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Synthesis and physico-chemical characteristics of nanosized particles produced by laser ablation of a nickel target in water

Applied surface science, 2008-06, Vol.254 (16), p.5181-5190

2008

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How do traces of thulium explain photodarkening in Yb doped fibers?

Optics express, 2010-09, Vol.18 (19), p.20455-20460

2010

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Impact of the radiation trapping on lifetime measurement of Er3+ doped glasses

Journal of luminescence, 2010-07, Vol.130 (7), p.1119-1123

2010

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Spectroscopic signature of phosphate crystallization in erbium-doped optical fibre preforms

Optical materials, 2011-04, Vol.33 (6), p.835-838

2011

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Inhomogeneous Gain Saturation in EDF: Experiment and Modeling

Journal of lightwave technology, 2011-05, Vol.29 (10), p.1445-1452

2011

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Intrinsic ESD robustness on new high voltage N/PMOS devices in 28 nm FDSOI UTBB CMOS technology through TLP/VFTLP characterizations

Microelectronics and reliability, 2021-11, Vol.126, p.114370, Article 114370

2021

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TLP/VFTLP investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS technology at room temperature

Microelectronics and reliability, 2023-09, Vol.148, p.115168, Article 115168

2023

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Evidence of two erbium sites in standard aluminosilicate glass for EDFA

Optics express, 2010-09, Vol.18 (20), p.20661-20666

2010

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Exceptionally narrow homogeneous linewidth in erbium-doped glasses

Optics letters, 2006-12, Vol.31 (23), p.3453

2006

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Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology

Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1998-2004

2012

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Optical properties of thulium-doped chalcogenide glasses and the uncertainty of the calculated radiative lifetimes using the Judd-Ofelt approach

Journal of the Optical Society of America. B, Optical physics, 2006-12, Vol.23 (12), p.2588

2006

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A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node

Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1614-1617

2011

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Mode analysis in He+-implanted lithium fluoride planar waveguides

Applied physics letters, 2003-06, Vol.82 (22), p.3886-3888

2003

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Reliability impact due to high current, lattice and hot carriers temperatures on β(2×2) matrix ESD power devices for advanced CMOS technologies

Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1608-1613

2011

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How nanoparticles encapsulating fluorophores allow a double detection of biomolecules by localized surface plasmon resonance and luminescence

Nanotechnology, 2008-01, Vol.19 (3), p.035705-035705 (7)

2008

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Measurement of the fraction of reabsorbed light in an Er3+-doped glass

Applied physics. B, Lasers and optics, 2007-05, Vol.87 (3), p.445-449

2007

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An hybrid organic–inorganic approach to erbium-functionalized nanodots for emission in the telecom window

Chemical physics, 2005-11, Vol.318 (1), p.33-43

2005

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Experimental results on diodes and BIMOS ESD devices in 28 nm FD-SOI under TLP & TID radiation

Microelectronics and reliability, 2020-11, Vol.114, p.113938, Article 113938

2020

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Resonant fluorescence line narrowing and gain spectral hole burning in erbium-doped fiber amplifier

Journal of luminescence, 2008-05, Vol.128 (5), p.1010-1012

2008

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Beta-Matrix ESD network: Throughout end of placement rules?

2011 IEEE International Conference on IC Design & Technology, 2011, p.1-4

2011

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Optical near-field measurements of guided modes in various processed LiNbO3 and LiTaO3 channel waveguides

Optical materials, 2003-10, Vol.24 (1-2), p.297-302

2003

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Fluoride crystals and high lying excited states of rare earth ions

Journal of fluorine chemistry, 2001-02, Vol.107 (2), p.235-240

2001

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Sol-gel thin film deposition and characterization of a new optically active compound : Er2Ti2O7

Optical materials, 2001-05, Vol.16 (4), p.463-473

2001

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Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO2 films

Journal of applied physics, 2005-07, Vol.98 (1), p.013544-5

2005

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Comparison between isolated SCR & embedded dual isolated SCR power devices for ESD power clamp in C45nm CMOS technology

2010 IEEE International Conference on Integrated Circuit Design and Technology, 2010, p.47-50

2010

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Synthesis and physico-chemical characteristics of nanosized particles produced by laser ablation of a nickel target in water

How do traces of thulium explain photodarkening in Yb doped fibers?

Impact of the radiation trapping on lifetime measurement of Er3+ doped glasses

Spectroscopic signature of phosphate crystallization in erbium-doped optical fibre preforms

Inhomogeneous Gain Saturation in EDF: Experiment and Modeling

Intrinsic ESD robustness on new high voltage N/PMOS devices in 28 nm FDSOI UTBB CMOS technology through TLP/VFTLP characterizations

TLP/VFTLP investigation on eNVM 1T1R PCM in FD-SOI UTBB CMOS technology at room temperature

Evidence of two erbium sites in standard aluminosilicate glass for EDFA

Exceptionally narrow homogeneous linewidth in erbium-doped glasses

Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology

Optical properties of thulium-doped chalcogenide glasses and the uncertainty of the calculated radiative lifetimes using the Judd-Ofelt approach

A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node

Mode analysis in He+-implanted lithium fluoride planar waveguides

Reliability impact due to high current, lattice and hot carriers temperatures on β(2×2) matrix ESD power devices for advanced CMOS technologies

How nanoparticles encapsulating fluorophores allow a double detection of biomolecules by localized surface plasmon resonance and luminescence

Measurement of the fraction of reabsorbed light in an Er3+-doped glass

An hybrid organic–inorganic approach to erbium-functionalized nanodots for emission in the telecom window

Experimental results on diodes and BIMOS ESD devices in 28 nm FD-SOI under TLP & TID radiation

Resonant fluorescence line narrowing and gain spectral hole burning in erbium-doped fiber amplifier

Beta-Matrix ESD network: Throughout end of placement rules?

Optical near-field measurements of guided modes in various processed LiNbO3 and LiTaO3 channel waveguides

Fluoride crystals and high lying excited states of rare earth ions

Sol-gel thin film deposition and characterization of a new optically active compound : Er2Ti2O7

Correlation between Si-related and erbium photoluminescence bands and determination of erbium effective excitation cross section in SiO2 films

Comparison between isolated SCR & embedded dual isolated SCR power devices for ESD power clamp in C45nm CMOS technology

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