Sortiert nach
IEEE transactions on emerging topics in computing, 2019-01, Vol.7 (1), p.31-43
2019
- Link zum Volltext
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014, p.128-133
2014
- Link zum Volltext
IEICE Transactions on Information and Systems, 2010/10/01, Vol.E93.D(10), pp.2776-2782
2010
Link zum Volltext
2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.121-126
2021
- Link zum Volltext
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021, p.1-6
2021
- Link zum Volltext
2023 IEEE 32nd Asian Test Symposium (ATS), 2023, p.1-6
2023
- Link zum Volltext
IEICE Transactions on Information and Systems, 2010/06/01, Vol.E93.D(6), pp.1549-1559
2010
Link zum Volltext
2014 IEEE 32nd International Conference on Computer Design (ICCD), 2014, p.361-366
2014
- Link zum Volltext
IEICE Transactions on Information and Systems, 2008/03/01, Vol.E91.D(3), pp.756-762
2008
Link zum Volltext
IEICE Transactions on Information and Systems, 2008/03/01, Vol.E91.D(3), pp.713-719
2008
Link zum Volltext
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019, p.1-6
2019
Link zum Volltext
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009, p.245-253
2009
- Link zum Volltext
2017 International Test Conference in Asia (ITC-Asia), 2017, p.156-161
2017
- Link zum Volltext
2022 IEEE International Test Conference in Asia (ITC-Asia), 2022, p.90-95
2022
Link zum Volltext
2013 22nd Asian Test Symposium, 2013, p.85-90
2013
- Link zum Volltext
2023 IEEE 47th Annual Computers, Software, and Applications Conference (COMPSAC), 2023, p.1113-1120
2023
Link zum Volltext
IEICE transactions on information and systems, 2008, Vol.91 (3), p.713-719
2008
Link zum Volltext
IEICE transactions on information and systems, 2008, Vol.91 (3), p.756-762
2008
Link zum Volltext
2012 IEEE 30th International Conference on Computer Design (ICCD), 2012, p.516-517
2012
- Link zum Volltext
2011 Asian Test Symposium, 2011, p.273-278
2011
- Link zum Volltext
2009 Asian Test Symposium, 2009, p.171-176
2009
- Link zum Volltext
2019 IEEE International Test Conference in Asia (ITC-Asia), 2019, p.55-60
2019
Link zum Volltext
IPSJ Digital Courier, 2006, Vol.2, pp.348-356
2006
Link zum Volltext
16th Asian Test Symposium (ATS 2007), 2007, p.87-90
2007
- Link zum Volltext
2015 33rd IEEE International Conference on Computer Design (ICCD), 2015, p.94-100
2015
Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Computer Science
- Engineering
- Engineering, Electrical & Electronic
- Life Sciences & Biomedicine
- Circuit Faults
- Computer Science, Hardware & Architecture
- Very Large Scale Integration
- Circuit Testing
- Computer Science, Theory & Methods
- Test Pattern Generators
- Biological And Medical Sciences
- Computer Science, Information Systems
- Computer Science, Software Engineering
- Fault Tolerance
- Fundamental And Applied Biological Sciences. Psychology
- Hardware
- Biochemistry & Molecular Biology
- Fault Tolerant Systems
Kollektion
- EZB Electronic Journals Library
- IEEE/IET Electronic Library (IEL)
- Ingenta
- MEDLINE
- Taylor & Francis Online
- Oxford journals
- Elsevier ScienceDirect Journals Complete
- Taylor & Francis
- Wiley Blackwell Single Titles
- WK Lippincott Williams & Wilkins–Connect here FIRST to enable access
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- IngentaConnect Journals
- Publisher or Other Site
- SpringerLink (Online service)
- Taylor & Francis Journals Auto-Holdings Collection
- ACM Digital Library
- Wiley Online Library
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- Ebook Central Perpetual and DDA
- eBooks on EBSCOhost
Zeitschrift / Serie
Neu hinzugefügt