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Propagation of threading dislocations and effects of Burgers vectors in HVPE-grown GaN bulk crystals on Na-flux-grown GaN substrates

Journal of applied physics, 2021-06, Vol.129 (22)

2021

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Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co8.5Zn7.5Mn4(110) Thin Film

Physical review letters, 2019-09, Vol.123 (13)

2019

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Intestinal flora induces the expression of Cyp3a in the mouse liver

Xenobiotica, 2009-04, Vol.39 (4), p.323-334

2009

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Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi2 formation at low temperature

Journal of physics. Conference series, 2011, Vol.326 (1), p.012051

2011

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Low-power embedded ReRAM technology for IoT applications

2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T108-T109

2015

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Altered expression of CYP in TSOD mice: a model of type 2 diabetes and obesity

Xenobiotica, 2009-12, Vol.39 (12), p.889-902

2009

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Differences in the pharmacokinetics of Cyp3a substrates in TSOD and streptozotocin-induced diabetic mice

Xenobiotica, 2010-04, Vol.40 (4), p.282-290

2010

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Characteristics and Modeling of Sub-10-nm Planar Bulk CMOS Devices Fabricated by Lateral Source/Drain Junction Control

IEEE transactions on electron devices, 2006-09, Vol.53 (9), p.1961-1970

2006

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Effects of Ti addition on via reliability in Cu dual damascene interconnects

IEEE transactions on electron devices, 2004-11, Vol.51 (11), p.1883-1891

2004

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Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co 8.5 Zn 7.5 Mn 4 ( 110 ) Thin Film

Physical review letters, 2019-09, Vol.123 (13), Article 137203

2019

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Mice with neuropathic pain exhibit morphine tolerance due to a decrease in the morphine concentration in the brain

European journal of pharmaceutical sciences, 2016-09, Vol.92, p.298-304

2016

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Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi sub(2) formation at low temperature

Journal of physics. Conference series, 2011-01, Vol.326, p.1-4

2011

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Single-Dose Intravenous Administration of Recombinant Human Erythropoietin Is a Promising Treatment for Patients With Acute Myocardial Infarction: Randomized Controlled Pilot Trial of EPO/AMI-1 Study

Circulation Journal, 2010, Vol.74(7), pp.1415-1423

2010

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Electronic structure analysis of Zr silicate and Hf silicate films by using spatially resolved valence electron energy-loss spectroscopy

Journal of applied physics, 2003-07, Vol.94 (1), p.480-486

2003

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Electrical properties of 1.5-nm SiON gate-dielectric using radical oxygen and radical nitrogen

IEEE transactions on electron devices, 2002-11, Vol.49 (11), p.1903-1909

2002

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La–silicate gate dielectrics fabricated by solid phase reaction between La metal and SiO2 underlayers

Applied physics letters, 2003-10, Vol.83 (17), p.3546-3548

2003

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Higher‐order Laue zone line contrast in large‐angle convergent‐beam electron diffraction around a dislocation

Journal of microscopy (Oxford), 2001-09, Vol.203 (3), p.239-245

2001

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Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi 2 formation at low temperature

Journal of physics. Conference series, 2011-11, Vol.326, p.12051

2011

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Thermal decomposition of ZrO2/SiO2 bilayer on Si(001) caused by void nucleation and its lateral growth

Applied physics letters, 2002-01, Vol.80 (4), p.559-561

2002

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Ordered structure at Si/Ge interfaces

Physical review letters, 1994-05, Vol.72 (20), p.3198-3201

1994

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Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co_{8.5}Zn_{7.5}Mn_{4}(110) Thin Film

Physical review letters, 2019-09, Vol.123 (13), p.137203-137203

2019

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High-quality HfSixOy gate dielectrics fabricated by solid phase interface reaction between physical-vapor-deposited metal–Hf and SiO2 underlayer

Applied physics letters, 2004-07, Vol.85 (3), p.449-451

2004

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Thermal stability of a HfO2∕SiO2 interface

Applied physics letters, 2006-03, Vol.88 (10)

2006

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Low-power embedded ReRAM technology for IoT applications

2015 Symposium on VLSI Circuits (VLSI Circuits), 2015, p.T108-T109

2015

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Electron energy-loss spectroscopy analysis of the electronic structure of nitrided Hf silicate films

Applied physics letters, 2004-05, Vol.84 (18), p.3672-3674

2004

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Propagation of threading dislocations and effects of Burgers vectors in HVPE-grown GaN bulk crystals on Na-flux-grown GaN substrates

Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co8.5Zn7.5Mn4(110) Thin Film

Intestinal flora induces the expression of Cyp3a in the mouse liver

Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi2 formation at low temperature

Low-power embedded ReRAM technology for IoT applications

Altered expression of CYP in TSOD mice: a model of type 2 diabetes and obesity

Differences in the pharmacokinetics of Cyp3a substrates in TSOD and streptozotocin-induced diabetic mice

Characteristics and Modeling of Sub-10-nm Planar Bulk CMOS Devices Fabricated by Lateral Source/Drain Junction Control

Effects of Ti addition on via reliability in Cu dual damascene interconnects

Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co 8.5 Zn 7.5 Mn 4 ( 110 ) Thin Film

Mice with neuropathic pain exhibit morphine tolerance due to a decrease in the morphine concentration in the brain

Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi sub(2) formation at low temperature

Single-Dose Intravenous Administration of Recombinant Human Erythropoietin Is a Promising Treatment for Patients With Acute Myocardial Infarction: Randomized Controlled Pilot Trial of EPO/AMI-1 Study

Electronic structure analysis of Zr silicate and Hf silicate films by using spatially resolved valence electron energy-loss spectroscopy

Electrical properties of 1.5-nm SiON gate-dielectric using radical oxygen and radical nitrogen

La–silicate gate dielectrics fabricated by solid phase reaction between La metal and SiO2 underlayers

Higher‐order Laue zone line contrast in large‐angle convergent‐beam electron diffraction around a dislocation

Silicide formation process in ultra-thin Ni-silicide film for advanced semiconductor devices: mechanism of NiSi 2 formation at low temperature

Thermal decomposition of ZrO2/SiO2 bilayer on Si(001) caused by void nucleation and its lateral growth

Ordered structure at Si/Ge interfaces

Smectic Liquid-Crystalline Structure of Skyrmions in Chiral Magnet Co_{8.5}Zn_{7.5}Mn_{4}(110) Thin Film

High-quality HfSixOy gate dielectrics fabricated by solid phase interface reaction between physical-vapor-deposited metal–Hf and SiO2 underlayer

Thermal stability of a HfO2∕SiO2 interface

Low-power embedded ReRAM technology for IoT applications

Electron energy-loss spectroscopy analysis of the electronic structure of nitrided Hf silicate films

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