relaxed Si0.8Ge0.2 pseudo-substrates

Application of the O-lattice theory for the reconstruction of the high-angle near 90° tilt Si(110)/(001) boundary created by wafer bonding

Modification of dislocation PL centres due to misfit of bonded Si wafers

Energetic spectra of dislocation networks produced by hydrophilic bonding of silicon wafers

ГЛОБОЛОКАЛЬНИЙ ВИМІР В КОНЦЕПЦІЇ СТАЛОГО РОЗВИТКУ

Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart CutTM technology

Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart Cut TM technology

International mergers and acquisitions as a factor of tncs competitiveness reinforcement

Electrical levels of dislocation networks in p- and n-type Si

Three-dimensional X-FEM modeling of crack coalescence phenomena in the Smart Cut™ technology

(Invited) DLTS Studies of Defects in n-GaN

Investigation of non-decorated glide dislocations by infra-red light scattering tomography

Transistors on hybrid UTBB/Bulk substrates fabricated by local internal BOX dissolution

Kinetics and coupled dynamics of dewetting and chemical reaction in Si/[Formula omitted]/Si system

Kinetics and coupled dynamics of dewetting and chemical reaction in Si/$$\hbox {SiO}_2$$/Si system

Impurity gettering to secondary defects created by MeV ion implantation in silicon

Respiration of Amatitlania nigrofasciata at the action of toxicants used at different concentrations in model experiments

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