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Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event Burnout

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3343-3348

2006

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Single-Event Burnout of Silicon Carbide Schottky Barrier Diodes Caused by High Energy Protons

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2379-2383

2007

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Heavy ion-induced damage in SiC Schottky barrier diode

Physica. B, Condensed matter, 2006-04, Vol.376, p.362-366

2006

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Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Physica. B, Condensed matter, 2006-04, Vol.376, p.382-384

2006

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Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Applied surface science, 2004-10, Vol.237 (1-4), p.607-611

2004

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Interface study of transition metal (Fe, Zr) on 4H–SiC(0 0 0 1)Si face: photoemission electron microscopy and soft X-ray fluorescence spectroscopy

Applied surface science, 2005-08, Vol.249 (1), p.362-366

2005

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Radiation damage of SiC Schottky diodes by electron irradiation

Journal of materials science. Materials in electronics, 2005-07, Vol.16 (7), p.455-458

2005

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Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

Thin solid films, 2004-10, Vol.464 (Complete), p.107-111

2004

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Degradation of SiC-MESFETs by irradiation

Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.175-178

2008

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Effects of radiation-induced defects on device performance in electron-irradiated SiC-MESFETs

Materials science in semiconductor processing, 2006-02, Vol.9 (1), p.327-330

2006

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Interface Electronic Structures of Transition Metal(Cr, Fe) on 6H(4H)-SiC(0001)Si Face by Soft X-Ray Fluorescence Spectroscopy

Materials science forum, 2004-01, Vol.457-460, p.427-430

2004

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Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

Applied surface science, 2002-05, Vol.190 (1), p.521-526

2002

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Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy

Applied surface science, 2003-06, Vol.216 (1), p.187-191

2003

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Radiation source dependence of device performance degradation for 4H-SiC MESFETs

Superlattices and microstructures, 2006-10, Vol.40 (4), p.632-637

2006

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Heavy ion-induced damage in SiC Schottky barrier diode

Physica. B, Condensed matter, 2006, Vol.376-77, p.362-366

2006

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Photoemission electron imaging of transition metal (Ti,Ni) surfaces on Si and SiC

Materials science forum, 2001-10, Vol.389-393 (1), p.721-724

2001

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Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

Applied surface science, 2001-06, Vol.190 (1-4), p.521-526

2001

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Photoemission Electron Imaging of Transition Metal (Ti, Ni) Surfaces on Si and SiC

Materials science forum, 2002-04, Vol.389-393, p.721-724

2002

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Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Physica. B, Condensed matter, 2006, Vol.376-77, p.382-384

2006

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Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

Thin solid films, 2004, Vol.464-65, p.107-111

2004

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PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM

Surface review and letters, 2002-02, Vol.9 (1), p.313-318

2002

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Mechanical Response Evaluation of High-Thermally-Stable-Grade Parylene Spring

2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems, 2009, p.615-618

2009

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Comparative Measure of the Electronic Influence of Highly Substituted Aryl Isocyanides

Inorganic chemistry, 2015-03, Vol.54 (6), p.2936-2944

2015

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Pulmonary vein dilation in patients with atrial fibrillation: detection by magnetic resonance imaging

Journal of cardiovascular electrophysiology, 2001-11, Vol.12 (11), p.1333-1334

2001

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Prevention of stomatitis in patients with acute myelogenous leukemia using PVP-iodine (Isodine) gargle

Gan to kagaku ryoho, 1992-06, Vol.19 (6), p.817

1992

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Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event Burnout

Single-Event Burnout of Silicon Carbide Schottky Barrier Diodes Caused by High Energy Protons

Heavy ion-induced damage in SiC Schottky barrier diode

Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Interface study of transition metal (Fe, Zr) on 4H–SiC(0 0 0 1)Si face: photoemission electron microscopy and soft X-ray fluorescence spectroscopy

Radiation damage of SiC Schottky diodes by electron irradiation

Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

Degradation of SiC-MESFETs by irradiation

Effects of radiation-induced defects on device performance in electron-irradiated SiC-MESFETs

Interface Electronic Structures of Transition Metal(Cr, Fe) on 6H(4H)-SiC(0001)Si Face by Soft X-Ray Fluorescence Spectroscopy

Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

Nano-structure of transition-metal (Ti, Ni)/SiC system: photo-emission electron microscopy and soft X-ray fluorescence spectroscopy

Radiation source dependence of device performance degradation for 4H-SiC MESFETs

Heavy ion-induced damage in SiC Schottky barrier diode

Photoemission electron imaging of transition metal (Ti,Ni) surfaces on Si and SiC

Surface and interface of Ti(film)/SiC(substrate) system: a soft X-ray emission and photoemission electron microscopy study

Photoemission Electron Imaging of Transition Metal (Ti, Ni) Surfaces on Si and SiC

Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Solid phase reaction in Ti(thin film)/Si(substrate) with Mo interlayer: SXES and PEEM study

PEEM AND SXES CHARACTERIZATION ON THE SURFACE AND INTERFACE OF THE TRANSITION-METAL/SiC SYSTEM

Mechanical Response Evaluation of High-Thermally-Stable-Grade Parylene Spring

Comparative Measure of the Electronic Influence of Highly Substituted Aryl Isocyanides

Pulmonary vein dilation in patients with atrial fibrillation: detection by magnetic resonance imaging

Prevention of stomatitis in patients with acute myelogenous leukemia using PVP-iodine (Isodine) gargle

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