Sortiert nach
Applied physics letters, 2010-12, Vol.97 (25), p.253110-253110-3
2010
Link zum Volltext
Microelectronic engineering, 2017-04, Vol.173, p.22-26
2017
Link zum Volltext
Haemophilia : the official journal of the World Federation of Hemophilia, 2016-07, Vol.22 (4), p.e322-e324
2016
Link zum Volltext
The international journal of tuberculosis and lung disease, 2017-04, Vol.21 (4), p.475
2017
Link zum Volltext
Thin solid films, 2011-02, Vol.519 (9), p.2929-2932
2011
Link zum Volltext
Applied physics letters, 2011-10, Vol.99 (15), p.151903-151903-3
2011
Link zum Volltext
Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.8-9
2018
Link zum Volltext
2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2016, p.320-323
2016
- Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.105-107
2016
- Link zum Volltext
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009, Vol.1173, p.114-121
2009
Link zum Volltext
2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.2.7.1-2.7.4
- Xie, R.
- Montanini, P.
- Akarvardar, K.
- Tripathi, N.
- Haran, B.
- Johnson, S.
- Hook, T.
- Hamieh, B.
- Corliss, D.
- Wang, J.
- Miao, X.
- Sporre, J.
- Fronheiser, J.
- Loubet, N.
- Sung, M.
- Sieg, S.
- Mochizuki, S.
- Prindle, C.
- Seo, S.
- Greene, A.
- Shearer, J.
- Labonte, A.
- Fan, S.
- Liebmann, L.
- Chao, R.
- Arceo, A.
- Chung, K.
- Cheon, K.
- Adusumilli, P.
- Amanapu, H. P.
- Bi, Z.
- Cha, J.
- Chen, H.-C
- Conti, R.
- Galatage, R.
- Gluschenkov, O.
- Kamineni, V.
- Kim, K.
- Lee, C.
- Lie, F.
- Liu, Z.
- Mehta, S.
- Miller, E.
- Niimi, H.
- Niu, C.
- Park, C.
- Park, D.
- Raymond, M.
- Sahu, B.
- Sankarapandian, M.
- Siddiqui, S.
- Southwick, R.
- Sun, L.
- Surisetty, C.
- Tsai, S.
- Whang, S.
- Xu, P.
- Xu, Y.
- Yeh, C.
- Zeitzoff, P.
- Zhang, J.
- Li, J.
- Demarest, J.
- Arnold, J.
- Canaperi, D.
- Dunn, D.
- Felix, N.
- Gupta, D.
- Jagannathan, H.
- Kanakasabapathy, S.
- Kleemeier, W.
- Labelle, C.
- Mottura, M.
- Oldiges, P.
- Skordas, S.
- Standaert, T.
- Yamashita, T.
- Colburn, M.
- Na, M.
- Paruchuri, V.
- Lian, S.
- Divakaruni, R.
- Gow, T.
- Lee, S.
- Knorr, A.
- Bu, H.
- Khare, M.
2016
- Link zum Volltext
2018 IEEE International Reliability Physics Symposium (IRPS), 2018, p.4F.1-1-4F.1-6
2018
- Link zum Volltext
Journal of applied physics, 2010-05, Vol.107 (9), p.093525-093525-8
2010
Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.40-42
2016
- Link zum Volltext
2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
- Adusumilli, P.
- Alptekin, E.
- Raymond, M.
- Breil, N.
- Chafik, F.
- Lavoie, C.
- Ferrer, D.
- Jain, S.
- Kamineni, V.
- Ozcan, A.
- Allen, S.
- An, J. J.
- Basker, V.
- Bolam, R.
- Bu, H.
- Cai, J.
- Demarest, J.
- Doris, B.
- Engbrecht, E.
- Fan, S.
- Fronheiser, J.
- Gluschenkov, O.
- Guo, D.
- Haran, B.
- Hilscher, D.
- Jagannathan, H.
- Kang, D.
- Ke, Y.
- Kim, J.
- Koswatta, S.
- Kumar, A.
- Labonte, A.
- Lallement, R.
- Lee, W.
- Lee, Y.
- Li, J.
