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First long-term trajectory of an ocean sunfish (Mola mola L.) from the northwestern Mediterranean

Journal of fish biology, 2024-06

2024

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A novel protocol for rapid deployment of heart rate data storage tags in Atlantic bluefin tuna Thunnus thynnus reveals cardiac responses to temperature and feeding

Journal of fish biology, 2023-07

2023

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Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

Journal of electronic testing, 2020-04, Vol.36 (2), p.189-203

2020

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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Journal of electronic testing, 2023-04, Vol.39 (2), p.155-170

2023

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Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

Journal of electronic testing, 2021-04, Vol.37 (2), p.225-242

2021

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A First Step for an INL Spectral-Based BIST: The Memory Optimization

Journal of electronic testing, 2006-12, Vol.22 (4-6), p.351-357

2006

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A Simple Conditioner for Resonant Intraocular Pressure Sensor

Procedia engineering, 2016, Vol.168, p.67-70

2016

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Implementing indirect test of RF circuits without compromising test quality: a practical case study

2020 IEEE Latin-American Test Symposium (LATS), 2020, p.1-6

2020

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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2020, p.1-4

2020

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Making predictive analog/RF alternate test strategy independent of training set size

2012 IEEE International Test Conference, 2012, p.1-9

2012

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Smart selection of indirect parameters for DC-based alternate RF IC testing

2012 IEEE 30th VLSI Test Symposium (VTS), 2012, p.19-24

2012

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Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC

IET computers & digital techniques, 2007-05, Vol.1 (3), p.146-153

2007

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Toward Adaptation of ADCs to Operating Conditions through On-chip Correction

2015 IEEE Computer Society Annual Symposium on VLSI, 2015, p.634-639

2015

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A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy

2015 IEEE Computer Society Annual Symposium on VLSI, 2015, p.621-626

2015

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New implementions of predictive alternate analog/RF test with augmented model redundancy

Proceedings of the conference on Design, Automation & Test in Europe, 2014, p.1-4

2014

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A generic methodology for building efficient prediction models in the context of alternate testing

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW), 2015, p.1-6

2015

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New implementions of predictive alternate analog/RF test with augmented model redundancy

2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-4

2014

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ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

VLSI Design, 2008-01, Vol.2008 (1), p.141-148

2008

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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

Microelectronics, 2013-09, Vol.44 (9), p.840-843

2013

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Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

IEEE transactions on instrumentation and measurement, 2011-03, Vol.60 (3), p.768-775

2011

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Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

2019 IEEE Latin American Test Symposium (LATS), 2019, p.1-6

2019

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A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs

IEEE design & test of computers, 2006-05, Vol.23 (3), p.234-243

2006

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A multi-converter DFT technique for complex SIP: Concepts and validation

2009 European Conference on Circuit Theory and Design, 2009, p.747-750

2009

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Adaptive LUT-based system for in situ ADC auto-correction

2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010, p.1-6

2010

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On the Use of Redundancy to Reduce Prediction Error in Alternate Analog/RF Test

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, 2012, p.34-39

2012

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First long-term trajectory of an ocean sunfish (Mola mola L.) from the northwestern Mediterranean

A novel protocol for rapid deployment of heart rate data storage tags in Atlantic bluefin tuna Thunnus thynnus reveals cardiac responses to temperature and feeding

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

A First Step for an INL Spectral-Based BIST: The Memory Optimization

A Simple Conditioner for Resonant Intraocular Pressure Sensor

Implementing indirect test of RF circuits without compromising test quality: a practical case study

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Making predictive analog/RF alternate test strategy independent of training set size

Smart selection of indirect parameters for DC-based alternate RF IC testing

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC

Toward Adaptation of ADCs to Operating Conditions through On-chip Correction

A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy

New implementions of predictive alternate analog/RF test with augmented model redundancy

A generic methodology for building efficient prediction models in the context of alternate testing

New implementions of predictive alternate analog/RF test with augmented model redundancy

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs

A multi-converter DFT technique for complex SIP: Concepts and validation

Adaptive LUT-based system for in situ ADC auto-correction

On the Use of Redundancy to Reduce Prediction Error in Alternate Analog/RF Test

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