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The finite element method with continuity constraints for stair-step grids in geoscience

Computational geosciences, 2014-10, Vol.18 (5), p.831-850

2014

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Transient survival probability of a particle diffusing in a disordered system of perfectly absorbing spherical sinks

Physica A, 1996-05, Vol.227 (1), p.1-33

1996

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Electron spectral density in a disordered system of hard sphere scatterers

Physica A, 1995-11, Vol.220 (3), p.376-389

1995

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Finite element analysis and ray tracing modeling of petroleum migration

Marine and petroleum geology, 2000-08, Vol.17 (7), p.815-820

2000

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Utilising Poetry Dynamic Criteria Mapping (PDCM) to analyse how comparable liberal arts institutions evaluate poetry

New writing (Clevedon, England), 2020-10, Vol.17 (4), p.443-462

Kauerauf, Abigail

2020

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Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

IEEE electron device letters, 2003-02, Vol.24 (2), p.87-89

2003

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Estimated public health impact of concurrent mask mandate and vaccinate-or-test requirement in Illinois, October to December 2021

BMC public health, 2024-04, Vol.24 (1), p.1013-1013, Article 1013

2024

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Insight Into N/PBTI Mechanisms in Sub-1-nm-EOT Devices

IEEE transactions on electron devices, 2012-08, Vol.59 (8), p.2042-2048

2012

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Evaluation of Serial Testing After Exposure to COVID-19 in Early Care and Education Facilities, Illinois, March–May 2022

Public health reports (1974), 2023-07, Vol.138 (4), p.664-670

2023

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H2S origin, generation, and distribution in the Etame Marin Permit, offshore Gabon: A three-dimensional migration modeling prediction using field data

AAPG bulletin, 2022-01, Vol.106 (1), p.145-178

2022

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Channel Hot Carrier Degradation Mechanism in Long/Short Channel n-FinFETs

IEEE transactions on electron devices, 2013-12, Vol.60 (12), p.4002-4007

2013

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Deaths in Children and Adolescents Associated With COVID-19 and MIS-C in the United States

Pediatrics (Evanston), 2021-11, Vol.148 (5), p.1

2021

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Towards understanding intrinsic degradation and breakdown mechanisms in SiOCH low-k dielectrics

Journal of applied physics, 2015-02, Vol.117 (6)

2015

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Low Weibull slope of breakdown distributions in high-k layers

IEEE electron device letters, 2002-04, Vol.23 (4), p.215-217

2002

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Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area

2021 IEEE International Reliability Physics Symposium (IRPS), 2021, p.1-6

2021

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Understanding Modern History Museum Smartphone Mobile Guides and Apps

Kauerauf, Andrew

2019

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A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

Microelectronic engineering, 2013-03, Vol.103, p.144-149

2013

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A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out

IEEE transactions on electron devices, 2009-07, Vol.56 (7), p.1424-1432

2009

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Very Low Reset Current for an RRAM Device Achieved in the Oxygen-Vacancy-Controlled Regime

IEEE electron device letters, 2011-06, Vol.32 (6), p.716-718

2011

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SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues

IEEE transactions on electron devices, 2013-01, Vol.60 (1), p.405-412

2013

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Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

Semiconductor science and technology, 2014-11, Vol.29 (11)

2014

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Direct visualization and in-depth physical study of metal filament formation in percolated high- κ dielectrics

Applied physics letters, 2010-01, Vol.96 (2), p.022903-022903-3

2010

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Stress induced defect generation implications of doping HfO2 with Al

Microelectronic engineering, 2013-09, Vol.109, p.54-56

2013

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Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

Microelectronic engineering, 2010, Vol.87 (1), p.47-50

2010

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Evaluations of intrinsic time dependent dielectric breakdown of dielectric copper diffusion barriers

Thin solid films, 2011-10, Vol.520 (1), p.662-666

2011

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The finite element method with continuity constraints for stair-step grids in geoscience

Transient survival probability of a particle diffusing in a disordered system of perfectly absorbing spherical sinks

Electron spectral density in a disordered system of hard sphere scatterers

Finite element analysis and ray tracing modeling of petroleum migration

Utilising Poetry Dynamic Criteria Mapping (PDCM) to analyse how comparable liberal arts institutions evaluate poetry

Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

Estimated public health impact of concurrent mask mandate and vaccinate-or-test requirement in Illinois, October to December 2021

Insight Into N/PBTI Mechanisms in Sub-1-nm-EOT Devices

Evaluation of Serial Testing After Exposure to COVID-19 in Early Care and Education Facilities, Illinois, March–May 2022

H2S origin, generation, and distribution in the Etame Marin Permit, offshore Gabon: A three-dimensional migration modeling prediction using field data

Channel Hot Carrier Degradation Mechanism in Long/Short Channel n-FinFETs

Deaths in Children and Adolescents Associated With COVID-19 and MIS-C in the United States

Towards understanding intrinsic degradation and breakdown mechanisms in SiOCH low-k dielectrics

Low Weibull slope of breakdown distributions in high-k layers

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area

Understanding Modern History Museum Smartphone Mobile Guides and Apps

A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out

Very Low Reset Current for an RRAM Device Achieved in the Oxygen-Vacancy-Controlled Regime

SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues

Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

Direct visualization and in-depth physical study of metal filament formation in percolated high- κ dielectrics

Stress induced defect generation implications of doping HfO2 with Al

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

Evaluations of intrinsic time dependent dielectric breakdown of dielectric copper diffusion barriers

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