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XPS study of the carbon fiber matrix interface

Carbon (New York), 1990, Vol.28 (1), p.21-26

1990

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Molecular-Scale Structures of Langmuir-Blodgett Films of Fatty Acids Observed by Atomic Force Microscopy

Japanese Journal of Applied Physics, 1995, Vol.34 (7S), p.3898

1995

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Formation of Self-Assembled Organic Ultrathin film by Chemisorption on Silicon Crystal Surface

Japanese Journal of Applied Physics, 1996-06, Vol.35 (6R), p.3542

1996

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Fluorine Termination of Silicon Surface by F 2 and Succeeding Reaction with Water

Japanese Journal of Applied Physics, 1993-06, Vol.32 (6S), p.3125

1993

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The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy

Journal of applied physics, 1990-08, Vol.68 (4), p.1429-1434

1990

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Characterization of long-periodic layered structures by X-ray diffraction III: Structure of a Langmuir-Blodgett film of cadmium arachidate at elevated temperatures

Thin solid films, 1991-04, Vol.199 (2), p.359-365

1991

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Photochemical formation of silver metal films from silver salt of natural high molecular carboxylic acid

Journal of applied physics, 1990-08, Vol.68 (3), p.1297-1302

1990

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Rhombohedral Phase in Y2O3-Partially-Stabilized ZrO2

Journal of the American Ceramic Society, 1988-01, Vol.71 (1), p.C-34-C-36

1988

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Raman spectra of graphite edge planes

Carbon (New York), 1988, Vol.26 (4), p.565-571

1988

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Structural Changes by Compressive Stresses of 2.0-mol%-Yttria-Stabilized Tetragonal Zirconia Polycrystals

Journal of the American Ceramic Society, 1989-05, Vol.72 (5), p.854-855

1989

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Atomic force microscopy of solution grown polyethylene single crystals

Japanese Journal of Applied Physics, 1994, Vol.33 (6B), p.3771-3774

1994

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APPLICATION OF A HIGH RESOLUTION FOURIER TRANSFORM SPECTROMETER: LINE SHAPE OF GREENHOUSE-GAS

Analytical Sciences, 1991, Vol.7(Supple), pp.1013-1015

1991

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Surface modification of poly(methyl methacrylate) film by siloxane graft copolymers

Macromolecules, 1985-05, Vol.18 (3), p.580-582

1985

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Fourier transform infrared reflection absorption spectrometry and electron spectroscopy for chemical analysis for surface analysis

Analytical chemistry (Washington), 1982-04, Vol.54 (4), p.682-687

1982

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Spectroscopic evidence for resin-reinforced dentine by a Raman microprobe technique

Journal of Raman spectroscopy, 1987-08, Vol.18 (5), p.315-316

1987

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FT-IR-ATR observation of SiOH and SiH in the oxide layer on an Si wafer

Mikrochimica acta (1966), 1988-01, Vol.94 (1-6), p.431-434

1988

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New Analytical Techniques on Polymer Materials Surface

Hyomen Kagaku, 1995/01/10, Vol.16(1), pp.45-50

ISHITANI, Akira

1995

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Analytical Techniques on Composite Interfaces

Sen'i Gakkaishi, 1988/02/10, Vol.44(2), pp.P51-P55

ISHITANI, AKIRA

1988

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XPS analysis of NH3 plasma-treated polystyrene films utilizing gas phase chemical modification

Journal of polymer science. Part A, Polymer chemistry, 1988-02, Vol.26 (2), p.559-572

1988

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Electron Transfer between Anion Radicals and Neutral Molecules as Revealed by Electron Spin Resonance Spectra

Bulletin of the Chemical Society of Japan, 1965-03, Vol.38 (3), p.367-369

1965

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The electronic spectra of the anion radicals of substituted benzenes

Theoretica Chimica Acta, 1966, Vol.4 (3), p.236-249

1966

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A study of XPS O1s spectrum of poly(ethylene terephthalate)

Journal of polymer science. Part A, Polymer chemistry, 1990-06, Vol.28 (7), p.1813-1821

1990

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The Electronic Spectra and Electronic Structures of the Nitrobenzene and Nitrotoluene Anions

Bulletin of the Chemical Society of Japan, 1963-10, Vol.36 (10), p.1357-1362

1963

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Model compounds for high modulus aromatic polyether-esters. X-ray structures and energy calculations of dimethyl 1,2-bis(phenoxy)ethane-4,4′-dicarboxylate and its chlorinated derivatives

Polymer (Guilford), 1994-01, Vol.35 (24), p.5179-5184

1994

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Characterization of long-periodic layered structures by X-ray diffraction IV: Small angle X-ray diffraction from a superlattice with non-ideal interfaces

Thin solid films, 1991-08, Vol.203 (1), p.113-120

1991

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XPS study of the carbon fiber matrix interface

Molecular-Scale Structures of Langmuir-Blodgett Films of Fatty Acids Observed by Atomic Force Microscopy

Formation of Self-Assembled Organic Ultrathin film by Chemisorption on Silicon Crystal Surface

Fluorine Termination of Silicon Surface by F 2 and Succeeding Reaction with Water

The study of the thermal oxide films on silicon wafers by Fourier transform infrared attenuated total reflection spectroscopy

Characterization of long-periodic layered structures by X-ray diffraction III: Structure of a Langmuir-Blodgett film of cadmium arachidate at elevated temperatures

Photochemical formation of silver metal films from silver salt of natural high molecular carboxylic acid

Rhombohedral Phase in Y2O3-Partially-Stabilized ZrO2

Raman spectra of graphite edge planes

Structural Changes by Compressive Stresses of 2.0-mol%-Yttria-Stabilized Tetragonal Zirconia Polycrystals

Atomic force microscopy of solution grown polyethylene single crystals

APPLICATION OF A HIGH RESOLUTION FOURIER TRANSFORM SPECTROMETER: LINE SHAPE OF GREENHOUSE-GAS

Surface modification of poly(methyl methacrylate) film by siloxane graft copolymers

Fourier transform infrared reflection absorption spectrometry and electron spectroscopy for chemical analysis for surface analysis

Spectroscopic evidence for resin-reinforced dentine by a Raman microprobe technique

FT-IR-ATR observation of SiOH and SiH in the oxide layer on an Si wafer

New Analytical Techniques on Polymer Materials Surface

Analytical Techniques on Composite Interfaces

XPS analysis of NH3 plasma-treated polystyrene films utilizing gas phase chemical modification

Electron Transfer between Anion Radicals and Neutral Molecules as Revealed by Electron Spin Resonance Spectra

The electronic spectra of the anion radicals of substituted benzenes

A study of XPS O1s spectrum of poly(ethylene terephthalate)

The Electronic Spectra and Electronic Structures of the Nitrobenzene and Nitrotoluene Anions

Model compounds for high modulus aromatic polyether-esters. X-ray structures and energy calculations of dimethyl 1,2-bis(phenoxy)ethane-4,4′-dicarboxylate and its chlorinated derivatives

Characterization of long-periodic layered structures by X-ray diffraction IV: Small angle X-ray diffraction from a superlattice with non-ideal interfaces

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