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IEEE transactions on instrumentation and measurement, 2001-12, Vol.50 (6), p.1485-1489
2001
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IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.106-109
2005
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IEEE design & test of computers, 2007-01, Vol.24 (1), p.72-82
2007
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IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.95-98
2003
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2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008, p.45-53
2008
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Proceedings. 21st VLSI Test Symposium, 2003, 2003, p.403-409
2003
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IEEE design & test of computers, 2003-03, Vol.20 (2), p.40-47
2003
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Physica. C, Superconductivity, 2001-02, Vol.350 (3), p.261-268
2001
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IEEE Sensors, 2005, 2005, p.4 pp.
2005
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2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, 2009, p.1-4
2009
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2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications, 2010, p.270-275
2010
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International Test Conference, 2003. Proceedings. ITC 2003, 2003, Vol.1, p.1182-1191
2003
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2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, 2009, p.729-735
2009
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Proceedings of the Twentieth International Symposium on Multiple-Valued Logic, 1990, p.286-291
1990
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2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, 2009, p.1-5
2009
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Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259), 1998, p.510-511
1998
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Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537), 2000, p.146-151
2000
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Proceedings 18th IEEE VLSI Test Symposium, 2000, p.349-355
2000
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European Test Symposium (ETS'05), 2005, p.223-228
2005
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2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008, p.1-7
2008
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Proceedings - International Test Conference, 2002, p.861-869
2002
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IEEE transactions on computer-aided design of integrated circuits and systems, 1990-06, Vol.9 (6), p.573-583
1990
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Physical review letters, 1988-04, Vol.60 (15), p.1490-1493
1988
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Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS), 1993, p.88-93
1993
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4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008, p.38-44
2008
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