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Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling

Microelectronics and reliability, 2003-09, Vol.43 (9), p.1537-1543

2003

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ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies

2005 IEEE International Symposium on Circuits and Systems (ISCAS), 2005, p.1194-1197 Vol. 2

2005

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Significance of the failure criterion on transmission line pulse testing

Microelectronics and reliability, 2002-06, Vol.42 (6), p.901-907

2002

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Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167), 2001, p.253-258

2001

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Influence of gate length on ESD-performance for deep submicron CMOS technology

Microelectronics and reliability, 2001-03, Vol.41 (3), p.375-383

2001

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ESD protection solutions for high voltage technologies

Microelectronics and reliability, 2006-05, Vol.46 (5), p.677-688

2006

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Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571), 2004, p.251-254

2004

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Influence of gate length on ESD-performance for deep sub micron CMOS technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396), 1999, p.95-104

1999

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Study of Secondary Electron Injection Phenomena in Deep Sub-micron MOSFETs and Flash Cells

30th European Solid-State Device Research Conference, 2000, p.144-147

2000

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Concept for body coupling in SOI MOS transistors to improve multi-finger triggering

2006 Electrical Overstress/Electrostatic Discharge Symposium, 2006, p.172-178

2006

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Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

IEEE transactions on device and materials reliability, 2005-09, Vol.5 (3), p.532-542

2005

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ESD protection solutions for high voltage technologies

2004 Electrical Overstress/Electrostatic Discharge Symposium, 2004, p.1-10

2004

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Current detection trigger scheme for SCR based ESD protection of output drivers in CMOS technologies avoiding competitive triggering

2005 Electrical Overstress/Electrostatic Discharge Symposium, 2005, p.1-7

2005

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CDM analysis on 65nm CMOS: Pitfalls when correlating results between IO test chips and product level

EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium, 2008, p.325-331

2008

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SCR based ESD protection in nanometer SOI technologies

2005 Electrical Overstress/Electrostatic Discharge Symposium, 2005, p.1-8

2005

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Contributions to standardization of Transmission Line Pulse testing methodology

2001 Electrical Overstress/Electrostatic Discharge Symposium, 2001, p.456-462

2001

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Relativistic resistive magnetohydrodynamic reconnection and plasmoid formation in merging flux tubes

Monthly notices of the Royal Astronomical Society, 2019-05, Vol.485 (1), p.299-314

2019

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Effects of ambipolar diffusion on waves in the solar chromosphere

Astronomy and astrophysics (Berlin), 2021-09, Vol.653, p.A131

2021

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Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

IEEE International Electron Devices Meeting 2003, 2003, p.21.3.1-21.3.4

2003

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Effective Resistivity in Relativistic Collisionless Reconnection

The Astrophysical journal, 2023-06, Vol.950 (2), p.169

2023

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Two-fluid implementation in MPI-AMRVAC with applications to the solar chromosphere

Astronomy and astrophysics (Berlin), 2022-08, Vol.664, p.A55

2022

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A Comprehensive Comparison of Relativistic Particle Integrators

The Astrophysical journal. Supplement series, 2018-03, Vol.235 (1), p.21

2018

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Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design

2003 Electrical Overstress/Electrostatic Discharge Symposium, 2003, p.1-9

2003

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Effects of nematic fluctuations on the elastic properties of iron arsenide superconductors

Physical review letters, 2010-10, Vol.105 (15), p.157003-157003, Article 157003

2010

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General-relativistic Resistive Magnetohydrodynamics with Robust Primitive-variable Recovery for Accretion Disk Simulations

The Astrophysical journal. Supplement series, 2019-09, Vol.244 (1), p.10

2019

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Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling

ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies

Significance of the failure criterion on transmission line pulse testing

Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

Influence of gate length on ESD-performance for deep submicron CMOS technology

ESD protection solutions for high voltage technologies

Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies

Influence of gate length on ESD-performance for deep sub micron CMOS technology

Study of Secondary Electron Injection Phenomena in Deep Sub-micron MOSFETs and Flash Cells

Concept for body coupling in SOI MOS transistors to improve multi-finger triggering

Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies

ESD protection solutions for high voltage technologies

Current detection trigger scheme for SCR based ESD protection of output drivers in CMOS technologies avoiding competitive triggering

CDM analysis on 65nm CMOS: Pitfalls when correlating results between IO test chips and product level

SCR based ESD protection in nanometer SOI technologies

Contributions to standardization of Transmission Line Pulse testing methodology

Relativistic resistive magnetohydrodynamic reconnection and plasmoid formation in merging flux tubes

Effects of ambipolar diffusion on waves in the solar chromosphere

Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides

Effective Resistivity in Relativistic Collisionless Reconnection

Two-fluid implementation in MPI-AMRVAC with applications to the solar chromosphere

A Comprehensive Comparison of Relativistic Particle Integrators

Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design

Effects of nematic fluctuations on the elastic properties of iron arsenide superconductors

General-relativistic Resistive Magnetohydrodynamics with Robust Primitive-variable Recovery for Accretion Disk Simulations

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