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Switching and Heat-dissipation Performance Analysis of an LTCC-based Leadless Surface Mount Package

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2022, 22(1), 103, pp.1-9

2022

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A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

IEEE transactions on electron devices, 2014-08, Vol.61 (8), p.2619-2627

2014

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Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

IEEE journal of the Electron Devices Society, 2018-01, Vol.6, p.808-814

2018

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Novel source follower transistor structure without lightly doped drain for high performance CMOS image sensor

Japanese Journal of Applied Physics, 2016-08, Vol.55 (8S2), p.8-08PD02

2016

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Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor

IEEE electron device letters, 2013-02, Vol.34 (2), p.190-192

2013

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Effect of fluorine implantation on recovery characteristics of p-channel MOSFET after negative bias temperature instability stress

Japanese Journal of Applied Physics, 2014-08, Vol.53 (8S1), p.8-1-08LA03-4

2014

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Identification of Interface States and Shallow and Deep Hole Traps under NBTI Stress using Fast, Normal, and Charge-pumping Measurement Techniques

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2018, 18(2), 80, pp.160-166

2018

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Analysis of Anomalously Large RTS Noise Amplitudes in Tunneling Field-effect Transistors

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2018, 18(2), 80, pp.193-199

2018

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Methodology for Extracting Trap Depth using Statistical RTS Noise Data of Capture and Emission Time Constant

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2017, 17(2), 74, pp.252-259

2017

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A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

IEEE transactions on semiconductor manufacturing, 2012-11, Vol.25 (4), p.549-554

2012

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Characterization of Dielectric Relaxation and Reliability of High-k MIM Capacitor Under Constant Voltage Stress

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2014, 14(5), 59, pp.543-548

2014

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Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

IEICE transactions on electronics, 2013, Vol.E96.C (5), p.624-629

2013

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Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2015, 15(2), 62, pp.312-317

2015

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Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors

Solid-state electronics, 2016-05, Vol.119, p.29-32

2016

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Novel PNP BJT Structure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications

IEICE transactions on electronics, 2013, Vol.E96.C (5), p.663-668

2013

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Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2013, 13(6), 54, pp.655-661

2013

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A novel BJT structure for high- performance analog circuit applications

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013, p.104-107

2013

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A Study of Dielectric Relaxation and Capacitance Matching of // MIM Capacitors

IEEE electron device letters, 2013-10, Vol.34 (10), p.1223-1225

2013

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Novel test structures for extracting interface state density of advanced CMOSFETs using optical charge pumping

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2018, p.13-15

2018

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Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology

Proceedings of the 2015 International Conference on Microelectronic Test Structures, 2015, p.33-36

2015

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Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Japanese Journal of Applied Physics, 2011-10, Vol.50 (10), p.10PB03-10PB03-4

2011

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Methodology for Extracting Trap Depth using Statistical RTS Noise Data of Capture and Emission Time Constant

Journal of semiconductor technology and science, 2017, Vol.17 (2), p.252-259

2017

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Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks

Journal of nanoscience and nanotechnology, 2019-10, Vol.19 (10), p.6131-6134

2019

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Gate Voltage Dependence of Low Frequency Noise in Tunneling Field Effect Transistors

Journal of nanoscience and nanotechnology, 2019-10, Vol.19 (10), p.6083-6086

2019

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Low frequency noise of silicon based tunneling field effect transistors

2018 International Conference on Electronics, Information, and Communication (ICEIC), 2018, p.1-2

2018

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Switching and Heat-dissipation Performance Analysis of an LTCC-based Leadless Surface Mount Package

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

Novel source follower transistor structure without lightly doped drain for high performance CMOS image sensor

Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor

Effect of fluorine implantation on recovery characteristics of p-channel MOSFET after negative bias temperature instability stress

Identification of Interface States and Shallow and Deep Hole Traps under NBTI Stress using Fast, Normal, and Charge-pumping Measurement Techniques

Analysis of Anomalously Large RTS Noise Amplitudes in Tunneling Field-effect Transistors

Methodology for Extracting Trap Depth using Statistical RTS Noise Data of Capture and Emission Time Constant

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Characterization of Dielectric Relaxation and Reliability of High-k MIM Capacitor Under Constant Voltage Stress

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology

Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors

Novel PNP BJT Structure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications

Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions

A novel BJT structure for high- performance analog circuit applications

A Study of Dielectric Relaxation and Capacitance Matching of // MIM Capacitors

Novel test structures for extracting interface state density of advanced CMOSFETs using optical charge pumping

Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology

Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Methodology for Extracting Trap Depth using Statistical RTS Noise Data of Capture and Emission Time Constant

Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks

Gate Voltage Dependence of Low Frequency Noise in Tunneling Field Effect Transistors

Low frequency noise of silicon based tunneling field effect transistors

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