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Towards data-driven next-generation transmission electron microscopy

Nature materials, 2021-03, Vol.20 (3), p.274-279

2021

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Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Microscopy and microanalysis, 2013-08, Vol.19 (4), p.1050-1060

2013

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Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy

Micron (Oxford, England : 1993), 2017-05, Vol.96, p.103-111

2017

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Subsampled STEM-ptychography

Applied physics letters, 2018-07, Vol.113 (3)

2018

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Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Ultramicroscopy, 2015-04, Vol.151, p.160-167

2015

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Video frame interpolation neural network for 3D tomography across different length scales

Nature communications, 2024-09, Vol.15 (1), p.7962-11, Article 7962

2024

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Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges

Advanced functional materials, 2016-11, Vol.26 (42), p.7599-7604

2016

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Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Advanced structural and chemical imaging, 2015-07, Vol.1 (1), p.1-16, Article 8

2015

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Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography

Nature communications, 2024-01, Vol.15 (1), p.278-278, Article 278

2024

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Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Machine learning: science and technology, 2023-03, Vol.4 (1), p.15025

2023

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Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Ultramicroscopy, 2017-09, Vol.180 (C), p.173-179

2017

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Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Nature communications, 2023-08, Vol.14 (1), p.5184-5184, Article 5184

2023

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Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Nano letters, 2014-11, Vol.14 (11), p.6336-6341

2014

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Polarization screening-induced magnetic phase gradients at complex oxide interfaces

Nature communications, 2015-04, Vol.6 (1), p.6735-6735, Article 6735

2015

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Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Microscopy, 2018-03, Vol.67 (suppl_1), p.i98-i113

2018

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Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

npj computational materials, 2022-10, Vol.8 (1), p.1-8, Article 216

2022

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Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy

Scientific reports, 2014-12, Vol.4 (1), p.7555, Article 7555

2014

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Testing the accuracy of the two-dimensional object model in HAADF STEM

Micron (Oxford, England : 1993), 2014-08, Vol.63, p.47-51

2014

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Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices

Advanced materials interfaces, 2016-05, Vol.3 (10), p.n/a

2016

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Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM

Microscopy and microanalysis, 2021-02, Vol.27 (1), p.99-108

2021

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Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)

Journal of microscopy (Oxford), 2017-12, Vol.268 (3), p.221-224

2017

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The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.478-479

2018

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The Environmental Impact of Large Scientific Infrastructure

Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)

2024

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A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope

Microscopy and microanalysis, 2023-09, Vol.29 (5), p.1610-1617

2023

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Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

Physical review letters, 2020-03, Vol.124 (10), p.106105-106105, Article 106105

2020

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Towards data-driven next-generation transmission electron microscopy

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy

Subsampled STEM-ptychography

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Video frame interpolation neural network for 3D tomography across different length scales

Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography

Machine-learning approach for quantified resolvability enhancement of low-dose STEM data

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z‑Contrast Electron Microscopy

Polarization screening-induced magnetic phase gradients at complex oxide interfaces

Managing dose-, damage- and data-rates in multi-frame spectrum-imaging

Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm

Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy

Testing the accuracy of the two-dimensional object model in HAADF STEM

Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices

Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM

Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)

The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing

The Environmental Impact of Large Scientific Infrastructure

A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope

Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy

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