- Lin, C.-H
- Liu, B.
- Liu, Z.
- Loubet, N.
- Makela, N.
- Mochizuki, S.
- Morgenfeld, B.
- Narasimha, S.
- Nesheiwat, T.
- Niimi, H.
- Niu, C.
- Oh, M.
- Park, C.
- Ramachandran, R.
- Rice, J.
- Sardesai, V.
- Shearer, J.
- Sheraw, C.
- Tran, C.
- Tsutsui, G.
- Utomo, H.
- Wong, K.
- Xie, R.
- Yamashita, T.
- Yan, Y.
- Yeh, C.
- Yu, M.
- Zamdmer, N.
- Zhan, N.
- Zhang, B.
- Paruchuri, V.
- Goldberg, C.
- Kleemeier, W.
- Stiffler, S.
- Divakaruni, R.
- Henson, W.
2016
Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.139-140
2016
- Link zum Volltext
2013 IEEE International Electron Devices Meeting, 2013, p.13.5.1-13.5.4
2013
- Link zum Volltext
Public health action, 2012-12, Vol.2 (4), p.157-161
2012
Link zum Volltext
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009-05, Vol.1173, p.163-167
2009
Link zum Volltext
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009-05, Vol.1173, p.168-172
2009
Link zum Volltext
IEEE 2011 International SOI Conference, 2011, p.1-2
2011
- Link zum Volltext
2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.35.4.1-35.4.4
- Wu, H.
- Gluschenkov, O.
- Tsutsui, G.
- Niu, C.
- Brew, K.
- Durfee, C.
- Prindle, C.
- Kamineni, V.
- Mochizuki, S.
- Lavoie, C.
- Nowak, E.
- Liu, Z.
- Yang, J.
- Choi, S.
- Demarest, J.
- Yu, L.
- Carr, A.
- Wang, W.
- Strane, J.
- Tsai, S.
- Liang, Y.
- Amanapu, H.
- Saraf, I.
- Ryan, K.
- Lie, F.
- Kleemeier, W.
- Choi, K.
- Cave, N.
- Yamashita, T.
- Knorr, A.
- Gupta, D.
- Haran, B.
- Guo, D.
- Bu, H.
- Khare, M.
2018
- Link zum Volltext
2017 IEEE International Interconnect Technology Conference (IITC), 2017, p.1-3
2017
- Link zum Volltext
2018 IEEE International Interconnect Technology Conference (IITC), 2018, p.36-38
2018
- Link zum Volltext
2018 IEEE International Interconnect Technology Conference (IITC), 2018, p.36-38
2018
- Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Humans
- Life Sciences & Biomedicine
- Technology
- Engineering
- Female
- Engineering, Electrical & Electronic
- Aged
- Physical Sciences
- Male
- Materials Science
- Physics
- Physics, Applied
- Colorectal Neoplasms - Diagnosis
- Materials Science, Multidisciplinary
- Middle Aged
- Aged, 80 And Over
- Cancer
- Cancer Screening
- Colorectal Cancer
Kollektion
- EZB Electronic Journals Library
- IngentaConnect
- MEDLINE
- IEEE Xplore
- Journals@Ovid Ovid Full Text
- NUS Single-Journal Subscriptions
- Wiley-Blackwell Journals
- IngentaConnect Journals
- Wiley Online Library Full Collection 2018
- AIP Scitation Journals Complete
- Access via ScienceDirect (Elsevier)
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- Oxford journals
- Oxford Journals 2020 Medicine
- SpringerLink_现刊
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- Ebook Central Perpetual and DDA
- Springer Nature - Connect here FIRST to enable access
- Cambridge Journals Online (DEFF)
- ACM Digital Library
Zeitschrift / Serie
- Cancer Epidemiology, Biomarkers & Prevention
- Clinical Medicine & Research
- 2009 International Conference On Frontiers Of Characterization And Metrology For Nanoelectronics
- American Journal Of Epidemiology
- Annals Of Internal Medicine
- Applied Physics Letters
- Egems
- Geophysical Research Letters
- Hpb
- International Journal Of Advanced Research
Neu hinzugefügt