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Spectroscopic ellipsometry data analysis: measured versus calculated quantities

Thin solid films, 1998-02, Vol.313 (1-2), p.33-39

Jellison, Jr, G.E.

1998

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Parameterization of the optical functions of amorphous materials in the interband region

Applied physics letters, 1996-07, Vol.69 (3), p.371-373

1996

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Two-modulator generalized ellipsometry: theory

Applied Optics, 1997-11, Vol.36 (31), p.8190-8198

1997

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Data analysis for spectroscopic ellipsometry

Thin solid films, 1993-10, Vol.234 (1-2), p.416-422

Jellison, G.E.

1993

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Two-modulator generalized ellipsometry: experiment and calibration

Applied Optics, 1997-11, Vol.36 (31), p.8184-8189

1997

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Optical properties of bismuth germanate

Journal of applied physics, 2010-01, Vol.107 (1), p.013514-013514-5

2010

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Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry

Journal of applied physics, 2018-12, Vol.124 (22)

2018

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Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry

Journal of applied physics, 2019-07, Vol.126 (4)

2019

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Optical characterization of tristructural isotropic fuel particle cross-sections using generalized ellipsometry

Journal of nuclear materials, 2006-06, Vol.352 (1-3), p.6-12

2006

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Increase in pyrolytic carbon optical anisotropy and density during processing of coated particle fuel due to heat treatment

Journal of nuclear materials, 2008-03, Vol.374 (3), p.445-452

2008

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Optical anisotropy measurements of TRISO nuclear fuel particle cross-sections: The method

Journal of nuclear materials, 2008-01, Vol.372 (1), p.36-44

2008

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Generalized ellipsometry for materials characterization

Thin solid films, 2004-02, Vol.450 (1), p.42-50

Jellison, G.E.

2004

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Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry

Applied physics letters, 1993-06, Vol.62 (25), p.3348-3350

1993

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Epitaxial growth of anatase by reactive sputter deposition using water vapor as the oxidant

Thin solid films, 2004, Vol.446 (1), p.18-22

2004

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Optical and Electrical Properties of Sn-Doped Zinc Oxide Single Crystals

Journal of electronic materials, 2018-02, Vol.47 (2), p.1497-1504

2018

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Optical functions of silicon at elevated temperatures

Journal of applied physics, 1994-09, Vol.76 (6), p.3758-3761

1994

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Use of the biased estimator in the interpretation of spectroscopic ellipsometry data

Applied Optics, 1991-08, Vol.30 (23), p.3354-3360

Jellison, Jr, G E

1991

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Irradiation Effects on Dielectric Mirrors for Fusion Power Reactor Application

Fusion science and technology, 2009-08, Vol.56 (2), p.1069-1077

2009

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Dielectric and optical properties of epitaxial rare-earth scandate films and their crystallization behavior

Applied physics letters, 2006-06, Vol.88 (26), p.262906-262906-3

2006

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Spectroscopic ellipsometry characterization of thin-film silicon nitride

Thin solid films, 1998-02, Vol.313 (1-2), p.193-197

1998

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High-throughput growth temperature optimization of ferroelectric SrxBa1−xNb2O6 epitaxial thin films using a temperature gradient method

Applied physics letters, 2004-02, Vol.84 (8), p.1350-1352

2004

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Interface stability and the growth of optical quality perovskites on MgO

Physical review letters, 1994-04, Vol.72 (17), p.2741-2744

1994

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Structure and optical properties of amorphous diamond films prepared by ArF laser ablation as a function of carbon ion kinetic energy

Applied physics letters, 1998-11, Vol.73 (18), p.2591-2593

1998

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Generalized ellipsometry in unusual configurations

Applied surface science, 2006-10, Vol.253 (1), p.47-51

2006

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Examination of thin SiO2 films on Si using spectroscopic polarization modulation ellipsometry

Journal of applied physics, 1991-06, Vol.69 (11), p.7627-7634

JELLISON, G. E

1991

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Spectroscopic ellipsometry data analysis: measured versus calculated quantities

Parameterization of the optical functions of amorphous materials in the interband region

Two-modulator generalized ellipsometry: theory

Data analysis for spectroscopic ellipsometry

Two-modulator generalized ellipsometry: experiment and calibration

Optical properties of bismuth germanate

Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry

Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry

Optical characterization of tristructural isotropic fuel particle cross-sections using generalized ellipsometry

Increase in pyrolytic carbon optical anisotropy and density during processing of coated particle fuel due to heat treatment

Optical anisotropy measurements of TRISO nuclear fuel particle cross-sections: The method

Generalized ellipsometry for materials characterization

Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry

Epitaxial growth of anatase by reactive sputter deposition using water vapor as the oxidant

Optical and Electrical Properties of Sn-Doped Zinc Oxide Single Crystals

Optical functions of silicon at elevated temperatures

Use of the biased estimator in the interpretation of spectroscopic ellipsometry data

Irradiation Effects on Dielectric Mirrors for Fusion Power Reactor Application

Dielectric and optical properties of epitaxial rare-earth scandate films and their crystallization behavior

Spectroscopic ellipsometry characterization of thin-film silicon nitride

High-throughput growth temperature optimization of ferroelectric SrxBa1−xNb2O6 epitaxial thin films using a temperature gradient method

Interface stability and the growth of optical quality perovskites on MgO

Structure and optical properties of amorphous diamond films prepared by ArF laser ablation as a function of carbon ion kinetic energy

Generalized ellipsometry in unusual configurations

Examination of thin SiO2 films on Si using spectroscopic polarization modulation ellipsometry

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