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On the mechanisms of hydrogen-induced blistering in RF-sputtered amorphous Ge

CrystEngComm, 2017, Vol.19 (11), p.1486-1494

2017

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Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications

Solar energy, 2015-09, Vol.119, p.225-232

2015

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Design of UV-crosslinked polymeric thin layers for encapsulation of piezoelectric ZnO nanowires for pressure-based fingerprint sensors

Journal of materials chemistry. C, Materials for optical and electronic devices, 2018, Vol.6 (3), p.605-613

2018

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Evolution of the structure and hydrogen bonding configuration in annealed hydrogenated a-Si/a-Ge multilayers and layers

Applied surface science, 2013-03, Vol.269, p.12-16

2013

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Hydrogen behaviour in amorphous Si/Ge nano-structures after annealing

Applied surface science, 2013-02, Vol.267, p.30-34

2013

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Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Thin solid films, 2008-09, Vol.516 (22), p.8096-8100

2008

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Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition

Journal of applied physics, 2000-02, Vol.87 (4), p.1734-1742

2000

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Effect of nanosphere monolayer on the morphology of ZnO nanowires grown by hydrothermal method

Materials letters, 2012-07, Vol.79, p.242-244

2012

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Determination of hydrogen concentration in a-Si and a-Ge layers by elastic recoil detection analysis

Vacuum, 2012-01, Vol.86 (6), p.711-713

2012

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Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers

Thin solid films, 2011-02, Vol.519 (9), p.2806-2810

2011

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Screening effect on the phonon drag induced seebeck coefficient in bilayer graphene/quasi-two-dimensional electron gas structures

Physica scripta, 2024-07, Vol.99 (7), p.75988

2024

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Assessment of Risk for Interference by Circulating Biotin in Samples Received for High Sensitivity Troponin-T, Thyrotropin, and for Prostate Specific Antigen Testing by Immunoassays

Clinical laboratory (Heidelberg), 2020, Vol.66 (1+02/2020)

2020

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Damage accumulation in nitrogen implanted 6H-SiC: Dependence on the direction of ion incidence and on the ion fluence

Journal of applied physics, 2007-01, Vol.101 (2)

2007

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Hydrogen release in annealed hydrogenated a-Si/a-Ge multilayers

Crystal research and technology (1979), 2011-08, Vol.46 (8), p.877-880

2011

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Dielectric function of disorder in high-fluence helium-implanted silicon

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2006-12, Vol.253 (1-2), p.192-195

2006

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Biological Activity of the Endolichenic Trichoderma spp. Isolated from Lichens Cryptothecia spp. and Dirinaria spp

Microbiology (New York), 2023-06, Vol.92 (3), p.408-417

2023

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Uniform patterns based area-efficient and accurate stochastic computing finite impulse response filter

PloS one, 2021-01, Vol.16 (1), p.e0245943-e0245943

2021

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Integrated horizontal ZnO nanowires for sensor applications

2012 IEEE Sensors, 2012, p.1-4

2012

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A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopy

Journal of applied physics, 2006-11, Vol.100 (9)

2006

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Effect of pre-implanted oxygen in Si on the retention of implanted He

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2006-08, Vol.249 (1-2), p.150-152

2006

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Comparative investigation of the Si/SiO2 interface layer containing SiC crystallites using spectroscopic ellipsometry, ion beam analysis and XPS

Physica status solidi. C, 2008-05, Vol.5 (5), p.1337-1340

2008

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Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry

Physica status solidi. C, 2008-05, Vol.5 (5), p.1358-1361

2008

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Ion beam irradiated channel waveguides in Er3+-doped tellurite glass

Applied physics letters, 2007-03, Vol.90 (12)

2007

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Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Journal of non-crystalline solids, 2002-05, Vol.303 (1), p.179-184

2002

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Improved cancer biomarkers identification using network-constrained infinite latent feature selection

PloS one, 2021-02, Vol.16 (2), p.e0246668

2021

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On the mechanisms of hydrogen-induced blistering in RF-sputtered amorphous Ge

Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications

Design of UV-crosslinked polymeric thin layers for encapsulation of piezoelectric ZnO nanowires for pressure-based fingerprint sensors

Evolution of the structure and hydrogen bonding configuration in annealed hydrogenated a-Si/a-Ge multilayers and layers

Hydrogen behaviour in amorphous Si/Ge nano-structures after annealing

Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition

Effect of nanosphere monolayer on the morphology of ZnO nanowires grown by hydrothermal method

Determination of hydrogen concentration in a-Si and a-Ge layers by elastic recoil detection analysis

Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers

Screening effect on the phonon drag induced seebeck coefficient in bilayer graphene/quasi-two-dimensional electron gas structures

Assessment of Risk for Interference by Circulating Biotin in Samples Received for High Sensitivity Troponin-T, Thyrotropin, and for Prostate Specific Antigen Testing by Immunoassays

Damage accumulation in nitrogen implanted 6H-SiC: Dependence on the direction of ion incidence and on the ion fluence

Hydrogen release in annealed hydrogenated a-Si/a-Ge multilayers

Dielectric function of disorder in high-fluence helium-implanted silicon

Biological Activity of the Endolichenic Trichoderma spp. Isolated from Lichens Cryptothecia spp. and Dirinaria spp

Uniform patterns based area-efficient and accurate stochastic computing finite impulse response filter

Integrated horizontal ZnO nanowires for sensor applications

A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopy

Effect of pre-implanted oxygen in Si on the retention of implanted He

Comparative investigation of the Si/SiO2 interface layer containing SiC crystallites using spectroscopic ellipsometry, ion beam analysis and XPS

Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry

Ion beam irradiated channel waveguides in Er3+-doped tellurite glass

Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Improved cancer biomarkers identification using network-constrained infinite latent feature selection

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