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Extraction of recoverable and permanent trapped charge resulting from negative bias temperature instability

Physica status solidi. C, 2013-02, Vol.10 (2), p.259-262

2013

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Similarities between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

ECS transactions, 2013, Vol.58 (7), p.49-54

2013

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A Physics-Based Device Model of Transient Neutron Damage in Bipolar Junction Transistors

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3305-3313

2010

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Tunneling discharge of positive trapped oxide charge in p-channel field effect transistors

Applied physics letters, 2011-08, Vol.99 (8), p.083506-083506-3

2011

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Steady-state properties of lock-on current filaments in GaAs

IEEE transactions on plasma science, 2000-10, Vol.28 (5), p.1497-1499

2000

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A theory of low-field, high-carrier-density breakdown in semiconductors

Physics of Semiconductors; Part B, 2005, Vol.772, p.1269-1270

2005

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Modeling of the X-irradiation Response of the Carrier Relaxation Time in P3HT:PCBM Organic-Based Photocells

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2902-2908

2012

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Dependence of the Multi-Component Nature of Bias Temperature Instability in MOSFETs on Oxide and Device Type

ECS transactions, 2014, Vol.61 (2), p.203-209

2014

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Measurement and Identification of Three Contributing Charge Terms in Negative Bias Temperature Instability

ECS transactions, 2013-03, Vol.50 (4), p.223-232

2013

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High Temperature Annealing of the Interface State Component of Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

ECS transactions, 2013, Vol.58 (7), p.9-16

2013

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Comparison of NTBI and irradiation induced interface states

2013 IEEE International Integrated Reliability Workshop Final Report, 2013, p.157-160

2013

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On the nature of "permanent" degradation in NBTI

2013 IEEE International Integrated Reliability Workshop Final Report, 2013, p.150-153

2013

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Comparison of duty-cycle effects at room temperature in SiON and HfO2 gate PMOS FETS

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW), 2014, p.143-146

2014

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Dynamic Negative Bias Stress Instability Effects in Hafnium Silicon Oxynitride and Silicon Dioxide

ECS transactions, 2011, Vol.35 (4), p.447-459

2011

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Measurement and modeling of duty-cycle effects due to NBTI

2012 IEEE International Integrated Reliability Workshop Final Report, 2012, p.136-139

2012

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A collective theory of lock-on in photoconductive semiconductor switches

Digest of Technical Papers. PPC-2003. 14th IEEE International Pulsed Power Conference (IEEE Cat. No.03CH37472), 2003, Vol.1, p.345-348 Vol.1

2003

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Small-bipolaron hopping conductivity in chalcogenide glasses

Physical review. B, Condensed matter, 1994-10, Vol.50 (16), p.11556-11563

1994

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Continuum models for electrical breakdown in photoconductive semiconductor switches

2007 16th IEEE International Pulsed Power Conference, 2007, Vol.1, p.446-450

2007

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Simulation of Current Filaments in Photoconductive Semiconductor Switches

2005 IEEE Pulsed Power Conference, 2005, p.814-817

2005

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Steady state properties of lock-on current filaments in GaAs [pulsed power switches]

Digest of Technical Papers. 12th IEEE International Pulsed Power Conference. (Cat. No.99CH36358), 1999, Vol.2, p.791-794 vol.2

1999

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A collective impact ionization theory of lock-on [in pulsed power switches]

Digest of Technical Papers. 12th IEEE International Pulsed Power Conference. (Cat. No.99CH36358), 1999, Vol.1, p.299-302 vol.1

1999

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Theory of optically-triggered electrical breakdown of semiconductors

2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2003, p.345-348

2003

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Generations learning together: pilot study for a multigenerational program

Journal of Intergenerational relationships, 2018-07, Vol.16 (3), p.243-255

2018

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Estimation in partially linear models

Computational statistics & data analysis, 1998-11, Vol.29 (1), p.27-34

1998

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Glass transition and dynamics of phosphate esters dissolved in two glassy polymer matrices

Macromolecules, 1991-03, Vol.24 (2), p.403-409

1991

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Extraction of recoverable and permanent trapped charge resulting from negative bias temperature instability

Similarities between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

A Physics-Based Device Model of Transient Neutron Damage in Bipolar Junction Transistors

Tunneling discharge of positive trapped oxide charge in p-channel field effect transistors

Steady-state properties of lock-on current filaments in GaAs

A theory of low-field, high-carrier-density breakdown in semiconductors

Modeling of the X-irradiation Response of the Carrier Relaxation Time in P3HT:PCBM Organic-Based Photocells

Dependence of the Multi-Component Nature of Bias Temperature Instability in MOSFETs on Oxide and Device Type

Measurement and Identification of Three Contributing Charge Terms in Negative Bias Temperature Instability

High Temperature Annealing of the Interface State Component of Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

Comparison of NTBI and irradiation induced interface states

On the nature of "permanent" degradation in NBTI

Comparison of duty-cycle effects at room temperature in SiON and HfO2 gate PMOS FETS

Dynamic Negative Bias Stress Instability Effects in Hafnium Silicon Oxynitride and Silicon Dioxide

Measurement and modeling of duty-cycle effects due to NBTI

A collective theory of lock-on in photoconductive semiconductor switches

Small-bipolaron hopping conductivity in chalcogenide glasses

Continuum models for electrical breakdown in photoconductive semiconductor switches

Simulation of Current Filaments in Photoconductive Semiconductor Switches

Steady state properties of lock-on current filaments in GaAs [pulsed power switches]

A collective impact ionization theory of lock-on [in pulsed power switches]

Theory of optically-triggered electrical breakdown of semiconductors

Generations learning together: pilot study for a multigenerational program

Estimation in partially linear models

Glass transition and dynamics of phosphate esters dissolved in two glassy polymer matrices

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