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Layer resolved structural relaxation at the surface of magnetic FePt icosahedral nanoparticles

Physical review letters, 2008-01, Vol.100 (1), p.017205-017205, Article 017205

2008

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Optimal and near‐optimal filters in high‐resolution electron microscopy

Journal of microscopy (Oxford), 1998-04, Vol.190 (1‐2), p.45-51

Kilaas, R.

1998

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Quantitative measurement of displacement and strain fields from HREM micrographs

Ultramicroscopy, 1998-08, Vol.74 (3), p.131-146

1998

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3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography

Ultramicroscopy, 2008-05, Vol.108 (6), p.589-604

2008

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Surface Reconstruction with a Fractional Hole: (sqrt[5] x sqrt[5])R26.6 degrees LaAlO3 (001)

Physical review letters, 2007-02, Vol.98 (8), p.086102-086102

2007

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Nickel accumulation and nickel oxalate precipitation by Aspergillus niger

Applied microbiology and biotechnology, 2002-07, Vol.59 (2/3), p.382-388

2002

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Structure and morphology of S-phase precipitates in aluminum

Acta materialia, 1999-11, Vol.47 (15), p.3987-3997

1999

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Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution

Ultramicroscopy, 2001-11, Vol.89 (4), p.243-263

2001

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Nonlinear imaging using annular dark field TEM

Ultramicroscopy, 2005-10, Vol.104 (3), p.281-289

2005

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EDM 1.0: Electron direct methods

Ultramicroscopy, 2005-02, Vol.102 (3), p.233-237

2005

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Determination of the atomic structure of a Σ13 SrTiO3 grain boundary

Journal of materials science, 2005-06, Vol.40 (12), p.3091-3100

2005

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Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology

IEEE transactions on semiconductor manufacturing, 2006-11, Vol.19 (4), p.391-396

2006

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Quantitative analysis of strain field in thin films from HRTEM micrographs

Thin solid films, 1998-04, Vol.319 (1), p.157-162

1998

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An Interpretable Joint Nonnegative Matrix Factorization-Based Point Cloud Distance Measure

2023 57th Annual Conference on Information Sciences and Systems (CISS), 2023, p.1-6

2023

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Atomic Resolution Electron Tomography Based on Discrete Mathematics

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1566-1567

2006

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A pattern recognition technique for the analysis of grain boundary structure by HREM

Ultramicroscopy, 1996, Vol.62 (1), p.15-27

1996

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Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopy

Ultramicroscopy, 2001-06, Vol.88 (1), p.63-72

2001

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The Hero's Dilemma: Survival Advantages of Intention Perception in Virtual Agent Games

2021 IEEE Conference on Games (CoG), 2021, p.1-8

2021

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On the improved phase-grating method

Ultramicroscopy, 1986, Vol.19 (1), p.23-30

Kilaas, R.

1986

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Surface Reconstruction with a Fractional Hole: ({radical}(5)x{radical}(5))R26.6 deg. LaAlO{sub 3} (001)

Physical review letters, 2007-02, Vol.98 (8)

2007

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Surface Reconstruction with a Fractional Hole: ( 5 × 5 ) R 26.6 ° LaAlO 3 (001)

Physical review letters, 2007-02, Vol.98 (8), Article 086102

2007

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Assessment of specimen noise in HREM images of simple structures

Ultramicroscopy, 1993, Vol.50 (3), p.255-262

1993

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Study of the Structure of Ferroelectric Domain Walls in Barium Titanate Ceramics

Materials science forum, 1996-02, Vol.207-209, p.317-320

1996

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The atomic structure of growth interfaces in Y–Ba–Cu–O thin films

Journal of materials research, 1991-11, Vol.6 (11), p.2264-2271

1991

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Quantification of the modulated structures in TiPdCr alloys

Journal of microscopy (Oxford), 1995-10, Vol.180 (1), p.51-60

1995

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Layer resolved structural relaxation at the surface of magnetic FePt icosahedral nanoparticles

Optimal and near‐optimal filters in high‐resolution electron microscopy

Quantitative measurement of displacement and strain fields from HREM micrographs

3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography

Surface Reconstruction with a Fractional Hole: (sqrt[5] x sqrt[5])R26.6 degrees LaAlO3 (001)

Nickel accumulation and nickel oxalate precipitation by Aspergillus niger

Structure and morphology of S-phase precipitates in aluminum

Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution

Nonlinear imaging using annular dark field TEM

EDM 1.0: Electron direct methods

Determination of the atomic structure of a Σ13 SrTiO3 grain boundary

Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology

Quantitative analysis of strain field in thin films from HRTEM micrographs

An Interpretable Joint Nonnegative Matrix Factorization-Based Point Cloud Distance Measure

Atomic Resolution Electron Tomography Based on Discrete Mathematics

A pattern recognition technique for the analysis of grain boundary structure by HREM

Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopy

The Hero's Dilemma: Survival Advantages of Intention Perception in Virtual Agent Games

On the improved phase-grating method

Surface Reconstruction with a Fractional Hole: ({radical}(5)x{radical}(5))R26.6 deg. LaAlO{sub 3} (001)

Surface Reconstruction with a Fractional Hole: ( 5 × 5 ) R 26.6 ° LaAlO 3 (001)

Assessment of specimen noise in HREM images of simple structures

Study of the Structure of Ferroelectric Domain Walls in Barium Titanate Ceramics

The atomic structure of growth interfaces in Y–Ba–Cu–O thin films

Quantification of the modulated structures in TiPdCr alloys

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