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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films

Journal of alloys and compounds, 2014-10, Vol.611, p.149-156

2014

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Evaluation of Thermal Stability for CMOS Gate Metal Materials

Journal of the Electrochemical Society, 2004, Vol.151 (12), p.F283

2004

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Effects of alloying elements on cobalt silicide formation

Journal of electronic materials, 2002-06, Vol.31 (6), p.597-609

2002

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Synchrotron X-ray scattering techniques for microelectronics-related materials studies

IBM journal of research and development, 2000-07, Vol.44 (4), p.457-476

Jordan-Sweet, J. L.

2000

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Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

Applied physics letters, 2009-01, Vol.94 (3)

2009

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Formation and morphological stability of NiSi in the presence of W , Ti ,and Ta alloying elements

Journal of applied physics, 2007-02, Vol.101 (4), p.044508-044508-8

2007

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Orthorhombic distortion at the superconducting transition in YBa2Cu3O7: evidence for anisotropic pairing

Physical review letters, 1987-12, Vol.59 (24), p.2772-2775

1987

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In situ X-ray diffraction study of thin film Ir/Si solid state reactions

Microelectronic engineering, 2010-03, Vol.87 (3), p.258-262

2010

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N-channel MOSFETs fabricated on He-implanted and annealed SiGe buffer layers

Solid-state electronics, 2005-10, Vol.49 (10), p.1669-1673

2005

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Effect of Pt addition on growth stress and thermal stress of NiSi films

Journal of applied physics, 2008-09, Vol.104 (5), p.053510-053510-7

2008

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In situ study of the formation of silicide phases in amorphous Co–Si mixed layers

Microelectronic engineering, 2010-03, Vol.87 (3), p.282-285

2010

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X-ray scattering study of the thermal roughening of Ag(110)

Physical review letters, 1987-11, Vol.59 (18), p.2075-2078

1987

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Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction

Applied physics letters, 1999-02, Vol.74 (5), p.726-728

1999

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Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics

Review of scientific instruments, 2000-05, Vol.71 (5), p.1991-2000

2000

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Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces

Applied physics letters, 2001-10, Vol.79 (15), p.2363-2365

2001

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Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines

Applied physics letters, 2000-06, Vol.76 (25), p.3726-3728

2000

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Effect of Surface-Influenced Order on Thermal Expansivity of Polymer Thin Films

Langmuir, 1997-12, Vol.13 (26), p.7135-7140

1997

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Small-angle x-ray-scattering study of ordering kinetics in a block copolymer

Physical review letters, 1990-05, Vol.64 (19), p.2285-2288

1990

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Polymer/metal interfaces studied by carbon near-edge x-ray absorption fine structure spectroscopy

The Journal of chemical physics, 1988-08, Vol.89 (4), p.2482-2489

1988

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Phase Formation Sequence of Nickel Silicides from Rapid Thermal Annealing of Ni on 4H-SiC

Materials science forum, 1998-01, Vol.264-268, p.799-804

1998

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Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices

Applied physics letters, 1995-10, Vol.67 (16), p.2373-2375

1995

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Interdiffusion studies of single crystal TiN/NbN superlattice thin films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1999-09, Vol.17 (5), p.2920-2927

1999

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Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction

Physical review letters, 2002-04, Vol.88 (15), p.156101-156101

2002

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Nucleated and continuous ordering in Cu3Au

Physical review letters, 1988-10, Vol.61 (16), p.1859-1862

1988

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Irreversible altering of crystalline phase of phase-change Ge-Sb thin films

Applied physics letters, 2010-03, Vol.96 (12), p.121906-121906-3

2010

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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films

Evaluation of Thermal Stability for CMOS Gate Metal Materials

Effects of alloying elements on cobalt silicide formation

Synchrotron X-ray scattering techniques for microelectronics-related materials studies

Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

Formation and morphological stability of NiSi in the presence of W , Ti ,and Ta alloying elements

Orthorhombic distortion at the superconducting transition in YBa2Cu3O7: evidence for anisotropic pairing

In situ X-ray diffraction study of thin film Ir/Si solid state reactions

N-channel MOSFETs fabricated on He-implanted and annealed SiGe buffer layers

Effect of Pt addition on growth stress and thermal stress of NiSi films

In situ study of the formation of silicide phases in amorphous Co–Si mixed layers

X-ray scattering study of the thermal roughening of Ag(110)

Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction

Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics

Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces

Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines

Effect of Surface-Influenced Order on Thermal Expansivity of Polymer Thin Films

Small-angle x-ray-scattering study of ordering kinetics in a block copolymer

Polymer/metal interfaces studied by carbon near-edge x-ray absorption fine structure spectroscopy

Phase Formation Sequence of Nickel Silicides from Rapid Thermal Annealing of Ni on 4H-SiC

Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices

Interdiffusion studies of single crystal TiN/NbN superlattice thin films

Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction

Nucleated and continuous ordering in Cu3Au

Irreversible altering of crystalline phase of phase-change Ge-Sb thin films

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