Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...







Proceedings of 14th VLSI Test Symposium, 1996, p.450-455
1996


Proceedings - Asian Test Symposium, 2000, p.311-316
2000

Proceedings of 14th VLSI Test Symposium, 1996, p.204-209
1996

Proceedings Eighth Asian Test Symposium (ATS'99), 1999, p.95-100
1999

Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2001, p.161-169
2001

Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159), 1997, p.79-86
1997

[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers, 1988, p.342-347
1988

Proceedings of International Workshop on Defect and Fault Tolerance in VLSI, 1995, p.225-233
1995

Proceedings Sixth Asian Test Symposium (ATS'97), 1997, p.248-253
1997

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223), 1998, p.164-172
1998

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS), 1993, p.225-229
1993

CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on Lasers and Electro-Optics (IEEE Cat. No.03TH8671), 2003, Vol.1, p.283 Vol.1
2003

Journal of shipping and ocean engineering, 2011-08, Vol.1 (3), p.169-179
2011
Link zum Volltext

Post-weld-shift in butterfly package
Proceedings of the 4th International Symposium on Electronic Materials and Packaging, 2002, 2002, p.77-82
2002

ASICON 2001. 2001 4th International Conference on ASIC Proceedings (Cat. No.01TH8549), 2001, p.740-743
2001

Proceedings of the Sixth Chinese Optoelectronics Symposium (IEEE Cat. No.03EX701), 2003, p.247-250
2003

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon, 1996, p.249-258
1996
Suchergebnisse filtern
Filter anzeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n