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A neural network-based soft sensor for particle size distribution using image analysis

Powder technology, 2011-10, Vol.212 (2), p.359-366

2011

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Quantitative Analysis for Plasma Etch Modeling Using Optical Emission Spectroscopy: Prediction of Plasma Etch Responses

Industrial Engineering and Management Systems, 2015-12, Vol.14 (4), p.392-400

2015

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SAG mill system diagnosis using multivariate process variable analysis

Canadian journal of chemical engineering, 2011-12, Vol.89 (6), p.1492-1501

2011

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Formation of p-type ZnO film on InP substrate by phosphor doping

Applied surface science, 2003-04, Vol.210 (3), p.177-182

2003

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Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA-based neural networks

Surface and interface analysis, 2013-09, Vol.45 (9), p.1334-1339

2013

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Functional Kernel-Based Modeling of Wavelet Compressed Optical Emission Spectral Data: Prediction of Plasma Etch Process

IEEE sensors journal, 2010-03, Vol.10 (3), p.746-754

2010

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Characterization and process effects of HfO2 thin films grown by metal-organic molecular beam epitaxy

Materials science & engineering. B, Solid-state materials for advanced technology, 2005-11, Vol.123 (1), p.20-30

2005

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Time delay neural network modeling for particle size in SAG mills

Powder technology, 2011-01, Vol.205 (1), p.250-262

2011

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Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing

Expert systems with applications, 2013-10, Vol.40 (14), p.5688-5693

2013

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Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms

Expert systems with applications, 2009-03, Vol.36 (2), p.4061-4066

2009

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A Modeling Toolbox and Its Applications to Statistical Process Modeling

Journal of software, 2013-11, Vol.8 (11), p.2706-2706

2013

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Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy

Applied surface science, 2004-04, Vol.227 (1-4), p.387-398

2004

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Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates

Expert systems with applications, 2008-10, Vol.35 (3), p.1311-1315

2008

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Statistical modeling of the electrical characteristics for HfO2 thin films grown by MOMBE for high-k dielectric applications

Journal of materials processing technology, 2008-07, Vol.203 (1-3), p.454-460

2008

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Piecewise Regression Model for Solenoid Embedded Inductors Based on the Quasi-newton Method

Transactions on Electrical and Electronic Materials, 2005, 6(6), , pp.256-261

2005

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Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling

Expert systems with applications, 2007-02, Vol.32 (2), p.358-363

2007

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Neural network based modeling of PL intensity in PLD-grown ZnO thin films

Journal of materials processing technology, 2005-01, Vol.159 (2), p.159-163

2005

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Effects of post-metallization annealing of high- K dielectric thin films grown by MOMBE

Microelectronic engineering, 2005, Vol.77 (1), p.48-54

2005

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Investigation of cell gap on the polymer substrates using statistical modelling for flexible liquid crystal display applications

International journal of nanomanufacturing, 2008, Vol.2 (4), p.361

2008

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Nonlinear diffusion process modeling using response surface methodology and variable transformation

Robotics and computer-integrated manufacturing, 2004-04, Vol.20 (2), p.121-125

2004

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PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition

Advances in Neural Networks - ISNN 2006, p.1099-1104

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Piecewise Regression Model for Solenoid Embedded Inductors Based on the Quasi-newton Method

Transactions on electrical and electronic materials, 2005-12, Vol.6 (6), p.256-261

2005

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Predictive modeling and analysis of HfO 2 thin film process based on Bayesian information criterion using PCA‐based neural networks

Surface and interface analysis, 2013-09, Vol.45 (9), p.1334-1339

2013

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Predictive modeling and analysis of HfO sub(2) thin film process based on Bayesian information criterion using PCA-based neural networks

Surface and interface analysis, 2013-09, Vol.45 (9), p.1334-1339

2013

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Comparison of PCA-based Neural Network Models using the Screening of X-ray Diffraction Data for MOMBE-grown HfO2 Thin Film Characteristics

2007 11th International Conference on Intelligent Engineering Systems, 2007, p.115-120

2007

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A neural network-based soft sensor for particle size distribution using image analysis

Quantitative Analysis for Plasma Etch Modeling Using Optical Emission Spectroscopy: Prediction of Plasma Etch Responses

SAG mill system diagnosis using multivariate process variable analysis

Formation of p-type ZnO film on InP substrate by phosphor doping

Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA-based neural networks

Functional Kernel-Based Modeling of Wavelet Compressed Optical Emission Spectral Data: Prediction of Plasma Etch Process

Characterization and process effects of HfO2 thin films grown by metal-organic molecular beam epitaxy

Time delay neural network modeling for particle size in SAG mills

Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing

Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms

A Modeling Toolbox and Its Applications to Statistical Process Modeling

Characteristics and processing effects of ZrO2 thin films grown by metal-organic molecular beam epitaxy

Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates

Statistical modeling of the electrical characteristics for HfO2 thin films grown by MOMBE for high-k dielectric applications

Piecewise Regression Model for Solenoid Embedded Inductors Based on the Quasi-newton Method

Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling

Neural network based modeling of PL intensity in PLD-grown ZnO thin films

Effects of post-metallization annealing of high- K dielectric thin films grown by MOMBE

Investigation of cell gap on the polymer substrates using statistical modelling for flexible liquid crystal display applications

Nonlinear diffusion process modeling using response surface methodology and variable transformation

PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition

Piecewise Regression Model for Solenoid Embedded Inductors Based on the Quasi-newton Method

Predictive modeling and analysis of HfO 2 thin film process based on Bayesian information criterion using PCA‐based neural networks

Predictive modeling and analysis of HfO sub(2) thin film process based on Bayesian information criterion using PCA-based neural networks

Comparison of PCA-based Neural Network Models using the Screening of X-ray Diffraction Data for MOMBE-grown HfO2 Thin Film Characteristics

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