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Extraction of Color Information and Visualization of Color Differences between Digital Images through Pixel-by-Pixel Color-Difference Mapping

Heritage, 2022-12, Vol.5 (4), p.3923-3945

2022

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Development of Static and Dynamic Colorimetric Analysis Techniques Using Image Sensors and Novel Image Processing Software for Chemical, Biological and Medical Applications

Technologies (Basel), 2023-01, Vol.11 (1), p.23

2023

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A Novel Approach to Quantitative Characterization and Visualization of Color Fading

Technologies (Basel), 2023-08, Vol.11 (4), p.108

2023

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Image-Based Quantification of Color and Its Machine Vision and Offline Applications

Technologies (Basel), 2023-03, Vol.11 (2), p.49

2023

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Development of a tablet PC-based portable device for colorimetric determination of assays including COVID-19 and other pathogenic microorganisms

RSC advances, 2020-09, Vol.1 (54), p.32946-32952

2020

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Image-Based Quantitative Analysis of Foxing Stains on Old Printed Paper Documents

Heritage, 2019-09, Vol.2 (3), p.2665-2677

2019

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Design of Multi-Wavelength Micro Raman Spectroscopy System and Its Semiconductor Stress Depth Profiling Applications

Applied physics express, 2009-11, Vol.2 (11), p.116502

2009

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Three Dimensional Stress Mapping of Silicon Surrounded by Copper Filled through Silicon Vias Using Polychromator-Based Multi-Wavelength Micro Raman Spectroscopy

Applied physics express, 2010-08, Vol.3 (8), p.86601

2010

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Raman Characterization of Poly-Si Channel Materials for 3D Flash Memory Device Applications

ECS transactions, 2014-03, Vol.61 (3), p.55-61

2014

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Effects of Implant Temperature, Backside Contamination and Scribe Lines on Room Temperature Photoluminescence Measurements on Silicon

ECS journal of solid state science and technology, 2021-08, Vol.10 (8), p.86006

2021

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Room Temperature Photoluminescence Characterization of Silicon Wafers for In-Line Monitoring Applications

ECS transactions, 2017, Vol.80 (2), p.111-118

2017

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In-line Si1-xGex epitaxial process monitoring and diagnostics using multiwavelength high resolution micro-Raman spectroscopy

AIP advances, 2012-06, Vol.2 (2), p.022117-022117-11

2012

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Contactless monitoring of Ge content and B concentration in ultrathin single and double layer Si1-xGex epitaxial films using multiwavelength micro-Raman spectroscopy

AIP advances, 2012-03, Vol.2 (1), p.012124-012124-8

2012

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Multi-Wavelength Raman Characterization of Epitaxial Silicon Wafers for In-Line Process Characterization and Monitoring Applications

ECS transactions, 2017, Vol.77 (5), p.235-242

2017

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Temperature Dependence of Photoluminescence Spectra from Crystalline Silicon

ECS journal of solid state science and technology, 2015, Vol.4 (12), p.P456-P461

2015

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Surface Heat Treatment of Silicon Wafer Using a Xenon Arc Lamp and Its Implant Activation Applications

ECS journal of solid state science and technology, 2016-01, Vol.5 (2), p.P1-P5

2016

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Extraction of Colour Information from Digital Images Towards Cultural Heritage Characterisation Applications

SPAFA journal : a publication of the SEAMEO Regional Centre for Archaeology and Fine Arts (SPAFA), 2021-11, Vol.5

2021

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Thermal Silicidation of Ni/SiGe and Characterization of Resulting Silicide Films Using Raman Spectroscopy and X-ray Diffraction

ECS transactions, 2020-09, Vol.98 (5), p.457-464

2020

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Thermal Silicidation of Ni/SiGe and Characterization of Resulting Nickel Germanosilicides

ECS journal of solid state science and technology, 2020-12, Vol.9 (12), p.123001

2020

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Photoluminescence Characterization of Interface Quality of Bonded Silicon Wafers

ECS journal of solid state science and technology, 2016-01, Vol.5 (4), p.P3064-P3068

