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Quantum Mechanical Actuation of Microelectromechanical Systems by the Casimir Force

Science (American Association for the Advancement of Science), 2001-03, Vol.291 (5510), p.1941-1944

2001

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Nonlinear micromechanical Casimir oscillator

Physical review letters, 2001-11, Vol.87 (21), p.211801-211801, Article 211801

2001

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Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottky diodes

Applied physics letters, 2001-03, Vol.78 (12), p.1685-1687

2001

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Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation

Applied physics letters, 1999-01, Vol.74 (2), p.272-274

1999

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Nature of the highly conducting interfacial layer in GaN films

Applied physics letters, 2000-10, Vol.77 (18), p.2873-2875

2000

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Neutron diffraction studies of flowing and pinned magnetic flux lattices in 2H-NbSe2

Physical review letters, 1994-11, Vol.73 (20), p.2748-2751

1994

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Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy

Applied physics letters, 2000-07, Vol.77 (3), p.456-458

2000

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Imaging of acoustic fields in bulk acoustic-wave thin-film resonators

Applied physics letters, 2000-07, Vol.77 (1), p.136-138

2000

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Spatial variation of electrical properties in lateral epitaxially overgrown GaN

Applied physics letters, 2001-08, Vol.79 (6), p.761-763

2001

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Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips

Applied physics letters, 1999-06, Vol.74 (24), p.3672-3674

1999

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X-ray magnetic scattering in antiferromagnetic URu2Si2

Physical review letters, 1990-12, Vol.65 (25), p.3185-3188

1990

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Anisotropic temperature dependence of the magnetic-field penetration in superconducting UPt3

Physical review letters, 1990-10, Vol.65 (16), p.2062-2065

1990

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Neutron diffraction from the vortex lattice in the heavy-fermion superconductor UPt3

Physical review letters, 1992-11, Vol.69 (21), p.3120-3123

1992

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Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy

Journal of electronic materials, 2001-03, Vol.30 (3), p.115-122

2001

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Magnetic penetration depth and flux dynamics in single-crystal Bi2Sr2CaCu2O8+ delta

Physical review letters, 1991-11, Vol.67 (22), p.3152-3155

1991

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Small angle neutron scattering study of the magnetic flux-line lattice in single crystal 2H-NbSe2

Physical review letters, 1994-01, Vol.72 (2), p.278-281

1994

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Low-temperature specific heat and thermal expansion in the frustrated garnet Gd3Ga5O12

Journal of applied physics, 1991-04, Vol.69 (8), p.5252-5254

1991

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Mechanical measurements of the flux lattice in the heavy-fermion superconductor UPt3

Physical review letters, 1989-01, Vol.62 (3), p.328-331

1989

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Two-level systems observed in the mechanical properties of single-crystal silicon at low temperatures

Physical review letters, 1987-11, Vol.59 (18), p.2079-2082

1987

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Observation of magnetic order in the heavy-fermion superconductor UBe13

Physical review letters, 1990-04, Vol.64 (16), p.1975-1978

1990

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Magnetic fluctuations and the superconducting transition in the heavy-fermion material UPd2Al3

Physica. B, Condensed matter, 1994-04, Vol.199-200, p.151-153

1994

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Kleiman et al. reply

Physical review letters, 1989-05, Vol.62 (19), p.2331-2331

1989

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Structural evidence for a two-step process in the depinning of the superconducting flux-line lattice

Nature (London), 1996-05, Vol.381 (6579), p.253-253, Article 253

1996

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Single‐crystal silicon high‐Q torsional oscillators

Review of scientific instruments, 1985-11, Vol.56 (11), p.2088-2091

1985

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Characterization of InP using metal-insulator-semiconductor-tunneling microscopy (MISTM)

Conference Proceedings. 2000 International Conference on Indium Phosphide and Related Materials (Cat. No.00CH37107), 2000, p.64-66

2000

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Quantum Mechanical Actuation of Microelectromechanical Systems by the Casimir Force

Nonlinear micromechanical Casimir oscillator

Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottky diodes

Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation

Nature of the highly conducting interfacial layer in GaN films

Neutron diffraction studies of flowing and pinned magnetic flux lattices in 2H-NbSe2

Metal–insulator–semiconductor tunneling microscope: two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy

Imaging of acoustic fields in bulk acoustic-wave thin-film resonators

Spatial variation of electrical properties in lateral epitaxially overgrown GaN

Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips

X-ray magnetic scattering in antiferromagnetic URu2Si2

Anisotropic temperature dependence of the magnetic-field penetration in superconducting UPt3

Neutron diffraction from the vortex lattice in the heavy-fermion superconductor UPt3

Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy

Magnetic penetration depth and flux dynamics in single-crystal Bi2Sr2CaCu2O8+ delta

Small angle neutron scattering study of the magnetic flux-line lattice in single crystal 2H-NbSe2

Low-temperature specific heat and thermal expansion in the frustrated garnet Gd3Ga5O12

Mechanical measurements of the flux lattice in the heavy-fermion superconductor UPt3

Two-level systems observed in the mechanical properties of single-crystal silicon at low temperatures

Observation of magnetic order in the heavy-fermion superconductor UBe13

Magnetic fluctuations and the superconducting transition in the heavy-fermion material UPd2Al3

Kleiman et al. reply

Structural evidence for a two-step process in the depinning of the superconducting flux-line lattice

Single‐crystal silicon high‐Q torsional oscillators

Characterization of InP using metal-insulator-semiconductor-tunneling microscopy (MISTM)

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