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Journal of applied physics, 2001-09, Vol.90 (6), p.2703-2710
2001
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Journal of applied physics, 2005-09, Vol.98 (5)
2005
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IEEE transactions on electron devices, 2007-12, Vol.54 (12), p.3267-3275
2007
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Microelectronic engineering, 2007-09, Vol.84 (9), p.2196-2200
2007
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2014 IEEE International Reliability Physics Symposium, 2014, p.3B.1.1-3B.1.8
2014
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Journal of applied physics, 2005-09, Vol.98 (5), p.054104-054104-8
2005
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Journal of applied physics, 2007-10, Vol.102 (7)
2007
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2008 Symposium on VLSI Technology, 2008, p.88-89
- Chen, X.
- Samavedam, S.
- Narayanan, V.
- Stein, K.
- Hobbs, C.
- Baiocco, C.
- Li, W.
- Jaeger, D.
- Zaleski, M.
- Yang, H.S.
- Kim, N.
- Lee, Y.
- Zhang, D.
- Kang, L.
- Chen, J.
- Zhuang, H.
- Sheikh, A.
- Wallner, J.
- Aquilino, M.
- Han, J.
- Jin, Z.
- Li, J.
- Massey, G.
- Kalpat, S.
- Jha, R.
- Moumen, N.
- Mo, R.
- Kirshnan, S.
- Wang, X.
- Chudzik, M.
- Chowdhury, M.
- Nair, D.
- Reddy, C.
- Teh, Y.W.
- Kothandaraman, C.
- Coolbaugh, D.
- Pandey, S.
- Tekleab, D.
- Thean, A.
- Sherony, M.
- Lage, C.
- Sudijono, J.
- Lindsay, R.
- Ku, J.H.
- Khare, M.
- Steegen, A.
2008
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2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005, 2005, p.129-133
2005
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Journal of applied physics, 2007-10, Vol.102 (7), p.074511-074511-5
2007
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IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, 2004, p.287-290
2004
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2010 IEEE International Integrated Reliability Workshop Final Report, 2010, p.22-22
2010
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2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573), 2004, p.187-189
2004
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Microelectronic engineering, 2003-09, Vol.69 (2), p.190-194
2003
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Journal of applied physics, 2005-09, Vol.98 (5)
2005
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Japanese Journal of Applied Physics, 2001, Vol.40 (2R), p.713-717
2001
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2006 IEEE International Integrated Reliability Workshop Final Report, 2006, p.116-119
2006
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2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.578-579
2007
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Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004, 2004, p.106-107
2004
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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866), 2004, p.237-243
- Bich-Yen Nguyen
- Thean, A.
- White, T.
- Vandooren, A.
- Sadaka, M.
- Mathew, L.
- Barr, A.
- Thomas, S.
- Zalava, M.
- Da Zhang
- Eades, D.
- Zhong-Hai Shi
- Schaeffer, J.
- Triyoso, D.
- Samavedam, S.
- Vartanian, V.
- Stephen, T.
- Goolsby, B.
- Zollner, S.
- Liu, R.
- Noble, R.
- Thien Nguyen
- Dhandapani, V.
- Xie, B.
- Xang-Dong Wang
- Jiang, J.
- Rai, R.
- Sadd, M.
- Ramon, M.
- Kalpat, S.
- Prabhu, L.
- Kaushik, V.
- Du, Y.
- Dao, T.
- Mendicino, M.
- Orlowski, M.
- Tobin, P.
- Mogab, J.
- Venkatesan, S.
2004
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Ferroelectrics, 1999-06, Vol.232 (1), p.191-195
1999
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2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.665-666
2006
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MRS proceedings, 1999, Vol.604, Article 3
1999
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2006 IEEE International Conference on IC Design and Technology, 2006, p.1-4
2006
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IEEE transactions on device and materials reliability, 2005-03, Vol.5 (1), p.26-35
2005
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- Japanese Journal Of Applied Physics
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