UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 410

Sortiert nach

Capitalism: A Short History

Kocka, Jürgen

1, 2016

Volltextzugriff (PDF)

Comparative and transnational history: central european approaches and new perspectives

NED - New edition, 1, 2010

Volltextzugriff (PDF)

The structure and growth mechanism of Si nanoneedles prepared by plasma-enhanced chemical vapor deposition

Nanotechnology, 2010-10, Vol.21 (41), p.415604-415604

2010

Volltextzugriff (PDF)

Work in a modern society: the german historical experience in comparative perspective

NED - New edition, 1, 2010

Volltextzugriff (PDF)

Some controversial points related to transport in microcrystalline silicon

Philosophical magazine (Abingdon, England), 2009-10, Vol.89 (28-30), p.2557-2571

2009

Volltextzugriff (PDF)

Losses, Gains and Opportunities: Social History Today

Journal of social history, 2003-09, Vol.37 (1), p.21-28

Kocka, Jürgen

2003

Volltextzugriff (PDF)

Extraction current transients: new method of study of charge transport in microcrystalline silicon

Physical review letters, 2000-05, Vol.84 (21), p.4946-4949

2000

Volltextzugriff (PDF)

A New Special Path for Germany

Telos (New York, N.Y.), 2016-09 (176), p.209

Kocka, Jürgen

2016

Volltextzugriff (PDF)

Photovoltage effects in polypyrrole–diamond nanosystem

Diamond and related materials, 2009-02, Vol.18 (2), p.249-252

2009

Volltextzugriff (PDF)

Conductive atomic force microscopy on carbon nanowalls

Journal of non-crystalline solids, 2012-09, Vol.358 (17), p.2545-2547

2012

Volltextzugriff (PDF)

Defects generation by hydrogen passivation of polycrystalline silicon thin films

Solar energy, 2006-06, Vol.80 (6), p.653-657

2006

Volltextzugriff (PDF)

Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon

Thin solid films, 2010-08, Vol.518 (21), p.5965-5970

2010

Volltextzugriff (PDF)

Electrochemical synthesis and electronic properties of polypyrrole on intrinsic diamond

Diamond and related materials, 2009-09, Vol.18 (9), p.1098-1101

2009

Volltextzugriff (PDF)

Optical absorption and light scattering in microcrystalline silicon thin films and solar cells

Journal of applied physics, 2000-07, Vol.88 (1), p.148-160

2000

Volltextzugriff (PDF)

Characterization of mixed phase silicon by Raman spectroscopy

Journal of non-crystalline solids, 2006-06, Vol.352 (9-20), p.1209-1212

2006

Volltextzugriff (PDF)

Microcrystalline silicon, grain boundaries and role of oxygen

Solar energy materials and solar cells, 2009-08, Vol.93 (8), p.1444-1447

2009

Volltextzugriff (PDF)

Creating nanocrystals in amorphous silicon using a conductive tip

Nanotechnology, 2009-01, Vol.20 (4), p.045302-045302 (6)

2009

Volltextzugriff (PDF)

Crystallinity of the mixed phase silicon thin films by Raman spectroscopy

Journal of non-crystalline solids, 2008-05, Vol.354 (19-25), p.2253-2257

2008

Volltextzugriff (PDF)

Role of grains in protocrystalline silicon layers grown at very low substrate temperatures and studied by atomic force microscopy

Journal of non-crystalline solids, 2002-04, Vol.299, p.767-771

2002

Volltextzugriff (PDF)

Microscopic study of the H2O vapor treatment of the silicon grain boundaries

Journal of non-crystalline solids, 2008-05, Vol.354 (19-25), p.2310-2313

2008

Volltextzugriff (PDF)

Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection

Journal of applied physics, 2002-07, Vol.92 (1), p.587-593

2002

Volltextzugriff (PDF)

Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM

Journal of non-crystalline solids, 2006-06, Vol.352 (9-20), p.1011-1015

2006

Volltextzugriff (PDF)

Ultrasharp Si nanowires produced by plasma-enhanced chemical vapor deposition

Physica status solidi. PSS-RRL. Rapid research letters, 2010-02, Vol.4 (1-2), p.37-39

2010

Volltextzugriff (PDF)

A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate

Thin solid films, 2008-06, Vol.516 (15), p.4966-4969

2008

Volltextzugriff (PDF)

Characterization of grain growth, nature and role of grain boundaries in microcrystalline silicon—review of typical features

Thin solid films, 2006-04, Vol.501 (1), p.107-112

2006

Volltextzugriff (PDF)

1 – 25 von 410

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(334)
Mit Volltextzugriff
(369)

Publikationsform

1 weiteren anzeigen...

Weniger anzeigen...

Sprache

1 weiteren anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Capitalism: A Short History

Comparative and transnational history: central european approaches and new perspectives

The structure and growth mechanism of Si nanoneedles prepared by plasma-enhanced chemical vapor deposition

Work in a modern society: the german historical experience in comparative perspective

Some controversial points related to transport in microcrystalline silicon

Losses, Gains and Opportunities: Social History Today

Extraction current transients: new method of study of charge transport in microcrystalline silicon

A New Special Path for Germany

Photovoltage effects in polypyrrole–diamond nanosystem

Conductive atomic force microscopy on carbon nanowalls

Defects generation by hydrogen passivation of polycrystalline silicon thin films

Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon

Electrochemical synthesis and electronic properties of polypyrrole on intrinsic diamond

Optical absorption and light scattering in microcrystalline silicon thin films and solar cells

Characterization of mixed phase silicon by Raman spectroscopy

Microcrystalline silicon, grain boundaries and role of oxygen

Creating nanocrystals in amorphous silicon using a conductive tip

Crystallinity of the mixed phase silicon thin films by Raman spectroscopy

Role of grains in protocrystalline silicon layers grown at very low substrate temperatures and studied by atomic force microscopy

Microscopic study of the H2O vapor treatment of the silicon grain boundaries

Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection

Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM

Ultrasharp Si nanowires produced by plasma-enhanced chemical vapor deposition

A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate

Characterization of grain growth, nature and role of grain boundaries in microcrystalline silicon—review of typical features

Suchergebnisse filtern