UB Paderborn / Katalog / Suche / in CDI

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

VLSI Design, 2008-01, Vol.2008 (1)

2008

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Shake-off on inner-shell resonances of Ar, Kr and Xe

Journal of physics. B, Atomic and molecular physics, 1987-10, Vol.20 (19), p.5005-5022

1987

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Decay of the Xe 4d to np excitations: resonant shake-off versus shake-up and spectator transitions

Journal of physics. B, Atomic, molecular, and optical physics, 1989-03, Vol.22 (5), p.749-762

1989

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Observation of many new argon valence satellites near threshold

Physical review letters, 1988-04, Vol.60 (15), p.1490-1493

1988

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Testable design and testing of micro-electro-fluidic arrays

Proceedings. 21st VLSI Test Symposium, 2003, 2003, p.403-409

2003

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Testing of a microanalysis system

IEEE transactions on instrumentation and measurement, 2001-12, Vol.50 (6), p.1485-1489

Kerkhoff, H.G.

2001

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Structural testing of the HYPRES niobium process

IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.106-109

2005

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Defect-oriented testing of Josephson logic circuits and systems

Physica. C, Superconductivity, 2001-02, Vol.350 (3), p.261-268

2001

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Testability analysis of analog systems

IEEE transactions on computer-aided design of integrated circuits and systems, 1990-06, Vol.9 (6), p.573-583

1990

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A new test generation approach for embedded analogue cores in SoC

Proceedings - International Test Conference, 2002, p.861-869

2002

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Subshell photoionization of Xe between 40 and 1000 eV

Physical review. A, General physics, 1989-04, Vol.39 (8), p.3902-3911

1989

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The detection of defects in a niobium tri-layer process

IEEE transactions on applied superconductivity, 2003-06, Vol.13 (2), p.95-98

2003

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Near-threshold resonance enhancement of neon valence satellites studied with synchrotron radiation

Physical review letters, 1986-03, Vol.56 (11), p.1120-1123

1986

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Test structures and their application in structural testing of digital RSFQ circuits

Physica. C, Superconductivity, 2004-03, Vol.403 (1), p.103-111

2004

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On the maximization of the sustained switching activity in a processor

2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 2015, p.34-35

2015

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Monitoring active filters under automotive aging scenarios with embedded instrument

2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012, p.1096-1101

2012

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Shape-resonant and many-electron effects in the S 2p photoionization of SF6

The Journal of chemical physics, 1988-10, Vol.89 (8), p.4726-4736

1988

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An on-line soft error mitigation technique for control logic of VLIW processors

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012, p.85-91

2012

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VHDL-AMS fault simulation for testing DNA bio-sensing arrays

IEEE Sensors, 2005, 2005, p.4 pp.

2005

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Electron-ejection asymmetries by molecular orientation following K-shell excitation of CO

Physical review letters, 1986-04, Vol.56 (14), p.1455-1458

1986

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Core-level photoelectron and Auger shape-resonance phenomena in CO, CO2, CF4, and OCS

The Journal of chemical physics, 1984-03, Vol.80 (6), p.2319-2331

1984

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The Test Ability of an Adaptive Pulse Wave for ADC Testing

2010 19th IEEE Asian Test Symposium, 2010, p.289-294

2010

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Nitrogen K-shell photoemission and Auger emission from N2 and NO

The Journal of chemical physics, 1984-01, Vol.81 (12), p.5375-5378

1984

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SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011, p.374-381

2011

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An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures

Journal of electronic testing, 2002-04, Vol.18 (2), p.203

2002

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A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

Shake-off on inner-shell resonances of Ar, Kr and Xe

Decay of the Xe 4d to np excitations: resonant shake-off versus shake-up and spectator transitions

Observation of many new argon valence satellites near threshold

Testable design and testing of micro-electro-fluidic arrays

Testing of a microanalysis system

Structural testing of the HYPRES niobium process

Defect-oriented testing of Josephson logic circuits and systems

Testability analysis of analog systems

A new test generation approach for embedded analogue cores in SoC

Subshell photoionization of Xe between 40 and 1000 eV

The detection of defects in a niobium tri-layer process

Near-threshold resonance enhancement of neon valence satellites studied with synchrotron radiation

Test structures and their application in structural testing of digital RSFQ circuits

On the maximization of the sustained switching activity in a processor

Monitoring active filters under automotive aging scenarios with embedded instrument

Shape-resonant and many-electron effects in the S 2p photoionization of SF6

An on-line soft error mitigation technique for control logic of VLIW processors

VHDL-AMS fault simulation for testing DNA bio-sensing arrays

Electron-ejection asymmetries by molecular orientation following K-shell excitation of CO

Core-level photoelectron and Auger shape-resonance phenomena in CO, CO2, CF4, and OCS

The Test Ability of an Adaptive Pulse Wave for ADC Testing

Nitrogen K-shell photoemission and Auger emission from N2 and NO

SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures

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