2016

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Estimation of the Original Location of Haechi (Haetae) Statues in Front of Gwanghwamun Gate Using Archival Photos from Early 1900s and Newly Taken Photos by Image Analysis

Journal of Conservation Science, 2021-10, Vol.37 (5), p.491-504

2021

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Direct observation of x-ray radiation-induced damage to SiO2/Si interface using multiwavelength room temperature photoluminescence

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2016-07, Vol.34 (4)

2016

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Non-Contact and Non-Destructive Characterization Alternatives of Ultra-Shallow Implanted Silicon p-n Junctions by Multi-Wavelength Raman and Photoluminescence Spectroscopy

Journal of the Electrochemical Society, 2011, Vol.158 (1), p.H80

2011

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Micro-Raman Characterization of Cluster Carbon Implanted Si before and after Rapid Thermal Annealing

ECS transactions, 2016, Vol.75 (8), p.605-613

2016

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Thermal Behavior of Large-Diameter Silicon Wafers during High-Temperature Rapid Thermal Processing in Single Wafer Furnace

Japanese Journal of Applied Physics, 2002, Vol.41 (Part 1, No. 7A), p.4442-4449

2002

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Extraction of Color Information and Visualization of Color Differences between Digital Images through Pixel-by-Pixel Color-Difference Mapping

Development of Static and Dynamic Colorimetric Analysis Techniques Using Image Sensors and Novel Image Processing Software for Chemical, Biological and Medical Applications

A Novel Approach to Quantitative Characterization and Visualization of Color Fading

Image-Based Quantification of Color and Its Machine Vision and Offline Applications

Development of a tablet PC-based portable device for colorimetric determination of assays including COVID-19 and other pathogenic microorganisms

Image-Based Quantitative Analysis of Foxing Stains on Old Printed Paper Documents

Design of Multi-Wavelength Micro Raman Spectroscopy System and Its Semiconductor Stress Depth Profiling Applications

Three Dimensional Stress Mapping of Silicon Surrounded by Copper Filled through Silicon Vias Using Polychromator-Based Multi-Wavelength Micro Raman Spectroscopy

Raman Characterization of Poly-Si Channel Materials for 3D Flash Memory Device Applications

Effects of Implant Temperature, Backside Contamination and Scribe Lines on Room Temperature Photoluminescence Measurements on Silicon

Room Temperature Photoluminescence Characterization of Silicon Wafers for In-Line Monitoring Applications

In-line Si1-xGex epitaxial process monitoring and diagnostics using multiwavelength high resolution micro-Raman spectroscopy

Contactless monitoring of Ge content and B concentration in ultrathin single and double layer Si1-xGex epitaxial films using multiwavelength micro-Raman spectroscopy

Multi-Wavelength Raman Characterization of Epitaxial Silicon Wafers for In-Line Process Characterization and Monitoring Applications

Temperature Dependence of Photoluminescence Spectra from Crystalline Silicon

Surface Heat Treatment of Silicon Wafer Using a Xenon Arc Lamp and Its Implant Activation Applications

Extraction of Colour Information from Digital Images Towards Cultural Heritage Characterisation Applications

Thermal Silicidation of Ni/SiGe and Characterization of Resulting Silicide Films Using Raman Spectroscopy and X-ray Diffraction

Thermal Silicidation of Ni/SiGe and Characterization of Resulting Nickel Germanosilicides

Photoluminescence Characterization of Interface Quality of Bonded Silicon Wafers

Estimation of the Original Location of Haechi (Haetae) Statues in Front of Gwanghwamun Gate Using Archival Photos from Early 1900s and Newly Taken Photos by Image Analysis

Direct observation of x-ray radiation-induced damage to SiO2/Si interface using multiwavelength room temperature photoluminescence

Non-Contact and Non-Destructive Characterization Alternatives of Ultra-Shallow Implanted Silicon p-n Junctions by Multi-Wavelength Raman and Photoluminescence Spectroscopy

Micro-Raman Characterization of Cluster Carbon Implanted Si before and after Rapid Thermal Annealing

Thermal Behavior of Large-Diameter Silicon Wafers during High-Temperature Rapid Thermal Processing in Single Wafer Furnace

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