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Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I. SEM Imaging at Magnifications from 200 to 10,000

Experimental mechanics, 2007-12, Vol.47 (6), p.775-787

2007

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SMART – a program to measure SEM resolution and imaging performance

Journal of microscopy (Oxford), 2002-10, Vol.208 (1), p.24-34

Joy, D. C.

2002

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Controlling resist thickness and etch depth for fabrication of 3D structures in electron-beam grayscale lithography

Microelectronic engineering, 2007-12, Vol.84 (12), p.2859-2864

2007

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Scanning electron microscope imaging in liquids – some data on electron interactions in water

Journal of microscopy (Oxford), 2006-02, Vol.221 (2), p.84-88

2006

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Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model

Scientific reports, 2018-08, Vol.8 (1), p.12985-13, Article 12985

2018

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Experimental secondary electron spectra under SEM conditions

Journal of microscopy (Oxford), 2004-07, Vol.215 (1), p.77-85

2004

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Monte Carlo modeling of ion beam induced secondary electrons

Ultramicroscopy, 2016-09, Vol.168, p.28-33

2016

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Modeling ion-solid interactions for imaging applications

MRS bulletin, 2014-04, Vol.39 (4), p.342-346

2014

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Oliver Wells (1931-2013) A Brief Memorial

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.2-3

2014

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SEM Microcharacterization of Semiconductors

2013

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Nanoscale electron-beam-stimulated processing

Applied physics letters, 2003-04, Vol.82 (14), p.2326-2328

2003

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Scanning Electron Microscopy and X-Ray Microanalysis

Fourth edition., 2018

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Diverse and conserved nano‐ and mesoscale structures of diatom silica revealed by atomic force microscopy

Journal of microscopy (Oxford), 2009-08, Vol.235 (2), p.172-187

2009

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Experimental resolution measurement in critical dimension scanning electron microscope metrology

Scanning, 2003-07, Vol.25 (4), p.175-180

2003

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Modeling Ion Beam Induced Secondary Electrons

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1689-1690

2015

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Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.837-838

2015

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Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.302-303

2014

Volltextzugriff (PDF)

Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.14-15

2014

Volltextzugriff (PDF)

Characterization of hydrogen responsive nanoporous palladium films synthesized via a spontaneous galvanic displacement reaction

Nanotechnology, 2012-11, Vol.23 (46), p.465403-465403

2012

Volltextzugriff (PDF)

Modeling for Multi-Beam Microscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.798-799

2012

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Electron holographic study of ferroelectric domain walls

Applied physics letters, 1992-02, Vol.60 (6), p.784-786

1992

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Fouling mechanisms of membranes during protein ultrafiltration

Journal of membrane science, 1992-04, Vol.68 (1-2), p.79-91

1992

Volltextzugriff (PDF)

An empirical stopping power relationship for low-energy electrons

Scanning, 1989, Vol.11 (4), p.176-180

1989

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The efficiency of X‐ray production at low energies

Journal of microscopy (Oxford), 1998-07, Vol.191 (1), p.74-82

Joy, D C

1998

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Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines

Scanning, 2003-07, Vol.25 (4), p.210-215

2003

Volltextzugriff (PDF)

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Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I. SEM Imaging at Magnifications from 200 to 10,000

SMART – a program to measure SEM resolution and imaging performance

Controlling resist thickness and etch depth for fabrication of 3D structures in electron-beam grayscale lithography

Scanning electron microscope imaging in liquids – some data on electron interactions in water

Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model

Experimental secondary electron spectra under SEM conditions

Monte Carlo modeling of ion beam induced secondary electrons

Modeling ion-solid interactions for imaging applications

Oliver Wells (1931-2013) A Brief Memorial

SEM Microcharacterization of Semiconductors

Nanoscale electron-beam-stimulated processing

Scanning Electron Microscopy and X-Ray Microanalysis

Diverse and conserved nano‐ and mesoscale structures of diatom silica revealed by atomic force microscopy

Experimental resolution measurement in critical dimension scanning electron microscope metrology

Modeling Ion Beam Induced Secondary Electrons

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM

Characterization of hydrogen responsive nanoporous palladium films synthesized via a spontaneous galvanic displacement reaction

Modeling for Multi-Beam Microscopy

Electron holographic study of ferroelectric domain walls

Fouling mechanisms of membranes during protein ultrafiltration

An empirical stopping power relationship for low-energy electrons

The efficiency of X‐ray production at low energies

Measurements of absolute X-ray generation efficiency for selected K, L, and M-lines

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