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Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry

Solar energy materials and solar cells, 2003-07, Vol.78 (1), p.143-180

2003

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Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films

Physical review. B, Condensed matter, 2000-04, Vol.61 (16), p.10832-10844

2000

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Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films

Journal of the Optical Society of America. A, Optics, image science, and vision, 1999-08, Vol.16 (8), p.1997

1999

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Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane

Applied physics letters, 1999-10, Vol.75 (15), p.2286-2288

1999

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Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films

Review of scientific instruments, 2001-03, Vol.72 (3), p.1742-1754

2001

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Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films

Applied physics letters, 1996-08, Vol.69 (9), p.1297-1299

1996

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Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry

Applied surface science, 2000-02, Vol.154, p.217-228

2000

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Observation of temporal vector soliton propagation and collision in birefringent fiber

Physical review letters, 2007-02, Vol.98 (5), p.053902-053902, Article 053902

2007

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Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry

Thin solid films, 2000-03, Vol.364 (1-2), p.129-137

2000

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Effects of bending on the performance of hole-assisted single polarization fibers

Optics express, 2007-08, Vol.15 (17), p.10629-10636

2007

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Evolutionary phase diagrams for the deposition of silicon films from hydrogen-diluted silane

Journal of non-crystalline solids, 2000-05, Vol.266, p.43-47

2000

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Wide band single polarization and polarization maintaining fibers using stress rods and air holes

Optics express, 2008-08, Vol.16 (16), p.12060-12068

2008

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Real time spectroscopic ellipsometry for characterization and optimization of amorphous silicon-based solar cell structures

Thin solid films, 1998-02, Vol.313 (1-2), p.469-473

1998

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Optics of textured amorphous silicon surfaces

Journal of non-crystalline solids, 2000-05, Vol.266, p.279-283

2000

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Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells

Applied physics letters, 1999-06, Vol.74 (24), p.3687-3689

1999

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Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry

Applied physics letters, 1998-09, Vol.73 (11), p.1526-1528

1998

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Wavelength tunable stretched-pulse mode-locked all-fiber erbium ring laser with single polarization fiber

Optics express, 2006-06, Vol.14 (13), p.6098-6102

2006

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Performance and stability of Si:H p–i–n solar cells with i layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary

Applied physics letters, 1999-09, Vol.75 (11), p.1553-1555

1999

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Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films

Optics letters, 2000-11, Vol.25 (21), p.1573

2000

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Impact of Hydrogen Dilution on the Properties and Light Induced Changes of A-SI:H Based Materials and Solar Cells

MRS proceedings, 1997, Vol.467, p.747-752, Article 747

1997

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Real time spectroscopic ellipsometry studies of the nucleation and growth of p -type microcrystalline silicon films on amorphous silicon using B2H6, B(CH3)3 and BF3 dopant source gases

Journal of applied physics, 1999-04, Vol.85 (8), p.4141-4153

1999

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Wide Band Single Polarization and Polarization Maintaining Fibers

OFC/NFOEC 2008 - 2008 Conference on Optical Fiber Communication/National Fiber Optic Engineers Conference, 2008, p.1-3

2008

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Single polarization fibers and applications

2006 Optical Fiber Communication Conference and the National Fiber Optic Engineers Conference, 2006, p.3 pp.

2006

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Characterization of amorphous silicon solar cell preparation processes by real time spectroscopic ellipsometry

Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996, 1996, p.1035-1040

1996

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Bending Properties of Hole-assisted Single Polarization Fibers

OFC/NFOEC 2007 - 2007 Conference on Optical Fiber Communication and the National Fiber Optic Engineers Conference, 2007, p.1-3

2007

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Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry

Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films

Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films

Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane

Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films

Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films

Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry

Observation of temporal vector soliton propagation and collision in birefringent fiber

Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry

Effects of bending on the performance of hole-assisted single polarization fibers

Evolutionary phase diagrams for the deposition of silicon films from hydrogen-diluted silane

Wide band single polarization and polarization maintaining fibers using stress rods and air holes

Real time spectroscopic ellipsometry for characterization and optimization of amorphous silicon-based solar cell structures

Optics of textured amorphous silicon surfaces

Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells

Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry

Wavelength tunable stretched-pulse mode-locked all-fiber erbium ring laser with single polarization fiber

Performance and stability of Si:H p–i–n solar cells with i layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary

Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films

Impact of Hydrogen Dilution on the Properties and Light Induced Changes of A-SI:H Based Materials and Solar Cells

Real time spectroscopic ellipsometry studies of the nucleation and growth of p -type microcrystalline silicon films on amorphous silicon using B2H6, B(CH3)3 and BF3 dopant source gases

Wide Band Single Polarization and Polarization Maintaining Fibers

Single polarization fibers and applications

Characterization of amorphous silicon solar cell preparation processes by real time spectroscopic ellipsometry

Bending Properties of Hole-assisted Single Polarization Fibers

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