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Towards data-driven next-generation transmission electron microscopy

Nature materials, 2021-03, Vol.20 (3), p.274-279

2021

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Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Microscopy and microanalysis, 2013-08, Vol.19 (4), p.1050-1060

2013

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Subsampled STEM-ptychography

Applied physics letters, 2018-07, Vol.113 (3)

2018

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Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Ultramicroscopy, 2015-04, Vol.151, p.160-167

2015

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Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy

Micron (Oxford, England : 1993), 2017-05, Vol.96, p.103-111

2017

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Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges

Advanced functional materials, 2016-11, Vol.26 (42), p.7599-7604

2016

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Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Advanced structural and chemical imaging, 2015-07, Vol.1 (1), p.1-16, Article 8

2015

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Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Machine learning: science and technology, 2023-03, Vol.4 (1), p.15025

2023

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Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Ultramicroscopy, 2017-09, Vol.180 (C), p.173-179

2017

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Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography

Nature communications, 2024-01, Vol.15 (1), p.278-278, Article 278

2024

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Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Nano letters, 2014-11, Vol.14 (11), p.6336-6341

2014

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Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Nature communications, 2023-08, Vol.14 (1), p.5184-5184, Article 5184

2023

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Polarization screening-induced magnetic phase gradients at complex oxide interfaces

Nature communications, 2015-04, Vol.6 (1), p.6735-6735, Article 6735

2015

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Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Microscopy, 2018-03, Vol.67 (suppl_1), p.i98-i113

2018

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Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

npj computational materials, 2022-10, Vol.8 (1), p.1-8, Article 216

2022

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Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy

Scientific reports, 2014-12, Vol.4 (1), p.7555, Article 7555

2014

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Testing the accuracy of the two-dimensional object model in HAADF STEM

Micron (Oxford, England : 1993), 2014-08, Vol.63, p.47-51

2014

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Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices

Advanced materials interfaces, 2016-05, Vol.3 (10), p.n/a

2016

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Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)

Journal of microscopy (Oxford), 2017-12, Vol.268 (3), p.221-224

2017

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Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM

Microscopy and microanalysis, 2021-02, Vol.27 (1), p.99-108

2021

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The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.478-479

2018

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Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Physical review letters, 2020-03, Vol.124 (10), p.106105-106105, Article 106105

2020

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Retaining Precision at Low-dose and High-speed STEM Imaging Conditions

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.2964-2966

2020

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Retrofitting a Photoelectron Source: Improving Resolution & Functionality

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2934-2935

2022

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The User Adjustable Pole-piece: Expanding TEM Functionality Without Compromise

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2636-2638

2022

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Towards data-driven next-generation transmission electron microscopy

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Subsampled STEM-ptychography

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy

Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography

Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Polarization screening-induced magnetic phase gradients at complex oxide interfaces

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy

Testing the accuracy of the two-dimensional object model in HAADF STEM

Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices

Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)

Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM

The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Retaining Precision at Low-dose and High-speed STEM Imaging Conditions

Retrofitting a Photoelectron Source: Improving Resolution & Functionality

The User Adjustable Pole-piece: Expanding TEM Functionality Without Compromise

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