UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1372-1373

2008

Volltextzugriff (PDF)

New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1072-1073

2008

Volltextzugriff (PDF)

Observation of cross sectional semiconductor sample with newly developed SEI/STEM/TEM microscope

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.494-495

2003

Volltextzugriff (PDF)

A Newly Developed PC controlled 200kV FE-TEM

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.1272-1273

2003

Volltextzugriff (PDF)

Atomic Resolution Elemental Map of EELS with a Cs Corrected STEM

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1150-1151

2006

Volltextzugriff (PDF)

Development of An 0.2eV Energy Resolution Analytical Electron Microscope

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.68-69

2002

Volltextzugriff (PDF)

A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.1106-1107

2002

Volltextzugriff (PDF)

Comparative Surface Study of Atomic Images With Variable Temperature UHF-AFM and STM

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.328-329

1998

Volltextzugriff (PDF)

Observations of Superlattice Reflections Associated with Charge Ordering in Bi0.2Ca0.8MnO3 with an Energy-Filter

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.574-575

1998

Volltextzugriff (PDF)

An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy

Microscopy and microanalysis, 2007-08, Vol.13 (S02), p.1092-1093

2007

Volltextzugriff (PDF)

Compositional Characterization of an O-N-O Layer in a Dram Using FE-(S)TEM And EELS

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.150-151

1998

Volltextzugriff (PDF)

Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and EDS Elemental Mapping

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.146-147

1998

Volltextzugriff (PDF)

A New 200kv Energy Filter Field Emission Transmission Electron Microscope

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.396-397

1998

Volltextzugriff (PDF)

Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and Energy Filtered Elemental Mapping

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.148-149

1998

Volltextzugriff (PDF)

Advances and Challenges in Electron Tomography

Microscopy and microanalysis, 2007-08, Vol.13 (S02), p.1336-1337

2007

Volltextzugriff (PDF)

Energy Filtering Imaging Of Thick Biological Specimens With In-Column "Omega"-Filter Microscopes

Microscopy and microanalysis, 1998-07, Vol.4 (S2), p.394-395

1998

Volltextzugriff (PDF)

Grain boundary fracture in Al-Li alloys

Materials science and technology, 1986-12, Vol.2 (12), p.1205-1209

1986

Volltextzugriff (PDF)

Characterization of Interfacial Structure and Chemistry at Sub-Nanometre Resolution

Canadian metallurgical quarterly, 1995-07, Vol.34 (3), p.251-256

1995

Volltextzugriff (PDF)

Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.984-985

2006

Volltextzugriff (PDF)

From Macromolecules to Cells: Progress and Challenges in Mesoscale Electron Tomography

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1538-1539

2006

Volltextzugriff (PDF)

A History of ESEM in 2.5 Chapters

Microscopy and microanalysis, 2001-08, Vol.7 (S2), p.774-775

Kersker, Michael M

2001

Volltextzugriff (PDF)

Microscopy in the Real World: A Manufacturer’s Perspective

Microscopy and microanalysis, 2001-08, Vol.7 (S2), p.528-529

Kersker, Michael M

2001

Volltextzugriff (PDF)

Elemental Mapping of Materials Using Omega Filter and Imaging Plate

Microscopy and microanalysis, 2000-08, Vol.6 (S2), p.216-217

2000

Volltextzugriff (PDF)

Pre-Martensitic State in a Ti50Ni48Fe2 Alloy Studied by Electron Microscopy with Energy-Filtering

Microscopy and microanalysis, 1999-08, Vol.5 (S2), p.874-875

1999

Volltextzugriff (PDF)

Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes

Microscopy and microanalysis, 1999-05, Vol.5 (3), p.208-215

1999

Volltextzugriff (PDF)

1 – 25 von 71

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(33)
Mit Volltextzugriff
(35)

Publikationsform

Sprache

Englisch
(71)
Japanisch
(1)

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM

New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy

Observation of cross sectional semiconductor sample with newly developed SEI/STEM/TEM microscope

A Newly Developed PC controlled 200kV FE-TEM

Atomic Resolution Elemental Map of EELS with a Cs Corrected STEM

Development of An 0.2eV Energy Resolution Analytical Electron Microscope

A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis

Comparative Surface Study of Atomic Images With Variable Temperature UHF-AFM and STM

Observations of Superlattice Reflections Associated with Charge Ordering in Bi0.2Ca0.8MnO3 with an Energy-Filter

An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy

Compositional Characterization of an O-N-O Layer in a Dram Using FE-(S)TEM And EELS

Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and EDS Elemental Mapping

A New 200kv Energy Filter Field Emission Transmission Electron Microscope

Compositional Characterization of an O-N-O Layer in a Dram Using FE-TEM and Energy Filtered Elemental Mapping

Advances and Challenges in Electron Tomography

Energy Filtering Imaging Of Thick Biological Specimens With In-Column "Omega"-Filter Microscopes

Grain boundary fracture in Al-Li alloys

Characterization of Interfacial Structure and Chemistry at Sub-Nanometre Resolution

Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography

From Macromolecules to Cells: Progress and Challenges in Mesoscale Electron Tomography

A History of ESEM in 2.5 Chapters

Microscopy in the Real World: A Manufacturer’s Perspective

Elemental Mapping of Materials Using Omega Filter and Imaging Plate

Pre-Martensitic State in a Ti50Ni48Fe2 Alloy Studied by Electron Microscopy with Energy-Filtering

Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes

Suchergebnisse filtern