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Quantifying bunch‐mode influence on photon‐counting detectors at SPring‐8

Journal of synchrotron radiation, 2024-03, Vol.31 (2), p.295-302

2024

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Impact of mechanical stress on ferroelectricity in (Hf0.5Zr0.5)O2 thin films

Applied physics letters, 2016-06, Vol.108 (26)

2016

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Controlling charge-density-wave states in nano-thick crystals of 1T-TaS2

Scientific reports, 2014-12, Vol.4 (1), p.7302-7302, Article 7302

2014

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In Situ and Real-Time Monitoring of Oxide Growth in a Few Monolayers at Surfaces of Platinum Nanoparticles in Aqueous Media

Journal of the American Chemical Society, 2009-05, Vol.131 (17), p.6293-6300

2009

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Fabrication of tensile-strained single-crystalline GeSn on transparent substrate by nucleation-controlled liquid-phase crystallization

Applied physics letters, 2017-01, Vol.110 (3)

2017

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Quantification of local strain distributions in nanoscale strained SiGe FinFET structures

Journal of applied physics, 2017-10, Vol.122 (13)

2017

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Evidence of lattice tilt and slip in m-plane InGaN/GaN heterostructure

Applied physics letters, 2011-09, Vol.99 (13), p.131909-131909-3

2011

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Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

Applied physics letters, 2017-08, Vol.111 (8)

2017

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Current status of nanobeam x-ray diffraction station at SPring-8

AIP Conference Proceedings, 2019, Vol.2054 (1)

2019

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Large irreversible non-180° domain switching after poling treatment in Pb(Zr, Ti)O3 films

Applied physics letters, 2016-05, Vol.108 (21)

2016

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Parabolic refractive X-ray lenses made of quartz glass for high-energy X-ray focusing

Japanese Journal of Applied Physics, 2016-03, Vol.55 (3), p.38001

2016

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Characterization of locally strained Ge1−xSnx/Ge fine structures by synchrotron X-ray microdiffraction

Applied physics letters, 2015-05, Vol.106 (18)

2015

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Negligible substrate clamping effect on piezoelectric response in (111)-epitaxial tetragonal Pb(Zr, Ti)O3 films

Journal of applied physics, 2015-08, Vol.118 (7)

2015

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Compound Refractive Lens Optics for Microbeam X-ray Diffraction Measurements at BL13XU in SPring-8

Microscopy and microanalysis, 2018-08, Vol.24 (S2), p.302-303

2018

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In-situ observation of ultrafast 90° domain switching under application of an electric field in (100)/(001)-oriented tetragonal epitaxial Pb(Zr0.4Ti0.6)O3 thin films

Scientific reports, 2017-08, Vol.7 (1), p.1-7, Article 9641

2017

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Extraordinarily Large Contribution Ratio of Ferroelastic Domain Switching to Piezoresponse in Monoclinic (K, Na)NbO3 Films

Advanced electronic materials, 2024-01, Vol.10 (1), p.n/a

2024

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Time-Resolved Nanobeam X-ray Diffraction of a Relaxor Ferroelectric Single Crystal under an Alternating Electric Field

Crystals (Basel), 2021-11, Vol.11 (11), p.1419

2021

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Characterization of domain structure in one-dimensional SrRuO3 nanostructure using synchrotron x-ray microdiffraction

AIP conference proceedings, 2016, Vol.1741 (1)

2016

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Depth-resolved analysis of lattice distortions in high-Ge-content SiGe/compositionally graded SiGe films using nanobeam x-ray diffraction

Semiconductor science and technology, 2018-10, Vol.33 (12), p.124005

2018

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Position and electric field dependent local lattice strain detected by nanobeam x-ray diffraction on a relaxor ferroelectric single crystal

Physical review. B, 2022-01, Vol.105 (2), Article 024101

2022

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Microarea Strain Analysis in InGaN/GaN Multiple Quantum Wells on $m$-Plane Using High-Resolution Microbeam X-ray Diffraction

