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Acta materialia, 2016-06, Vol.111, p.194-201
2016
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Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2008-05, Vol.481, p.66-72
2008
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2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.110-116
2004
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Solar energy materials and solar cells, 2007-09, Vol.91 (15-16), p.1496-1502
2007
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2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.46-48
2004
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IEEE International Integrated Reliability Workshop Final Report, 2003, 2003, p.71-79
2003
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Microelectronics and reliability, 2008-03, Vol.48 (3), p.354-363
2008
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Solar energy materials and solar cells, 2007, Vol.91 (15), p.1496-1502
2007
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2009 IEEE International Integrated Reliability Workshop Final Report, 2009, p.36-41
2009
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.48-54
2008
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.1-21
2008
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2009 52nd IEEE International Midwest Symposium on Circuits and Systems, 2009, p.913-916
2009
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IEEE transactions on device and materials reliability, 2006-06, Vol.6 (2), p.136-145
2006
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2006 IEEE International Integrated Reliability Workshop Final Report, 2006, p.146-147
2006
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Physics reports, 1998-12, Vol.307 (1), p.283-290
- Schnee, R.W
- Akerib, D.S
- Jr, P.D.Barnes
- Bauer, D.A
- Brink, P.L
- Cabrera, B
- Caldwell, D.O
- Clarke, R.M
- Colling, P
- Crisler, M.B
- DaSilva, A
- Davies, A.K
- Dougherty, B.L
- Eichblatt, S
- Irwin, K.D
- Gaitskell, R.J
- Golwala, S.R
- Haller, E.E
- Jochum, J
- Knowlton, W.B
- Kuzminov, V
- Nam, S.W
- Novikov, V
- Penn, M.J
- Perera, T.A
- Ross, R.R
- Sadoulet, B
- Shutt, T
- Smith, A
- Sonnenschein, A.H
- Spadafora, A.L
- Stockwell, W.K
- Yellin, S
- Young, B.A
1998
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2005 IEEE International Integrated Reliability Workshop, 2005, p.4 pp.
2005
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1996-02, Vol.370 (1), p.233-236
- Barnes, P.D
- Da Silva, A
- Akerib, D.S
- Bauer, D
- Brink, P
- Cabrera, B
- Caldwell, D.O
- Chugg, B
- Clarke, R.M
- Cummings, A
- Davies, A
- Diaz, R.C
- Dougherty, B.L
- Emes, J
- Golwala, S.R
- Hale, D
- Haller, E.E
- Irwin, K.D
- Knowlton, W.B
- Kuziminov, V
- Lu, A
- Nam, S.W
- Penn, M.J
- Novikov, V
- Pritychenko, B.V
- Quéinnec, F
- Ross, R.R
- Sadoulet, B
- Seitz, D
- Shutt, T
- Smith, A
- Smith, G
- Sonnenschein, A
- Stockwell, W
- Taylor, J.D
- Therrien, R
- Trumbull, T.L
- White, S
- Wolgast, R.C
- Yellin, S
- Young, B.A
1996
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IEEE International Integrated Reliability Workshop Final Report, 2004, 2004, p.32-36
2004
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IEEE transactions on advanced packaging, 2008-02, Vol.31 (1), p.4-13
2008
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Nuclear physics. Section B, Proceedings supplement, 1996-11, Vol.51 (2), p.318-322
- Shutt, T.
- Akerib, D.S.
- Barnes, P.D.
- Bauer, D.
- Brink, P.
- Cabrera, B.
- Caldwell, D.O.
- Chugg, B.
- Clarke, R.M.
- DaSilva, A.
- Davies, A.
- Dougherty, B.L.
- Emes, J.
- Gaitskell, R.J.
- Golwala, S.R.
- Hale, D.
- Haller, E.E.
- Irwin, K.D.
- Knowlton, W.B.
- Kuzminov, V.
- Lu, A.
- Muno, M.
- Nam, S.W.
- Novikov, V.
- Penn, M.J.
- Ross, R.R.
- Sadoulet, B.
- Seitz, D.
- Smith, A.
- Smith, G.
- Sonnenschein, A.
- Stockwell, W.
- Taylor, J.D.
- Therrien, R.
- Trumbull, T.L.
- White, S.
- Yellin, S.
- Young, B.A.
1996
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Materials science forum, 1995-01, Vol.196-201, p.1761-1766
1995
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2009 International Semiconductor Device Research Symposium, 2009, p.1-2
2009
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2007 IEEE Workshop on Microelectronics and Electron Devices, 2007, p.49-50
2007
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2007 Proceedings 57th Electronic Components and Technology Conference, 2007, p.1235-1238
2007
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IEEE International Integrated Reliability Workshop Final Report, 2002, 2002, p.180-183
2002
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- Nuclear Physics. Section B, Proceedings Supplement
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