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Journal of applied physics, 2000-05, Vol.87 (9), p.4425-4429
2000
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Journal of materials science, 1999-12, Vol.34 (24), p.6115-6119
1999
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Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2001-01, Vol.19 (1), p.281-285
2001
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Journal of materials science, 1999-01, Vol.34 (24), p.6115-6119
1999
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MRS proceedings, 1999, Vol.574, Article 77
1999
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2000-07, Vol.18 (4), p.1923-1928
2000
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2001-01, Vol.19 (1), p.281-285
2001
Volltextzugriff (PDF)
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2000-07, Vol.18 (4), p.1923-1928
2000
Volltextzugriff (PDF)
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- Engineering, Electrical & Electronic
- Nanoscience & Nanotechnology
- Science & Technology - Other Topics
- Barium
- Calcium
- Condensed Matter: Electronic Structure, Electrical, Magnetic, And Optical Properties
- Condensed Matter: Structure, Mechanical And Thermal Properties
- Crystallization
- Dielectric, Piezoelectric, Ferroelectric And Antiferroelectric Materials
- Dielectrics, Piezoelectrics, And Ferroelectrics And Their Properties
- Electrical Properties
- Electrical Properties Of Specific Thin Films
- Electrical Properties Of Specific Thin Films And Layer Structures
- Electrodes
Kollektion
Zeitschrift / Serie
- Journal Of Materials Science
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures
- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
- Journal Of Applied Physics
- Journal Of Vacuum Science & Technology. B, Microelectronics Processing And Phenomena
- Mrs Proceedings