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Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525), 2000, p.73-79
2000
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Proceedings of the Custom Integrated Circuits Conference, 1995, p.371-374
1995
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Proceedings of the 2000 Asia and South Pacific Design Automation Conference, 2000, p.289-294
2000
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International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217), 1998, p.93-96
1998
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- Circuit Simulation
- Degradation
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- Aging
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- Digital Circuits
- Electron Traps
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