Japanese Journal of Applied Physics, 2013-07, Vol.52 (7), p.071001-071001-4

2013

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Quantitative analysis of lattice plane microstructure in the growth direction of a modified Na-flux GaN crystal using nanobeam X-ray diffraction

Japanese Journal of Applied Physics, 2019-06, Vol.58 (SC), p.SCCB16

2019

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Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf0.5Zr0.5)O2 thin films deposited on various substrates

Materials science in semiconductor processing, 2017-11, Vol.70, p.239-245

2017

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A State-of-the-Art Roadmap for Biomarker-Driven Drug Development in the Era of Personalized Therapies

Journal of personalized medicine, 2022-04, Vol.12 (5), p.669

2022

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Time response demonstration of in situ lattice deformation under an applied electric field by synchrotron-based time-resolved X-ray diffraction in polar-axis-oriented epitaxial Pb(Zr,Ti)O3 film

Japanese Journal of Applied Physics, 2018-06, Vol.57 (9)

2018

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Quantifying bunch‐mode influence on photon‐counting detectors at SPring‐8

Impact of mechanical stress on ferroelectricity in (Hf0.5Zr0.5)O2 thin films

Controlling charge-density-wave states in nano-thick crystals of 1T-TaS2

In Situ and Real-Time Monitoring of Oxide Growth in a Few Monolayers at Surfaces of Platinum Nanoparticles in Aqueous Media

Fabrication of tensile-strained single-crystalline GeSn on transparent substrate by nucleation-controlled liquid-phase crystallization

Quantification of local strain distributions in nanoscale strained SiGe FinFET structures

Evidence of lattice tilt and slip in m-plane InGaN/GaN heterostructure

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

Current status of nanobeam x-ray diffraction station at SPring-8

Large irreversible non-180° domain switching after poling treatment in Pb(Zr, Ti)O3 films

Parabolic refractive X-ray lenses made of quartz glass for high-energy X-ray focusing

Characterization of locally strained Ge1−xSnx/Ge fine structures by synchrotron X-ray microdiffraction

Negligible substrate clamping effect on piezoelectric response in (111)-epitaxial tetragonal Pb(Zr, Ti)O3 films

Compound Refractive Lens Optics for Microbeam X-ray Diffraction Measurements at BL13XU in SPring-8

In-situ observation of ultrafast 90° domain switching under application of an electric field in (100)/(001)-oriented tetragonal epitaxial Pb(Zr0.4Ti0.6)O3 thin films

Extraordinarily Large Contribution Ratio of Ferroelastic Domain Switching to Piezoresponse in Monoclinic (K, Na)NbO3 Films

Time-Resolved Nanobeam X-ray Diffraction of a Relaxor Ferroelectric Single Crystal under an Alternating Electric Field

Characterization of domain structure in one-dimensional SrRuO3 nanostructure using synchrotron x-ray microdiffraction

Depth-resolved analysis of lattice distortions in high-Ge-content SiGe/compositionally graded SiGe films using nanobeam x-ray diffraction

Position and electric field dependent local lattice strain detected by nanobeam x-ray diffraction on a relaxor ferroelectric single crystal

Microarea Strain Analysis in InGaN/GaN Multiple Quantum Wells on $m$-Plane Using High-Resolution Microbeam X-ray Diffraction

Quantitative analysis of lattice plane microstructure in the growth direction of a modified Na-flux GaN crystal using nanobeam X-ray diffraction

Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf0.5Zr0.5)O2 thin films deposited on various substrates

A State-of-the-Art Roadmap for Biomarker-Driven Drug Development in the Era of Personalized Therapies

Time response demonstration of in situ lattice deformation under an applied electric field by synchrotron-based time-resolved X-ray diffraction in polar-axis-oriented epitaxial Pb(Zr,Ti)O3 film

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