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Microelectronic engineering, 2012-02, Vol.90 (Feb), p.118-120
2012
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Vacuum, 2008-04, Vol.82 (8), p.794-798
2008
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Vacuum, 2012-01, Vol.86 (6), p.769-772
2012
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Vacuum, 2009-08, Vol.84 (1), p.228-230
2009
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Journal of crystal growth, 2007-03, Vol.300 (1), p.145-150
2007
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Thin solid films, 2012-06, Vol.520 (16), p.5222-5226
2012
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Carbon (New York), 2007-12, Vol.45 (15), p.3022-3026
2007
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Microscopy and microanalysis, 2012-04, Vol.18 (2), p.406-420
2012
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Physica. B, Condensed matter, 2011-09, Vol.406 (17), p.3238-3242
2011
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Journal of thermal analysis and calorimetry, 2011-07, Vol.105 (1), p.93-99
2011
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Vacuum, 2023-12, Vol.218, p.112617, Article 112617
2023
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Applied clay science, 2023-09, Vol.241, p.106997, Article 106997
2023
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Thin solid films, 2019-10, Vol.688, p.137478, Article 137478
2019
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Carbon (New York), 2004, Vol.42 (12), p.2561-2566
2004
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Vacuum, 2020-05, Vol.175, p.109270, Article 109270
2020
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Surface science, 2005-03, Vol.578 (1), p.142-148
2005
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Thin solid films, 2014-07, Vol.562, p.485-489
2014
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The journal of physical chemistry. B, 2000-04, Vol.104 (14), p.3183-3193
2000
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Thin solid films, 2012-05, Vol.520 (14), p.4703-4706
2012
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Thin solid films, 2014-08, Vol.565, p.111-115
2014
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Thin solid films, 2013-07, Vol.540, p.69-72
2013
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Vacuum, 2014-02, Vol.100, p.46-49
2014
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Surface & coatings technology, 2014-10, Vol.257, p.3-14
2014
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Thin solid films, 2008-09, Vol.516 (22), p.8096-8100
2008
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2012-07, Vol.282, p.130-133
2012
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