UB Paderborn / Katalog / Suche / in CDI

A Postoperative Free Flap Monitoring System: Circulatory Compromise Detection Based on Visible-Light Image

IEEE access, 2022, Vol.10, p.4649-4665

2022

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Physical mechanism and device simulation on transient-induced latchup in CMOS ICs under system-level ESD test

IEEE transactions on electron devices, 2005-08, Vol.52 (8), p.1821-1831

2005

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Dependence of Device Structures on Latchup Immunity in a High-Voltage 40-V CMOS Process With Drain-Extended MOSFETs

IEEE transactions on electron devices, 2007-04, Vol.54 (4), p.840-851

2007

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Transient-Induced Latchup Dependence on Power-Pin Damping Frequency and Damping Factor in CMOS Integrated Circuits

IEEE transactions on electron devices, 2007-08, Vol.54 (8), p.2002-2010

2007

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Multi-block adaptive mesh refinement (AMR) for a lattice Boltzmann solver using GPUs

Computers & fluids, 2018-10, Vol.175, p.48-52

2018

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A novel 8kV on-chip surge protection design in xDSL line driver IC

2015 IEEE International Reliability Physics Symposium, 2015, p.3F.4.1-3F.4.4

2015

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Transient-Induced Latchup in CMOS Integrated Circuits

1. Aufl., 2009

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Evaluation on board-level noise filter networks to suppress transient-induced latchup in CMOS ICs under system-level ESD test

IEEE transactions on electromagnetic compatibility, 2006-02, Vol.48 (1), p.161-171

2006

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A new mechanism of signal path charging damage across separated power domain deep N-Well interface

2018 IEEE International Reliability Physics Symposium (IRPS), 2018, p.6C.5-1-6C.5-7

2018

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Experimental Evaluation and Device Simulation of Device Structure Influences on Latchup Immunity in High-Voltage 40-V CMOS Process

2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.140-144

2006

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Evaluation on efficient measurement setup for transient-induced latchup with bi-polar trigger [CMOS IC reliability]

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.121-128

2005

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DIRECT ADAPTIVE FEEDBACK DESIGN FOR LINEAR DISCRETE-TIME UNCERTAIN SYSTEMS

Asian journal of control, 2004-09, Vol.6 (3), p.421-427

2004

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Nonlinear Adaptive Tracking Of Surface Vessels With Exogenous Disturbances

Asian journal of control, 2003-03, Vol.5 (1), p.88-103

2003

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Theoretical study of salicylaldehyde conformal isomers and their intramolecular oxygen and hydrogen relations

International journal of quantum chemistry, 1999, Vol.74 (4), p.395-404

1999

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On direct adaptive control design for nonlinear discrete-time uncertain systems

Journal of the Franklin Institute, 2008-03, Vol.345 (2), p.119-135

2008

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Robust direct adaptive control of nonlinear uncertain systems with unknown disturbances

2005 American Control Conference; Portland, OR; USA; 8-10 June 2005, 2005, p.3731-3736 vol. 6

2005

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Component-Level Measurement for Transient-Induced Latch-up in CMOS ICs Under System-Level ESD Considerations

IEEE transactions on device and materials reliability, 2006-09, Vol.6 (3), p.461-472

2006

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Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits during EMC/ESD test

2006 17th International Zurich Symposium on Electromagnetic Compatibility, 2006, p.533-536

2006

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Transient-induced latchup in CMOS technology: physical mechanism and device simulation

IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004, 2004, p.937-940

2004

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A Direct Adaptive Control Design for Nonlinear Discrete-time Uncertain Systems

2003 4th International Conference on Control and Automation Proceedings, 2003, p.878-882

2003

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Direct Adaptive Control for a Class of Linear Discrete-time Systems

2003 4th International Conference on Control and Automation Proceedings, 2003, p.873-877

2003

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Index

Transient-Induced Latchup in CMOS Integrated Circuits, 2010

2010

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Physical Mechanism of TLU under the SystemLevel ESD Test

Transient-Induced Latchup in CMOS Integrated Circuits, 2010

2010

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Summary

Transient-Induced Latchup in CMOS Integrated Circuits, 2010

2010

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ComponentLevel Measurement for TLU under SystemLevel ESD Considerations

Transient-Induced Latchup in CMOS Integrated Circuits, 2010

2010

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Weitere Dienste

Einstellungen

A Postoperative Free Flap Monitoring System: Circulatory Compromise Detection Based on Visible-Light Image

Physical mechanism and device simulation on transient-induced latchup in CMOS ICs under system-level ESD test

Dependence of Device Structures on Latchup Immunity in a High-Voltage 40-V CMOS Process With Drain-Extended MOSFETs

Transient-Induced Latchup Dependence on Power-Pin Damping Frequency and Damping Factor in CMOS Integrated Circuits

Multi-block adaptive mesh refinement (AMR) for a lattice Boltzmann solver using GPUs

A novel 8kV on-chip surge protection design in xDSL line driver IC

Transient-Induced Latchup in CMOS Integrated Circuits

Evaluation on board-level noise filter networks to suppress transient-induced latchup in CMOS ICs under system-level ESD test

A new mechanism of signal path charging damage across separated power domain deep N-Well interface

Experimental Evaluation and Device Simulation of Device Structure Influences on Latchup Immunity in High-Voltage 40-V CMOS Process

Evaluation on efficient measurement setup for transient-induced latchup with bi-polar trigger [CMOS IC reliability]

DIRECT ADAPTIVE FEEDBACK DESIGN FOR LINEAR DISCRETE-TIME UNCERTAIN SYSTEMS

Nonlinear Adaptive Tracking Of Surface Vessels With Exogenous Disturbances

Theoretical study of salicylaldehyde conformal isomers and their intramolecular oxygen and hydrogen relations

On direct adaptive control design for nonlinear discrete-time uncertain systems

Robust direct adaptive control of nonlinear uncertain systems with unknown disturbances

Component-Level Measurement for Transient-Induced Latch-up in CMOS ICs Under System-Level ESD Considerations

Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits during EMC/ESD test

Transient-induced latchup in CMOS technology: physical mechanism and device simulation

A Direct Adaptive Control Design for Nonlinear Discrete-time Uncertain Systems

Direct Adaptive Control for a Class of Linear Discrete-time Systems

Index

Physical Mechanism of TLU under the SystemLevel ESD Test

Summary

ComponentLevel Measurement for TLU under SystemLevel ESD Considerations

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