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Environmental gas impact on the emission volume of X-rays near the interface in the variable pressure scanning electron microscopy

Ultramicroscopy, 2020-03, Vol.210, p.112920-112920, Article 112920

2020

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Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy

Ultramicroscopy, 2018-01, Vol.184 (Pt A), p.17-23

2018

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Monte Carlo simulation of the electron beam scattering under water vapor environment at low energy

Vacuum, 2013-01, Vol.87, p.11-15

2013

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Theoretical modelling of the I– V characteristics of p-type silicon in fluoride electrolyte in the first electropolishing plateau

Electrochimica acta, 2009-04, Vol.54 (11), p.3053-3058

2009

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LaBi under high pressure and high temperature: A first-principle study

Physica. B, Condensed matter, 2008-12, Vol.403 (23), p.4305-4308

2008

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Effect of the Electrode Geometry on the Diffusion-Current Problem of the Rotating Porous Silicon Electrode in HF Solution

Materials science forum, 2009-01, Vol.609, p.149-154

2009

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Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy

Ultramicroscopy, 2018-01, Vol.184, p.17-23

2018

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Comparative study of electron beam–gas interaction in an SEM operating at pressures up to 300 Pa

Vacuum, 2003-01, Vol.69 (4), p.537-543

2003

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The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope

Micron (Oxford, England : 1993), 2004-01, Vol.35 (7), p.543-547

2004

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Electron distribution on a tilted sample in the high pressure SEM

Micron (Oxford, England : 1993), 2005-01, Vol.36 (4), p.345-350

2005

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Compared rapid thermal annealing procedures of InP

Materials science & engineering. B, Solid-state materials for advanced technology, 2002-03, Vol.90 (1), p.110-113

2002

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Gaseous Cascade Amplification in He-H2O Gas Mixture in an Environmental Scanning Electron Microscope

Energy procedia, 2015, Vol.74, p.205-210

2015

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Study of Point Defect Distributions in Tantalum

Acta physica Polonica, A, 2018-01, Vol.133 (1), p.39-44

2018

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Computation and Experiments on the Beam Spread in the VP-SEM: Application to X-Ray Microanalysis

Journal of trace and microprobe techniques, 2003-01, Vol.21 (2), p.229-238

2003

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Theoretical Study on the Origins of the Gap Bowing in Mg sub(x)Zn sub(1-x)O Alloys

Modeling and Numerical Simulation of Material Science (Irvine, CA), 2012-07, Vol.2 (3), p.60-66

2012

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Theoretical Study on the Origins of the Gap Bowing in Mg x Zn 1–x O Alloys

Modeling and Numerical Simulation of Material Science (Irvine, CA), 2012, Vol.2 (3), p.60-66

2012

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Carrier compensation induced by rapid thermal annealing in undoped InP

Journal of applied physics, 1994-01, Vol.75 (1), p.648-650

1994

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A new encapsulation method of InP during post implantation annealing

Applied surface science, 1993-05, Vol.69 (1), p.407-411

1993

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Comparative study of electron beam–gas interaction in an SEM operating at pressures up to 300Pa

Vacuum, 2003-01, Vol.69 (4), p.537-543

2003

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Kinematic viscosity of AsxSe1-x glass forming liquids

Journal of non-crystalline solids, 1983-08, Vol.57 (1), p.101-108

1983

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Anomalous viscosity of CsxCsI1-x molten alloys in the metallic composition range

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1985-11, Vol.52 (5), p.643-656

1985

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Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InP

Materials science & engineering. B, Solid-state materials for advanced technology, 1995, Vol.33 (2), p.188-191

1995

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Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InPeng

Materials science & engineering. B, Solid-state materials for advanced technology, 1995, Vol.33 (2-3), p.188-191

1995

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Effect of rapid thermal annealing on electrical properties of capped InP for MISFET device application

1993 (5th) International Conference on Indium Phosphide and Related Materials, 1993, p.329-332

1993

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Kinematic viscosity of As xSe 1− x glass forming liquids

Journal of non-crystalline solids, 1983, Vol.57 (1), p.101-108

1983

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Environmental gas impact on the emission volume of X-rays near the interface in the variable pressure scanning electron microscopy

Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy

Monte Carlo simulation of the electron beam scattering under water vapor environment at low energy

Theoretical modelling of the I– V characteristics of p-type silicon in fluoride electrolyte in the first electropolishing plateau

LaBi under high pressure and high temperature: A first-principle study

Effect of the Electrode Geometry on the Diffusion-Current Problem of the Rotating Porous Silicon Electrode in HF Solution

Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy

Comparative study of electron beam–gas interaction in an SEM operating at pressures up to 300 Pa

The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope

Electron distribution on a tilted sample in the high pressure SEM

Compared rapid thermal annealing procedures of InP

Gaseous Cascade Amplification in He-H2O Gas Mixture in an Environmental Scanning Electron Microscope

Study of Point Defect Distributions in Tantalum

Computation and Experiments on the Beam Spread in the VP-SEM: Application to X-Ray Microanalysis

Theoretical Study on the Origins of the Gap Bowing in Mg sub(x)Zn sub(1-x)O Alloys

Theoretical Study on the Origins of the Gap Bowing in Mg x Zn 1–x O Alloys

Carrier compensation induced by rapid thermal annealing in undoped InP

A new encapsulation method of InP during post implantation annealing

Comparative study of electron beam–gas interaction in an SEM operating at pressures up to 300Pa

Kinematic viscosity of AsxSe1-x glass forming liquids

Anomalous viscosity of CsxCsI1-x molten alloys in the metallic composition range

Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InP

Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InPeng

Effect of rapid thermal annealing on electrical properties of capped InP for MISFET device application

Kinematic viscosity of As xSe 1− x glass forming liquids

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