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Applied physics letters, 2017-06, Vol.110 (23)
2017
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Journal of the American Society for Mass Spectrometry, 2021-02, Vol.32 (2), p.509-518
2021
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Journal of the American Society for Mass Spectrometry, 2018-02, Vol.29 (2), p.360-372
- Amsden, Jason J.
- Herr, Philip J.
- Landry, David M. W.
- Kim, William
- Vyas, Raul
- Parker, Charles B.
- Kirley, Matthew P.
- Keil, Adam D.
- Gilchrist, Kristin H.
- Radauscher, Erich J.
- Hall, Stephen D.
- Carlson, James B.
- Baldasaro, Nicholas
- Stokes, David
- Di Dona, Shane T.
- Russell, Zachary E.
- Grego, Sonia
- Edwards, Steven J.
- Sperline, Roger P.
- Denton, M. Bonner
- Stoner, Brian R.
- Gehm, Michael E.
- Glass, Jeffrey T.
2018
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Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-07, Vol.38 (4)
2020
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Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-07, Vol.38 (4)
2020
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International journal of mass spectrometry, 2020-11, Vol.457 (C), p.116415, Article 116415
2020
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Journal of the American Society for Mass Spectrometry, 2020-12, Vol.32 (2)
2020
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International journal of mass spectrometry, 2020-08, Vol.457 (C)
2020
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Journal of the American Society for Mass Spectrometry, 2018-02, Vol.29 (2)
- Amsden, Jason J.
- Herr, Philip J.
- Landry, David M. W.
- Kim, William
- Vyas, Raul
- Parker, Charles B.
- Kirley, Matthew P.
- Keil, Adam D.
- Gilchrist, Kristin H.
- Radauscher, Erich J.
- Hall, Stephen D.
- Carlson, James B.
- Baldasaro, Nicholas
- Stokes, David
- Dona, Shane T. Di
- Russell, Zachary E.
- Grego, Sonia
- Edwards, Steven J.
- Sperline, Roger P.
- Denton, M. Bonner
- others, and
2018
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IEEE International Vacuum Electronics Conference, 2014, p.157-158
2014
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