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Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Applied physics letters, 2008-09, Vol.93 (9), p.093504-093504-3

2008

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Demonstration of high-performance p-type tin oxide thin-film transistors using argon-plasma surface treatments

Semiconductor science and technology, 2017-07, Vol.32 (7), p.75006

2017

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Study on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors

Scientific reports, 2019-04, Vol.9 (1), p.6588-6588, Article 6588

2019

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Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors

ACS applied materials & interfaces, 2016-04, Vol.8 (16), p.10403-10412

2016

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Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Advanced electronic materials, 2022-05, Vol.8 (5), p.n/a

2022

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Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

IEEE electron device letters, 2014-12, Vol.35 (12), p.1260-1262

2014

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Radiation-Tolerant p-Type SnO Thin-Film Transistors

IEEE electron device letters, 2019-07, Vol.40 (7), p.1124-1127

2019

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Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

IEEE electron device letters, 2015-05, Vol.36 (5), p.466-468

2015

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Enhanced Electrical Performance and Stability in Zinc Oxynitride Thin-Film Transistors via Sequential Ultraviolet and Thermal Treatment

IEEE electron device letters, 2017-07, Vol.38 (7), p.883-886

2017

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Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors

IEEE electron device letters, 2017-04, Vol.38 (4), p.473-476

2017

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Floating Ni Capping for High-Mobility p-Channel SnO Thin-Film Transistors

Materials, 2020-07, Vol.13 (14), p.3055

2020

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Effects of Post-Deposition Thermal Annealing Temperature on Electrical Properties of ZnON Thin-Film Transistors

IEEE electron device letters, 2016-06, Vol.37 (6), p.747-750

2016

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Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors

IEEE transactions on electron devices, 2013-10, Vol.60 (10), p.3465-3473

2013

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Effect of Simultaneous Mechanical and Electrical Stress on the Electrical Performance of Flexible In-Ga-Zn-O Thin-Film Transistors

Materials, 2019-10, Vol.12 (19), p.3248

2019

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Development of high temperature operation silicon based MOSFET for harsh environment application

Results in physics, 2018-12, Vol.11, p.475-481

2018

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Accurate analysis of conduction and resistive-switching mechanisms in double-layered resistive-switching memory devices

Applied physics letters, 2012-09, Vol.101 (10)

2012

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Determination of Interface and Bulk Trap Densities in High-Mobility p-type WSe2 Thin-Film Transistors

IEEE electron device letters, 2017-04, Vol.38 (4), p.481-484

2017

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Effects of air-annealing on the electrical properties of p-type tin monoxide thin-film transistors

Semiconductor science and technology, 2014-04, Vol.29 (4), p.45001

2014

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Investigation of Carrier Transport Mechanism in High Mobility ZnON Thin-Film Transistors

IEEE electron device letters, 2016-12, Vol.37 (12), p.1570-1573

2016

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Electrical Instability of p-Channel SnO Thin-Film Transistors Under Light Illumination

IEEE electron device letters, 2016-03, Vol.37 (3), p.295-298

2016

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A subthreshold current model for nanoscale short channel junctionless MOSFETs applicable to symmetric and asymmetric double-gate structure

Solid-state electronics, 2013-04, Vol.82, p.77-81

2013

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Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

Applied physics letters, 2013-02, Vol.102 (8)

2013

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Low-Frequency Noise Properties in Double-Gate Amorphous InGaZnO Thin-Film Transistors Fabricated by Back-Channel-Etch Method

IEEE electron device letters, 2015-12, Vol.36 (12), p.1332-1335

2015

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Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics

Semiconductor science and technology, 2015-08, Vol.30 (8), p.85004

2015

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Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

IEEE electron device letters, 2012-01, Vol.33 (1), p.62-64

2012

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Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Demonstration of high-performance p-type tin oxide thin-film transistors using argon-plasma surface treatments

Study on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors

Water-Mediated Photochemical Treatments for Low-Temperature Passivation of Metal-Oxide Thin-Film Transistors

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

Radiation-Tolerant p-Type SnO Thin-Film Transistors

Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

Enhanced Electrical Performance and Stability in Zinc Oxynitride Thin-Film Transistors via Sequential Ultraviolet and Thermal Treatment

Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors

Floating Ni Capping for High-Mobility p-Channel SnO Thin-Film Transistors

Effects of Post-Deposition Thermal Annealing Temperature on Electrical Properties of ZnON Thin-Film Transistors

Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors

Effect of Simultaneous Mechanical and Electrical Stress on the Electrical Performance of Flexible In-Ga-Zn-O Thin-Film Transistors

Development of high temperature operation silicon based MOSFET for harsh environment application

Accurate analysis of conduction and resistive-switching mechanisms in double-layered resistive-switching memory devices

Determination of Interface and Bulk Trap Densities in High-Mobility p-type WSe2 Thin-Film Transistors

Effects of air-annealing on the electrical properties of p-type tin monoxide thin-film transistors

Investigation of Carrier Transport Mechanism in High Mobility ZnON Thin-Film Transistors

Electrical Instability of p-Channel SnO Thin-Film Transistors Under Light Illumination

A subthreshold current model for nanoscale short channel junctionless MOSFETs applicable to symmetric and asymmetric double-gate structure

Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

Low-Frequency Noise Properties in Double-Gate Amorphous InGaZnO Thin-Film Transistors Fabricated by Back-Channel-Etch Method

Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

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