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Enhanced Gas Sensing by Individual SnO2 Nanowires and Nanobelts Functionalized with Pd Catalyst Particles

Nano letters, 2005-04, Vol.5 (4), p.667-673

2005

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Solving structure of the interfaces using atomic level energy dispersive x-ray spectroscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1030-1031

2012

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Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy

Physical review. B, Condensed matter and materials physics, 2010-03, Vol.81 (10), Article 100101

2010

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Thermoelectric power factor in semiconductors with buried epitaxial semimetallic nanoparticles

Applied physics letters, 2005-09, Vol.87 (11), p.112102-112102-3

2005

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Enhanced Gas Sensing by Individual SnO 2 Nanowires and Nanobelts Functionalized with Pd Catalyst Particles

Nano letters, 2005-04, Vol.5 (4), p.667-673

2005

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Electrical and material characterizations of high-permittivity HfxTi1−xO2 gate insulators

Journal of applied physics, 2005-09, Vol.98 (5)

2005

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Thermal conductivity reduction and thermoelectric figure of merit increase by embedding nanoparticles in crystalline semiconductors

Physical review letters, 2006-02, Vol.96 (4), p.045901-045901, Article 045901

2006

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Contribution of thermally scattered electrons to atomic resolution elemental maps

Physical review. B, Condensed matter and materials physics, 2012-07, Vol.86 (2), Article 024108

2012

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Microstructure and Dielectric Properties of Textured SrTiO3 Thin Films

Journal of the American Ceramic Society, 2005-04, Vol.88 (4), p.789-801

2005

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Atomic number contrast in high angle annular dark field imaging of crystals

Materials science and technology, 2008-06, Vol.24 (6), p.660-666

2008

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Reliability of Strained-Si Devices With Post-Oxide-Deposition Strain Introduction

IEEE transactions on electron devices, 2008-12, Vol.55 (12), p.3432-3441

2008

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Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1360-1361

2006

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Vacancy ordering in the structure of γ-Al2O3

Journal of the European Ceramic Society, 2000-07, Vol.20 (8), p.1187-1189

2000

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Microstructure of Epitaxial SrTiO3/Pt/Ti/ Sapphire Heterostructures

Journal of materials research, 2005-09, Vol.20 (9), p.2261-2265

2005

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Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.990-991

Klenov, D.O.

2012

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GENERAL FRAMEWORK FOR PUBLISHING OF MATHEMATICAL WEB APPLICATIONS

Informat͡s︡iĭni tekhnolohiï v osviti, 2009-06 (3), p.118-122

2009

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Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.418-419

2008

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Electrical and material characterizations of high-permittivity Hf x Ti 1 − x O 2 gate insulators

Journal of applied physics, 2005-09, Vol.98 (5), p.054506-054506-8

2005

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Single crystalline Pr2−xYxO3 (x=–2) dielectrics on Si with tailored electronic and crystallographic structure

Journal of applied physics, 2010-11, Vol.108 (10)

2010

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Single crystalline Pr 2 − x Y x O 3 ( x = 0 - 2 ) dielectrics on Si with tailored electronic and crystallographic structure

Journal of applied physics, 2010-11, Vol.108 (10), p.103709-103709-4

2010

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Single crystalline Pr{sub 2-x}Y{sub x}O{sub 3} (x=0-2) dielectrics on Si with tailored electronic and crystallographic structure

Journal of applied physics, 2010-11, Vol.108 (10)

2010

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Interface atomic structure of epitaxial ErAs layers on (001) In0.53Ga0.47As and GaAs

Applied physics letters, 2005-06, Vol.86 (24)

2005

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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.598-599

2011

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On the Performance of XEDS and EELS in the AEM: 25 Years Later

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.590-591

2011

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Electron Energy-Loss Spectroscopy of Alternative Gate Dielectric Stacks

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.66-67

2002

Volltextzugriff (PDF)

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Enhanced Gas Sensing by Individual SnO2 Nanowires and Nanobelts Functionalized with Pd Catalyst Particles

Solving structure of the interfaces using atomic level energy dispersive x-ray spectroscopy

Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy

Thermoelectric power factor in semiconductors with buried epitaxial semimetallic nanoparticles

Enhanced Gas Sensing by Individual SnO 2 Nanowires and Nanobelts Functionalized with Pd Catalyst Particles

Electrical and material characterizations of high-permittivity HfxTi1−xO2 gate insulators

Thermal conductivity reduction and thermoelectric figure of merit increase by embedding nanoparticles in crystalline semiconductors

Contribution of thermally scattered electrons to atomic resolution elemental maps

Microstructure and Dielectric Properties of Textured SrTiO3 Thin Films

Atomic number contrast in high angle annular dark field imaging of crystals

Reliability of Strained-Si Devices With Post-Oxide-Deposition Strain Introduction

Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces

Vacancy ordering in the structure of γ-Al2O3

Microstructure of Epitaxial SrTiO3/Pt/Ti/ Sapphire Heterostructures

Detection of individual atoms with energy dispersive x-ray spectroscopy in scanning transmission electron microscopy

GENERAL FRAMEWORK FOR PUBLISHING OF MATHEMATICAL WEB APPLICATIONS

Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers

Electrical and material characterizations of high-permittivity Hf x Ti 1 − x O 2 gate insulators

Single crystalline Pr2−xYxO3 (x=–2) dielectrics on Si with tailored electronic and crystallographic structure

Single crystalline Pr 2 − x Y x O 3 ( x = 0 - 2 ) dielectrics on Si with tailored electronic and crystallographic structure

Single crystalline Pr{sub 2-x}Y{sub x}O{sub 3} (x=0-2) dielectrics on Si with tailored electronic and crystallographic structure

Interface atomic structure of epitaxial ErAs layers on (001) In0.53Ga0.47As and GaAs

Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy

On the Performance of XEDS and EELS in the AEM: 25 Years Later

Electron Energy-Loss Spectroscopy of Alternative Gate Dielectric Stacks

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