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Synergistic coupling of NiFe-layered double hydroxide nanosheets with Co-doped porous interconnecting carbon frameworks for efficient bifunctional electrocatalysis

Materials today chemistry, 2023-08, Vol.32, p.101632, Article 101632

2023

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Dependence of the relative sensitivity factor of nitrogen on various oxynitride dielectric matrixes

Thin solid films, 2013-09, Vol.542, p.134-138

2013

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Numerical approach to resolve mass interference in depth profiling As in SiGe

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.535-538

2011

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Effect of RRS1 gene knockdown on BT549 cell line proliferation and apoptosis in breast cancer

Neoplasma, 2019-01, Vol.66 (1), p.28-32

2019

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Time-of-flight secondary ion mass spectroscopic characterization of the nitrogen profile of shallow gate oxynitride thermally grown on a silicon substrate

Surface and interface analysis, 2012-12, Vol.44 (13), p.1558-1564

2012

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Aspirin inhibits MMP-9 mRNA expression and release via the PPARα/γ and COX-2/mPGES-1-mediated pathways in macrophages derived from THP-1 cells

Biomedicine & pharmacotherapy, 2010-02, Vol.64 (2), p.118-123

2010

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On the fatigue performance of laser hybrid welded high Zn 7000 alloys for next generation railway components

International journal of fatigue, 2016-10, Vol.91, p.1-10

2016

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Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf

Applied surface science, 2008-12, Vol.255 (4), p.1427-1429

2008

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Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique

Applied surface science, 2008-12, Vol.255 (4), p.1437-1439

2008

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APPLICATION OF AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY ANALYSIS IN FAILURE ANALYSIS OF WAFER FABRICATION

Surface review and letters, 2001-10, Vol.8 (5), p.435-439

2001

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A Rapid Detection Method for TiN Residue On Al Bondpads

2024 25th International Conference on Electronic Packaging Technology (ICEPT), 2024, p.1-4

Hua, Y. N.

2024

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Study of Silicon thickness for electron transparency

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA), 2019, p.1-4

2019

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Effect of autologous hematopoietic stem cell transplantation on minimal residual disease in patients with multiple myeloma

Zhong hua yi xue za zhi, 2022-09, Vol.102 (36), p.2861-2867

2022

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Global Profiles of Acetylated Proteins in Brains of Scrapie Agents 139A- and ME7-Infected Mice Collected at Mid-Early, Mid-Late, and Terminal Stages

Biomedical and environmental sciences, 2022-08, Vol.35 (8), p.722-734

2022

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Quantitative strain analysis for advanced CMOS technology by Nano Beam Diffraction

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2010, p.1-3

2010

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FIB sample preparation for TEM failure analysis of advanced devices

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2010, p.1-5

2010

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Roughness development in the depth profiling with 500 eV O2 beam with the combination of oxygen flooding and sample rotation

Applied surface science, 2008-12, Vol.255 (4), p.1433-1436

2008

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Roughness development in the depth profiling with 500 eV O 2 + beam with the combination of oxygen flooding and sample rotation

Applied surface science, 2008-12, Vol.255 (4), p.1433-1436

2008

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Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs 2 + technique

Applied surface science, 2008-12, Vol.255 (4), p.1437-1439

2008

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Random forest-based physical activities recognition by using wearable sensors

Industria textilă (Bucharest, Romania : 1994), 2022-01, Vol.73 (1), p.27-33

2022

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Investigation of Potassium Contamination in SOI Wafer Using Dynamic SIMS

IEEE transactions on device and materials reliability, 2007-06, Vol.7 (2), p.369-372

2007

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Aspirin inhibits MMP-9 mRNA expression and release via the PPARalpha/gamma and COX-2/mPGES-1-mediated pathways in macrophages derived from THP-1 cells

Biomedicine & pharmacotherapy, 2010-02, Vol.64 (2), p.118-123

2010

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Estimating Method for Electron Beam Accelerating Voltage Used in Energy-Dispersive X-Ray Microanalysis: Application in Failure Analysis of Wafer Fabrication

Instrumentation science & technology, 2004-12, Vol.32 (2), p.115-126

Hua, Younan

2004

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Generation of 415.9-482.6 nm tunable intense picosecond single pulse in LiB3O5

Applied physics letters, 1993-02, Vol.62 (7), p.672-674

1993

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Failure analysis and elimination of poly residues contamination in wafer fabrication

ICSE 2000. 2000 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.00EX425), 2000, p.44-48

2000

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Synergistic coupling of NiFe-layered double hydroxide nanosheets with Co-doped porous interconnecting carbon frameworks for efficient bifunctional electrocatalysis

Dependence of the relative sensitivity factor of nitrogen on various oxynitride dielectric matrixes

Numerical approach to resolve mass interference in depth profiling As in SiGe

Effect of RRS1 gene knockdown on BT549 cell line proliferation and apoptosis in breast cancer

Time-of-flight secondary ion mass spectroscopic characterization of the nitrogen profile of shallow gate oxynitride thermally grown on a silicon substrate

Aspirin inhibits MMP-9 mRNA expression and release via the PPARα/γ and COX-2/mPGES-1-mediated pathways in macrophages derived from THP-1 cells

On the fatigue performance of laser hybrid welded high Zn 7000 alloys for next generation railway components

Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf

Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique

APPLICATION OF AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY ANALYSIS IN FAILURE ANALYSIS OF WAFER FABRICATION

A Rapid Detection Method for TiN Residue On Al Bondpads

Study of Silicon thickness for electron transparency

Effect of autologous hematopoietic stem cell transplantation on minimal residual disease in patients with multiple myeloma

Global Profiles of Acetylated Proteins in Brains of Scrapie Agents 139A- and ME7-Infected Mice Collected at Mid-Early, Mid-Late, and Terminal Stages

Quantitative strain analysis for advanced CMOS technology by Nano Beam Diffraction

FIB sample preparation for TEM failure analysis of advanced devices

Roughness development in the depth profiling with 500 eV O2 beam with the combination of oxygen flooding and sample rotation

Roughness development in the depth profiling with 500 eV O 2 + beam with the combination of oxygen flooding and sample rotation

Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs 2 + technique

Random forest-based physical activities recognition by using wearable sensors

Investigation of Potassium Contamination in SOI Wafer Using Dynamic SIMS

Aspirin inhibits MMP-9 mRNA expression and release via the PPARalpha/gamma and COX-2/mPGES-1-mediated pathways in macrophages derived from THP-1 cells

Estimating Method for Electron Beam Accelerating Voltage Used in Energy-Dispersive X-Ray Microanalysis: Application in Failure Analysis of Wafer Fabrication

Generation of 415.9-482.6 nm tunable intense picosecond single pulse in LiB3O5

Failure analysis and elimination of poly residues contamination in wafer fabrication

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