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From single III-nitride nanowires to piezoelectric generators: New route for powering nomad electronics

Semiconductor science and technology, 2016-10, Vol.31 (10), p.103002

2016

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Piezo-generator integrating a vertical array of GaN nanowires

Nanotechnology, 2016-08, Vol.27 (32), p.325403

2016

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Field emission and material transfer in microswitches electrical contacts

Applied physics letters, 2010-12, Vol.97 (26), p.263503-263503-3

2010

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Nitride Nanowires: From Rigid to Flexible Piezo-generators

Journal of physics. Conference series, 2016, Vol.773 (1), p.12010

2016

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Printed copper connections on flexible substrates

2019 IEEE Holm Conference on Electrical Contacts, 2019, p.350-358

2019

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Metal-rich Au-silicide nanoparticles for use in nanotechnology

Applied physics letters, 2009-06, Vol.94 (23), p.233101-233101-3

2009

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Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotube materials

Composites. Part B, Engineering, 2011-12, Vol.42 (8), p.2098-2104

2011

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Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

Journal of applied physics, 2009-09, Vol.106 (5), p.054301-054301-7

2009

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Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches

Sensing and Imaging: An International Journal, 2015-12, Vol.16 (1), Article 21

2015

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Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

Applied physics letters, 1996-09, Vol.69 (13), p.1975-1977

1996

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Determination of the Power Balance for Thin Ag-SnO2 Electrodes Submitted to an Electric Arc Based on IR Thermography

IEEE transactions on components, packaging, and manufacturing technology (2011), 2022-10, Vol.12 (10), p.1-1

2022

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Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy

Diamond and related materials, 2007-04, Vol.16 (4), p.1074-1077

2007

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Electronic and topographic properties of amorphous and microcrystalline silicon thin films

Thin solid films, 2001-02, Vol.383 (1-2), p.57-60

2001

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Electrical Conduction Properties of Molecular Ultrathin Layers in a Nanocontact

2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts, 2010, p.1-7

2010

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Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy

Carbon (New York), 2001-01, Vol.39 (2), p.314-318

2001

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Conducting Probe-Mediated Electrochemical Nanopatterning of Molecular Materials

Journal of the American Chemical Society, 2001-11, Vol.123 (46), p.11486-11487

2001

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Innovative sol-gel coatings for corrosion protection of connector housings

2022 IEEE 67th Holm Conference on Electrical Contacts (HLM), 2022, p.1-8

2022

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Diamond and related materials, 2006-04, Vol.15 (4), p.618-621

2006

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The poly(ethylene terephthalate)/polyaniline composite : AFM, DRS and EPR investigations of some doping effects

Journal of materials science, 2001-07, Vol.36 (14), p.3355-3363

2001

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Electrical Contact Reliability in a Magnetic MEMS Switch

2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts, 2008, p.145-150

2008

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First AFM observation of thin cermet films close to the percolation threshold using a conducting tip

Physica. B, Condensed matter, 2000-04, Vol.279 (1), p.94-97

2000

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Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotubes materials

Composites. Part B, Engineering, 2011-09, Vol.42, p.2098-2104

2011

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Influence of microstructure on electrical and microwave properties of YBaCuO thin films

Physica. C, Superconductivity, 2002-08, Vol.372, p.578-581

2002

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Surface modifications of nickel substrates with self-assembled monolayers of alkanethiols for electrical contact applications

Surface & coatings technology, 1998-03, Vol.100, p.463-468

1998

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Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

Thin solid films, 1997-07, Vol.303 (1), p.200-206

1997

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From single III-nitride nanowires to piezoelectric generators: New route for powering nomad electronics

Piezo-generator integrating a vertical array of GaN nanowires

Field emission and material transfer in microswitches electrical contacts

Nitride Nanowires: From Rigid to Flexible Piezo-generators

Printed copper connections on flexible substrates

Metal-rich Au-silicide nanoparticles for use in nanotechnology

Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotube materials

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches

Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

Determination of the Power Balance for Thin Ag-SnO2 Electrodes Submitted to an Electric Arc Based on IR Thermography

Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy

Electronic and topographic properties of amorphous and microcrystalline silicon thin films

Electrical Conduction Properties of Molecular Ultrathin Layers in a Nanocontact

Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy

Conducting Probe-Mediated Electrochemical Nanopatterning of Molecular Materials

Innovative sol-gel coatings for corrosion protection of connector housings

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

The poly(ethylene terephthalate)/polyaniline composite : AFM, DRS and EPR investigations of some doping effects

Electrical Contact Reliability in a Magnetic MEMS Switch

First AFM observation of thin cermet films close to the percolation threshold using a conducting tip

Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotubes materials

Influence of microstructure on electrical and microwave properties of YBaCuO thin films

Surface modifications of nickel substrates with self-assembled monolayers of alkanethiols for electrical contact applications

Atomic force microscopy study of the topographic evolution of polyacrylonitrile thin films submitted to a rapid thermal treatment

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