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Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs

IEEE transactions on computer-aided design of integrated circuits and systems, 2017-10, Vol.36 (10), p.1759-1763

2017

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Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

2015 IEEE 24th Asian Test Symposium (ATS), 2015, p.1-6

2015

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Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis

IEEE transactions on circuits and systems. II, Express briefs, 2024-04, Vol.71 (4), p.2024-2028

2024

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A Hybrid Test Scheme for Automotive IC in Multisite Testing

IEEE transactions on computer-aided design of integrated circuits and systems, 2022-12, Vol.41 (12), p.5671-5680

2022

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Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis

IEEE transactions on circuits and systems. II, Express briefs, 2022-11, Vol.69 (11), p.4498-4502

2022

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Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs

IEEE transactions on very large scale integration (VLSI) systems, 2021-06, Vol.29 (6), p.1164-1177

2021

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An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Data

IEEE access, 2024, p.1-1

2024

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Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks

IEEE transactions on computer-aided design of integrated circuits and systems, 2020-10, Vol.39 (10), p.3023-3034

2020

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Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

IEEE transactions on semiconductor manufacturing, 2020-08, Vol.33 (3), p.391-403

2020

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Efficient Systolic-Array Redundancy Architecture for Offline/Online Repair

Electronics (Basel), 2020-02, Vol.9 (2), p.338

2020

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Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder

2017 18th International Symposium on Quality Electronic Design (ISQED), 2017, p.191-195

2017

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Broadcast scan compression based on deterministic pattern generation algorithm

2017 18th International Symposium on Quality Electronic Design (ISQED), 2017, p.449-453

2017

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Software-based embedded core test using multi-polynomial for test data reduction

2016 International SoC Design Conference (ISOCC), 2016, p.39-40

2016

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Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset

2022 19th International SoC Design Conference (ISOCC), 2022, p.121-122

2022

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Diagnosis of Scan Chain Faults Based-on Machine-Learning

2020 International SoC Design Conference (ISOCC), 2020, p.57-58

2020

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Logic Diagnosis Based on Deep Learning for Multiple Faults

2022 19th International SoC Design Conference (ISOCC), 2022, p.366-367

2022

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A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

2018 International SoC Design Conference (ISOCC), 2018, p.265-266

2018

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An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

2019 International SoC Design Conference (ISOCC), 2019, p.295-296

2019

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Test data reduction method based on berlekamp-massey algorithm

2017 International SoC Design Conference (ISOCC), 2017, p.123-124

2017

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Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs

Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis

A Hybrid Test Scheme for Automotive IC in Multisite Testing

Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis

Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs

An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Data

Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Efficient Systolic-Array Redundancy Architecture for Offline/Online Repair

Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder

Broadcast scan compression based on deterministic pattern generation algorithm

Software-based embedded core test using multi-polynomial for test data reduction

Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset

Diagnosis of Scan Chain Faults Based-on Machine-Learning

Logic Diagnosis Based on Deep Learning for Multiple Faults

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Test data reduction method based on berlekamp-massey algorithm

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